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CS
R7 RD
GENERAL DESCRIPTION 2k⍀
CS
R7 RD
2k⍀
HBEN
R8
2k⍀
REV. E
J A B
Parameter Version1, 2, 3 Version1, 2, 3 Version1, 2, 3 Unit Test Conditions/Comments
DC ACCURACY
Resolution 16 16 16 Bits
Minimum Resolution for Which
No Missing Codes Are Guaranteed 16 16 16 Bits
Integral Nonlinearity ± 0.0075 % FSR max Typically 0.003% FSR
Positive Gain Error ± 0.1 ± 0.03 ± 0.03 % FSR typ AD7885AQ/BQ: 0.1% typ
Positive Gain Error ± 0.05 % FSR max AD7885BQ: 0.2% max
Gain TC 4
±2 ±2 ±2 ppm FSR/°C typ
Bipolar Zero Error ± 0.05 ± 0.05 ± 0.05 % FSR typ
± 0.15 % FSR max
Bipolar Zero TC4 ±8 ±8 ±8 ppm FSR/°C typ
Negative Gain Error ± 0.1 ± 0.03 ± 0.03 % FSR typ AD7885AQ/BQ: 0.1% typ
Negative Gain Error ± 0.05 % FSR max AD7885BQ: 0.2% max
Offset TC4 ±2 ±2 ±2 ppm FSR/°C typ
Noise 120 120 120 µV rms typ 78 µV rms Typical in ± 3 V Input Range
DYNAMIC PERFORMANCE
Signal-to-(Noise + Distortion) Ratio 82 84 84 dB min Input Signal: ±5 V, 1 kHz Sine Wave, Typically 86 dB
82 82 82 dB typ Input Signal: ± 5 V, 12 kHz Sine Wave
Total Harmonic Distortion –84 –88 –88 dB max Input Signal: ± 5 V, 1 kHz Sine Wave
–84 –84 –84 dB typ Input Signal: ± 5 V, 12 kHz Sine Wave
Peak Harmonic or Spurious Noise –88 –88 –88 dB max Input Signal: ± 5 V, 1 kHz Sine Wave
Intermodulation Distortion (IMD)
Second Order Terms –84 –84 –84 dB typ fA = 11.5 kHz, fB = 12 kHz, fSAMPLE = 166 kHz
Third Order Terms –84 –84 –84 dB typ fA = 11.5 kHz, fB = 12 kHz, fSAMPLE = 166 kHz
CONVERSION TIME
Conversion Time 5.3 5.3 5.3 µs max
Acquisition Time 2.5 2.5 2.5 µs max
Throughput Rate 166 166 166 kSPS max There is an overlap between conversion and acquisition.
ANALOG INPUT
Voltage Range ±5 ±5 ±5 V
±3 ±3 ±3 V
Input Current ±4 ±4 ±4 mA max
REFERENCE INPUT
Reference Input Current ±5 ±5 ±5 mA max VREF+S = 3 V
LOGIC INPUTS
Input High Voltage, VINH 2.4 2.4 2.4 V min VDD = 5 V ± 5%
Input Low Voltage, VINL 0.8 0.8 0.8 V max VDD = 5 V ± 5%
Input Current, IIN ± 10 ± 10 ± 10 µA max Input Level = 0 V to VDD
Input Capacitance, CIN4 10 10 10 pF max
LOGIC OUTPUTS
Output High Voltage, VOH 4.0 4.0 4.0 V min ISOURCE = 200 µA
Output Low Voltage, VOL 0.4 0.4 0.4 V max ISINK = 1.6 mA
DB15–DB0
Floating-State Leakage Current 10 10 10 µA max
Floating-State Output Capacitance4 15 15 15 pF max
POWER REQUIREMENTS
VDD 5 5 5 V nom ± 5% for Specified Performance
VSS –5 –5 –5 V nom ± 5% for Specified Performance
IDD 35 35 35 mA max Typically 25 mA
ISS 30 30 30 mA max Typically 25 mA; AD7885/AD7885A
33 33 33 mA max Typically 25 mA; AD7884
Power Supply Rejection Ratio
∆Gain/∆VDD 86 86 86 dB typ
∆Gain/∆VSS 86 86 86 dB typ
Power Dissipation 325 325 325 mW max Typically 250 mW
NOTES
1
Temperature ranges are as follows: J, A, B Versions: –40°C to +85°C.
