Diff Trip Time Characteristic:

Test Object - Device Settings

Substation/Bay:
Substation: Statia Ocna Mures Substation address:
Bay: Bay address:

Device:
Name/description: 7UT85 Manufacturer:
Device type: Device address: Ocna Mures
Serial/model number:
Additional info 1:
Additional info 2:

Nominal Values:
f nom: 50.00 Hz Number of phases: 3
V nom (secondary): 6.300 V V primary: 22.00 kV
I nom (secondary): 5.000 A I primary: 1.000 kA

Residual Voltage/Current Factors:

VLN / VN: 1.732 IN / I nom: 1.000

Limits:
V max: 200.0 V I max: 50.00 A

Debounce/Deglitch Filters:
Debounce time: 3.000 ms Deglitch time: 0.000 s

Overload Detection:
Suppression time: 50.00 ms

Other Device Properties:

Drop-out time: 20.00 ms

Test Object - Other RIO Functions

CB Configuration
Description Name Value
CB trip time CB trip time 50.00 ms
CB close time CB close time 100.00 ms
Times for 52a, 52b in percent of CB time 52a, 52b % of CB 20.00 %

Test Object - Differential Parameters

Protected Object:
Protected Object: Transformer
Vector Group: DD0
Winding/Leg Name: Primary Secondary
Voltage: 22.00 kV 6.30 kV
Power: 16.00 MVA 16.00 MVA
Starpoint Grounding: No No
Delta-connected CT: No No
CT:
Winding/Leg Name: Primary Secondary
CT Current Prim: 400.00 A 1500.00 A
CT Current Sec: 5.00 A 5.00 A
CT Grounding: tow. Prot. Obj. tow. Prot. Obj.
Gnd CT Prim Current: 200.00 A 800.00 A
Gnd CT Sec Current: 1.00 A 1.00 A
Gnd CT Grounding: n/a n/a

Protection device:
Reference Winding: Primary
Ibias Calculation: max ( Ip, Is ) (K1 = 1.00)
Zero Seq. Elimination: IL-I0
Reference Current: PO nominal current
Ground CT Used: No
Disable Comb. char.: Yes

Idiff>: 0.20 In tdiff>: 0.03 s

Idiff>>: 3.00 In tdiff>>: 0.03 s

Itol rel: 20.00 % ttol rel: 10.00 %

Itol abs: 0.05 In ttol abs: 0.01 s

Test Module
Name: OMICRON Diff Trip Time Version: 4.00
Characteristic
Test Start: 04-Feb-2019 15:51:48 Test End: 04-Feb-2019 15:52:04
User Name: Manager:
Company:

Test Settings:

General Settings:
Testing: Primary / Secondary
Max. Test Time: 1.50 s Delay Time: 0.25 s
Prefault: No
Prefault current: 0.00 In Prefault time: 0.000 s
Vout enabled: No Vout winding: Primary

Trip Time Test Settings:

Slope of Test Line: 1.00
I Factor Relative: 2.00 % I Factor Absolute: 0.05 In
T Factor Relative: 3.00 % T Factor Absolute: 0.01 s

The program uses the device tolerances!

Binary Outputs
Bin. out 1: 0
Bin. out 2: 0
Bin. out 3: 0
Bin. out 4: 0

Test Results for Fault Type R-N at Reference Side Primary

 Nominal Actual Trip
Idiff Ibias Dev (rel) Dev (abs) State Result
Trip Time Time
0.00 In 0.00 In N/T N/T n/a n/a Tested Passed
0.30 In 0.30 In 0.0300 s 0.0324 s 8.00 % 0.0024 s Tested Passed
0.60 In 0.60 In 0.0300 s 0.0307 s 2.33 % 0.0007 s Tested Passed
0.90 In 0.90 In 0.0300 s 0.0292 s 2.67 % -0.0008 s Tested Passed
1.20 In 1.20 In 0.0300 s 0.0292 s 2.67 % -0.0008 s Tested Passed
1.50 In 1.50 In 0.0300 s 0.0289 s 3.67 % -0.0011 s Tested Passed
1.80 In 1.80 In 0.0300 s 0.0291 s 3.00 % -0.0009 s Tested Passed
2.10 In 2.10 In 0.0300 s 0.0290 s 3.33 % -0.0010 s Tested Passed
2.40 In 2.40 In 0.0300 s 0.0300 s 0.00 % 0.0000 s Tested Passed
2.70 In 2.70 In 0.0300 s 0.0297 s 1.00 % -0.0003 s Tested Passed
3.00 In 3.00 In 0.0300 s 0.0283 s 5.67 % -0.0017 s Tested Passed
3.30 In 3.30 In 0.0300 s 0.0284 s 5.33 % -0.0016 s Tested Passed
3.60 In 3.60 In 0.0300 s 0.0283 s 5.67 % -0.0017 s Tested Passed
3.90 In 3.90 In 0.0300 s 0.0292 s 2.67 % -0.0008 s Tested Passed
4.20 In 4.20 In 0.0300 s 0.0283 s 5.67 % -0.0017 s Tested Passed
4.50 In 4.50 In 0.0300 s 0.0284 s 5.33 % -0.0016 s Tested Passed
4.80 In 4.80 In 0.0300 s 0.0299 s 0.33 % -0.0001 s Tested Passed

Trip Time Test Plane

t [s]

0.09

0.08

0.07

0.06

0.05

0.04

0.03

0.02

0.01

0.00
0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5
Idiff [In]
State:
17 out of 17 points tested.
17 points passed.
0 points failed.

General Assessment: Test passed