Electron Microscope Unit

Faculty Of Science
Alexandria University

Sem_SED_016
Signal SED
Landing Voltage 20.0 kV
WD 10.0 mm
Magnification x550
Vacuum Mode HighVacuum

Spc_016

20 µm

Items Value Display name Standard data Quantification method Result Type
measurement conditions Spc_016 Standardless ZAF Metal
Acceleration voltage 20.00 kV
Element Line Mass% Atom%
Probe current -
Al K 98.69±0.78 99.06±0.78
Magnification x 550
Si K 0.67±0.16 0.65±0.15
Process time T2
Mn K 0.32±0.11 0.16±0.06
Measurement detector First
Fe K nd nd
Live time 30.00 seconds
Cu K 0.32±0.16 0.14±0.07
Real time 30.11 seconds
Total 100.00 100.00
Dead time 0.00 %
Spc_016 Fitting ratio 0.0358
Count rate 1372.00 CPS