2
VIN = ± 5 V.
3
The AD7885AAP has the same specifications as the AD7884AP. The AD7885ABP has the same specifications as the AD7884BP.
4
Sample tested to ensure compliance.
Specifications subject to change without notice.
–2– REV. E
AD7884/AD7885
TIMING CHARACTERISTICS1 (V DD = +5 V ⴞ 5%, VSS = –5 V ⴞ 5%, AGND = DGND = GND = 0 V. See Figures 2, 3, 4, and 5.)
Limit at 25ⴗC Limit at TMIN, TMAX
Parameter (All Versions) (A, B, and J Versions) Unit Conditions/Comments
t1 50 50 ns min CONVST Pulsewidth
t2 100 100 ns max CONVST to BUSY Low Delay
t3 0 0 ns min CS to RD Setup Time
t4 60 60 ns min RD Pulsewidth
t5 0 0 ns min CS to RD Hold Time
t6 2 57 57 ns max Data Access Time after RD
t7 3 5 5 ns min Bus Relinquish Time after RD
50 50 ns max
t8 40 40 ns min New Data Valid before Rising Edge of BUSY
t9 10 80 ns min HBEN to RD Setup Time
t10 25 25 ns min HBEN to RD Hold Time
t11 60 60 ns min HBEN Low Pulse Duration
t12 60 60 ns min HBEN High Pulse Duration
t13 55 70 ns max Propagation Delay from HBEN Falling to Data Valid
t14 55 70 ns max Propagation Delay from HBEN Rising to Data Valid
NOTES
1
Sample tested at 25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a voltage level of 1.6 V.
2
t6 is measured with the load circuit of Figure 1 and defined as the time required for an output to cross 0.8 V or 2.4 V.
3
t7 is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit of Figure 1. The measured number is then
extrapolated back to remove the effects of charging or discharging the 100 pF capacitor. This means that the time, t7, quoted in the Timing Characteristics
is the true bus relinquish time of the part and as such is independent of external bus loading capacitances.
Specifications subject to change without notice.
1.6mA IOL
200A IOH
REV. D –3–
AD7884/AD7885
t1
CONVST t1
CONVST
CS t2
t3 t4 t5 t CONVERT
RD BUSY
t2
t CONVERT t8
BUSY DATA
t7 OLD DATA VALID NEW DATA VALID
t6
HI-Z DATA HI-Z
DATA
VALID
Figure 2. AD7884 Timing Diagram, Using CS and RD Figure 3. AD7884 Timing Diagram, with CS and RD
Permanently Low
t1
CONVST
t9 t 10
HBEN
CS
t3 t4 t5
RD
t2 t CONVERT
BUSY t7
t6
HI-Z DATA HI-Z DATA HI-Z
DATA VALID VALID
DB0–DB7 DB8–DB15
t1
CONVST
t 11 t 12
HBEN
t2 t CONVERT
BUSY
t8 t 13 t 14
OLD DATA VALID NEW DATA VALID NEW DATA VALID NEW DATA VALID NEW DATA VALID
DATA (DB8–DB15) (DB8–DB15) (DB0–DB7) (DB8–DB15) (DB0–DB7)
–4– REV. E
AD7884/AD7885
ORDERING GUIDE VREF+ to AGND . . . . . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V
VREF– to AGND . . . . . . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V
Linearity VINV to AGND . . . . . . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V
Temperature Error SNR Package Digital Inputs to DGND . . . . . . . . . . . –0.3 V to VDD + 0.3 V
Model Range (% FSR) (dB) Option Digital Outputs to DGND . . . . . . . . . . –0.3 V to VDD + 0.3 V
AD7884AP –40°C to +85°C 84 P-44A Operating Temperature Range
AD7884BP –40°C to +85°C ± 0.0075 84 P-44A Commercial Plastic (A, B Versions) . . . . . –40°C to +85°C
AD7885AAP –40°C to +85°C 84 P-44A Industrial CERDIP (J, A, B Versions) . . . . –40°C to +85°C
AD7885ABP –40°C to +85°C ± 0.0075 84 P-44A Storage Temperature Range . . . . . . . . . . . . –65°C to +150°C
AD7884AQ –40°C to +85°C 84 Q-40 Lead Temperature (Soldering, 10 sec) . . . . . . . . . . . . . 300°C
AD7884BQ –40°C to +85°C ± 0.0075 84 Q-40 28-Lead CERDIP
AD7885JQ –40°C to +85°C 82 Q-28 θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 50.9°C/W
AD7885AQ –40°C to +85°C 84 Q-28 θJC Thermal Impedance . . . . . . . . . . . . . . . . . . . . . 8.3°C/W
AD7885BQ –40°C to +85°C ± 0.0075 84 Q-28 40-Lead CERDIP
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 44.5°C/W
NOTE 44-Lead PLCC
P = Plastic Leaded Chip Carrier (PLCC); Q = CERDIP.
θJA Thermal Impedance . . . . . . . . . . . . . . . . . . . . 47.7°C/W
θJC Thermal Impedance . . . . . . . . . . . . . . . . . . . . 17.5°C/W
ABSOLUTE MAXIMUM RATINGS 1 Power Dissipation (Any Package) to 75°C . . . . . . . . 1000 mW
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V Degradation above 75°C by . . . . . . . . . . . . . . . . . . 10 mW/°C
AVDD to AGND . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V
VSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V NOTES
1
AVSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V Stresses above those listed under Absolute Maximum Ratings may cause perma-
AGND Pins to DGND . . . . . . . . . . . . –0.3 V to VDD + 0.3 V nent damage to the device. This is a stress rating only; functional operation of the
device at these or any other conditions above those listed in the operational
AVDD to VDD2 . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V sections of this specification is not implied. Exposure to absolute maximum rating
AVSS to VSS2 . . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V conditions for extended periods may affect device reliability.
2
GND to DGND . . . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V If the AD7884/AD7885 is being powered from separate analog and digital
VINS, VINF to AGND . . . . . . . . . . VSS – 0.3 V to VDD + 0.3 V supplies, AVSS should always come up before V SS. See Figure 12 for a recom-
mended protection circuit using Schottky diodes.
CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily
accumulate on the human body and test equipment and can discharge without detection. Although WARNING!
the AD7884/AD7885 features proprietary ESD protection circuitry, permanent damage may occur
on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are
ESD SENSITIVE DEVICE
recommended to avoid performance degradation or loss of functionality.
REV. E –5–
AD7884/AD7885
PIN CONFIGURATIONS
CERDIP PLCC
5VINS
3VINS
3VINF
VREF+S
VREF+F
VREF–
DB15
DB14
DB13
VINV
NC
VINV 1 40 VREF+S VREF– 1 28 VINV
CONVST
CS
RD
VSS
BUSY
NC
DB0
DB1
DB2
DB3
DB4
VDD 15 26 DB5
NC = NO CONNECT
CONVST 16 25 DB4
CS 17 24 DB3
5VINS
3VINS
3VINF
VREF+S
VREF+F
RD 18 23 DB2
VREF–
VINV
NC
NC
NC
NC
VSS 19 22 DB1
BUSY 20 21 DB0 6 5 4 3 2 1 44 43 42 41 40
PIN 1
5VINF 7 IDENTIFIER 39 DB7
AGNDS 8 38 DB6
AGNDF 9 37 NC
AVDD 10 36 DB5
AVSS 11 35 DB4
AD7885A
NC 12 TOP VIEW 34 NC
GND 13 (Not to Scale) 33 DGND
GND 14 32 VDD
VSS 15 31 DB3
VSS 16 30 DB2
VDD 17 29 DB1
18 19 20 21 22 23 24 25 26 27 28
CONVST
CS
RD
HBEN
BUSY
NC
NC
NC
NC
NC
DB0
NC = NO CONNECT
–6– REV. E
AD7884/AD7885
PIN FUNCTION DESCRIPTIONS
REV. E –7–
AD7884/AD7885
TERMINOLOGY The AD7884/AD7885 is tested using the CCIFF standard where
Integral Nonlinearity two input frequencies near the top end of the input bandwidth are
This is the maximum deviation from a straight line passing used. In this case, the second and third order terms are of different
through the endpoints of the ADC transfer function. significance. The second order terms are usually distanced in
Differential Nonlinearity frequency from the original sine waves while the third order terms
This is the difference between the measured and the ideal 1 LSB are usually at a frequency close to the input frequencies. As a
change between any two adjacent codes in the ADC. result, the second and third order terms are specified separately.
The calculation of the intermodulation distortion is as per the THD
Bipolar Zero Error specification, where it is the ratio of the rms sum of the individual
This is the deviation of the midscale transition (all 0s to all 1s) distortion products to the rms amplitude of the fundamental
from the ideal (AGND). expressed in dB.
Positive Gain Error Power Supply Rejection Ratio
This is the deviation of the last code transition (01 . . . 110 to This is the ratio of the change in positive gain error to the change
01 . . . 111) from the ideal (+VREF+S – 1 LSB) after bipolar zero in VDD or VSS, in dB. It is a dc measurement.
error has been adjusted out.
Negative Gain Error OPERATIONAL DIAGRAM
This is the deviation of the first code transition (10 . . . 000 to An operational diagram for the AD7884/AD7885 is shown in
10 . . . 001) from the ideal (–VREF+S + 1 LSB) after bipolar zero Figure 6. It is set up for an analog input range of ± 5 V. If a ± 3 V
error has been adjusted out. input range is required, A1 should drive ± 3VINS and ± 3VINF
Signal-to-(Noise + Distortion) Ratio
with ± 5VINS, ± 5VINF being tied to system AGND.
This is the measured ratio of signal-to-(noise + distortion) at the +5V –5V
output of the A/D converter. The signal is the rms amplitude of
the fundamental. Noise is the rms sum of all nonfundamental
signals up to half the sampling frequency (fS/2), excluding dc. AVDD VDD AVSS VSS
(up to fS/2 and excluding dc) to the rms value of the fundamental. Figure 6. AD7884/AD7885 Operational Diagram
Normally, the value of this specification is determined by the larg-
est harmonic in the spectrum, but for parts where the harmonics The chosen input buffer amplifier (A1) should have low noise and
are buried in the noise floor, it will be a noise peak. distortion and fast settling time for high bandwidth applications.
The AD711, AD845, and AD817 are suitable op amps.
Intermodulation Distortion
With inputs consisting of sine waves at two frequencies, fa and A2 is the force, sense amplifier for AGND. The AGNDS pin
fb, any active device with nonlinearities will create distortion should be at zero potential. Therefore, the amplifier must have a
products at sum and difference frequencies of mfa ± nfb where low input offset voltage and good noise performance. It must
m, n = 0, 1, 2, 3, and so on. Intermodulation terms are those for also have the ability to deal with fast current transients on the
which neither m nor n are equal to zero. For example, the second AGNDS pin. The AD817 has the required performance and is
order terms include (fa + fb) and (fa – fb), while the third order the recommended amplifier.
terms include (2fa + fb), (2fa – fb), (fa + 2fb), and (fa – 2fb). If AGNDS and AGNDF are simply tied together to star
ground instead of buffering, the SNR and THD are not signifi-
cantly degraded. However, dc specifications like INL, bipolar
zero, and gain error will be degraded.
–8– REV. E
AD7884/AD7885
The required 3 V reference is derived from the AD780 and The signal at the output of A2 is proportional to the error
buffered by the high speed amplifier A3 (AD845, AD817, or between the first phase result and the actual analog input
equivalent). A4 is a unity gain inverter that provides the –3 V signal and is digitized in the second conversion phase. This
negative reference. The gain setting resistors are on-chip and are second phase begins when the 16-bit DAC and the residue
factory trimmed to ensure precise tracking of VREF+. Figure 6 error amplifier have both settled. First, SW2 is turned off and
shows A3 and A4 as AD845s or AD817s. These have the ability to SW3 is turned on. Then, the SHA section of the residue
respond to the rapidly changing reference input impedance. amplifier goes into hold mode. Next SW2 is turned off and
SW3 is turned on. The 9-bit result is transferred to the output
CIRCUIT DESCRIPTION latch and ALU. An error correction algorithm now compensates
Analog Input Section for the offset inserted in the residue amplifier section and
The analog input section of the AD7884/AD7885 is shown in errors introduced in the first pass conversion and combines both
Figure 7. It contains both the input signal conditioning and results to give the 16-bit answer.
sample-and-hold amplifier. Note that the analog input is truly R4
benign. When SW1A goes open circuit to put the SHA into the ⴞ3V SIGNAL 4k⍀ 0 TO –3V
9-BIT
FROM INPUT 9
hold mode, SW1B is closed. This means that the input resistors, SHA SW2 ADC LATCH
R5 + 16
R1 and R2, are always connected to either virtual ground or R6 4k⍀ ALU
2k⍀ 9
true ground. VREF–
R3 A2
3k⍀ SW3
RESIDUE AMP
+ SHA
R1 C1
3VINF 16-BIT 9
3k⍀ R4 ACCURATE
4k⍀ DAC
3VINS SW1A A1
A1 TO 9-BIT
ADC +3V –3V
5VINF R2 R5
5k⍀ R6 4k⍀
2k⍀ R7
5VINS 2k⍀ R8
SW1B TO RESIDUE VREF– 2k⍀
AMPLIFIER A2
REV. E –9–
AD7884/AD7885
USING THE AD7884/AD7885 ANALOG INPUT RANGES To do this the reference noise needs to be less than 35 µV rms.
The AD7884/AD7885 can be set up to have either a ± 3 V analog In the 100 kHz band, the AD780 noise is less than 30 µV rms,
input range or a ± 5 V analog input range. Figures 10 and 11 show making it a very suitable reference.
the necessary corrections for each of these. The output code is The buffer amplifier used to drive the device VREF+ should have
twos complement and the ideal code table for both input ranges low enough noise performance so as not to affect the overall
is shown in Table I. system noise requirement. The AD845 and AD817 achieve this.
Decoupling and Grounding
Table I. Ideal Output Code Table for the AD7884/AD7885
The AD7884 and AD7885A have one AVDD pin and two VDD
Analog Input pins. They also have one AVSS pin and three VSS pins. The
ⴞ3 V ⴞ5 V Digital Output AD7885 has one AVDD pin, one VDD pin, one AVSS pin, and
In Terms of FSR2 Range3 Range4 Code Transitionl one VSS pin. Figure 6 shows how a common +5 V supply should
be used for the positive supply pins and a common –5 V supply
+FSR/2 – 1 LSB 2.999908 4.999847 011 . . . 111 to 111 . . . 110 for the negative supply pins.
+FSR/2 – 2 LSBs 2.999817 4.999695 011 . . . 110 to 011 . . . 101
+FSR/2 – 3 LSBs 2.999726 4.999543 011 . . . 101 to 011 . . . 100 For decoupling purposes, the critical pins on both devices are
the AVDD and AVSS pins. Each of these should be decoupled to
AGND + 1 LSB 0.000092 0.000153 000 . . . 001 to 000 . . . 000 system AGND with 10 µF tantalum and 0.1 µF ceramic capaci-
AGND 0.000000 0.000000 000 . . . 000 to 111 . . . 111 tors right at the pins. With the VDD and VSS pins, it is sufficient
AGND – 1 LSB –0.000092 –0.000153 111 . . . 111 to 111 . . . 110 to decouple each of these with ceramic 1 µF capacitors.
–(FSR/2 – 3 LSBs) –2.999726 –4.999543 100 . . . 011 to 100 . . . 010 AGNDS, AGNDF are the ground return points for the on-chip
–(FSR/2 – 2 LSBs) –2.999817 –4.999695 100 . . . 010 to 100 . . . 001 9-bit ADC. They should be driven by a buffer amplifier as shown
–(FSR/2 – 1 LSB) –2.999908 –4.999847 100 . . . 001 to 100 . . . 000 in Figure 6. If they are tied directly together and then to ground,
NOTES there will be a marginal degradation in linearity performance.
1
This table applies for V REF+S = 3 V.
2
FSR (full-scale range) is 6 V for the ± 3 V input range and 10 V for the The GND pin is the analog ground return for the on-chip lin-
± 5 V input range. ear circuitry. It should be connected to system analog ground.
3
1 LSB on the ± 3 V range is FSR/2 16 and is equal to 91.5 µV.
4
1 LSB on the ± 5 V range is FSR/216 and is equal to 152.6 µV.
The DGND pin is the ground return for the on-chip digital
circuitry. It should be connected to the ground terminal of the
Reference Considerations VDD and VSS supplies. If a common analog supply is used for
The AD7884/AD7885 operates from a ± 3 V reference. This can AVDD and VDD, then DGND should be connected to the com-
be derived simply using the AD780 as shown in Figure 6. mon ground point.
Power Supply Sequencing
5VINS
AVDD and VDD are connected to a common substrate and there is
typically 17 Ω resistance between them. If they are powered by
A1 5VINF separate 5 V supplies, then these should come up simultaneously.
VINV
Otherwise, the one that comes up first will have to drive 5 V
3VINS into a 17 Ω load for a short period of time. However, the standard
3VINF
short-circuit protection on regulators like the 7800 series will
ensure that there is no possibility of damage to the driving device.
AVSS should always come up either before or at the same
time as VSS. If this cannot be guaranteed, Schottky diodes
Figure 10. ± 5 V Input Range Connection
should be used to ensure that VSS never exceeds AVSS by
more than 0.3 V. Arranging the power supplies as in Figure 6
5VINS and using the recommended decoupling ensures that there
5VINF are no power supply sequencing issues as well as giving the
specified noise performance.
3VINS
+5V +5V –5V –5V
HP5082-2810
OR
EQUIVALENT
A1 3VINF
VINV
AVDD VDD AVSS VSS
AD7884/AD7885
Figure 11. ± 3 V Input Range Connections
The critical performance specification for a reference in a 16-bit
application is noise. The reference peak-to-peak noise should be
insignificant in comparison to the ADC noise. The AD7884/AD7885 Figure 12. Schottky Diodes Used to Protect Against
has a typical rms noise of 120 µV. For example, a reasonable Incorrect Power Supply Sequencing
target would be to keep the total rms noise less than 125 µV.
–10– REV. E
AD7884/AD7885
AD7884/AD7885 PERFORMANCE 3000
Linearity
The linearity of the AD7884/AD7885 is determined by the
on-chip 16-bit D/A converter. This is a segmented DAC that is
laser trimmed for 16-bit DNL performance to ensure that there
CODE FREQUENCY
2000
are no missing codes in the ADC transfer function. Figure 13
shows a typical INL plot for the AD7884/AD7885.
2.0
VDD = +5V
VSS = –5V 1000
TA = 25ⴗC
LINEARITY ERROR – LSBs
1.5
0
1.0 (X – 2) (X – 1) (X) (X + 1) (X + 2) (X + 3)
CODE
1000
and A/D converter noise. The sample-and-hold section contrib-
utes 51 µV rms and the ADC section contributes 59 µV rms.
These add up to a total rms noise of 78 µV. This is the input
referred noise in the ± 3 V analog input range. When operating 500
in the ± 5 V input range, the input gain is reduced to –0.6. This
means that the input referred noise is now increased by a factor
of 1.66 to 120 µV rms.
Figure 14 shows a histogram plot for 5000 conversions of a dc 0
input using the AD7884/AD7885 in the ± 5 V input range. The (X – 1) (X) (X + 1) (X + 2)
analog input was set as close as possible to the center of a code CODE
transition. All codes other than the center code are due to the
ADC noise. In this case, the spread is six codes. Figure 15. Histogram of 2500 Conversions of a DC Input
Using a ×2 Oversampling Ratio
REV. E –11–
AD7884/AD7885
Dynamic Performance MICROPROCESSOR INTERFACING
With a combined conversion and acquisition time of 6 µs, the The AD7884/AD7885 is designed on a high speed process
AD7884/AD7885 is ideal for wide bandwidth signal processing appli- that results in very fast interfacing timing (data access time of
cations. Signal-to-(noise + distortion), total harmonic distortion, 57 ns max). The AD7884 has a full 16-bit parallel bus, and the
peak harmonic or spurious noise, and intermodulation distortion AD7885 has an 8-bit wide bus. The AD7884, with its parallel
are all specified. Figure 16 shows a typical FFT plot of a 1.8 kHz, interface, is suited to 16-bit parallel machines whereas the
±5 V input after being digitized by the AD7884/AD7885. AD7885, with its byte interface, is suited to 8-bit machines.
0
Some examples of typical interface configurations follow.
fIN = 1.8kHz, ⴞ5V SINE WAVE AD7884 to MC68000 Interface
fSAMPLE = 163kHz
SNR = 87dB
Figure 18 shows a general interface diagram for the MC68000
–30
THD = –95dB 16-bit microprocessor to the AD7884. In Figure 18, conversion
is initiated by bringing CSA low (i.e., writing to the appropriate
–60 address). This allows the processor to maintain control over the
complete conversion process. In some cases, it may be more
dB
ADDRESS
MC68000 DECODE LOGIC AD7884
–150
2048 POINT FFT
CSB CSA
CONVST
Figure 16. AD7884/AD7885 FFT Plot DTACK
CS
Effective Number of Bits AS
RD
The formula for SNR (see Terminology section) is related to R/W
the resolution or number of bits in the converter. Rewriting the
formula, below, gives a measure of performance expressed in D15–D0 DATA BUS DB15–DB0
effective number of bits (N).
N = (SNR − 1.76) 6.02
Figure 18. AD7884 to MC68000 Interface
16
Once conversion has been started, the processor must wait until
15
it is completed before reading the result. There are two ways of
ensuring this. The first way is to simply use a software delay to
EFFECTIVE NUMBER OF BITS
wait for 6.5 µs before bringing CS and RD low to read the data.
14
The second way is to use the BUSY output of the AD7884 to
13
generate an interrupt in the MC68000. Because of the nature of
its interrupts, the MC68000 requires additional logic (not shown
in Figure 18) to allow it to be interrupted correctly. For full
12
information on this, consult the MC68000 User’s Manual.
11
10
0 20 40 60 80
FREQUENCY – kHz
–12– REV. E
AD7884/AD7885
MEMORY READ
MRDC
CLK DECODE
CLK
CIRCUITRY
80286 BUSY
CPU
D15–D0
IR0–IR7
8259A
INTERRUPT
CONTROLLER
8286 OR 8287
TRANSCEIVER
REV. E –13–
AD7884/AD7885
AD7884 to ADSP-2101 Interface Standalone Operation
Figure 21 shows an interface between the AD7884 and the If CS and RD are tied permanently low on the AD7884, then,
ADSP-2101. Conversion is initiated using a timer that allows when a conversion is completed, output data will be valid on the
very accurate control of the sampling instant. The AD7884 BUSY rising edge of BUSY. This makes the device very suitable for
line provides an interrupt to the ADSP-2101 when conversion is standalone operation. All that is required to run the device is an
completed. The RD pulsewidth of the processor can be programmed external CONVST pulse that can be supplied by a sample timer.
using the Data Memory Wait State Control register. The result Figure 22 shows the AD7884 set up in this mode with the BUSY
can then be read from the ADC using the following instruction: signal providing the clock for the 74HC574 three-state latches.
MR0 = DM ( ADC ) A0
TIMER
where MR0 is the ADSP-2101 MR0 register, and ADC is the HBEN
AD7884 address.
CONVST
TIMER
DB15–DB8 74HC574
ADSP-2101 ADDRESS
AD7884 DB7–DB0 74HC574
DECODE LOGIC
DMS EN
BUSY CLK
CONVST
CS
CS
RD
IRQn BUSY
RD RD
DMD15–DMD0 DB15–DB0
Figure 22. Standalone Operation
DATA BUS
Digital Feedthrough from an Active Bus
It is very important when using the AD7884/AD7885 in a
microprocessor based system to isolate the ADC data bus from
Figure 21. AD7884 to ADSP-2101 Interface
the active processor bus while a conversion is being executed.
This yields the best noise performance from the ADC. Latches
like the 74HC574 can be used to do this. If the device is connected
directly to an active bus, then the converter noise typically increases
by a factor of 30%.
–14– REV. E
AD7884/AD7885
OUTLINE DIMENSIONS
0.100 (2.54)
0.005 (0.13) MAX
MIN
28 15
0.610 (15.49)
0.500 (12.70)
PIN 1
1 14
0.620 (15.75)
0.225(5.72) 1.490 (37.85) MAX 0.015 (0.38) 0.590 (14.99)
MAX MIN
0.150 (3.81)
MIN 0.018 (0.46)
0.200 (5.08) 15 0.008 (0.20)
0.125 (3.18) 0.100 0.070 (1.78) SEATING 0
0.026 (0.66) (2.54) 0.030 (0.76) PLANE
0.014 (0.36) BSC
0.100 (2.54)
0.005 (0.13) MAX
MIN
40 21
0.620 (15.75)
0.510 (12.95)
PIN 1
1 20
0.63 (16.00)
2.096 (52.23) MAX 0.070 (1.78) 0.59 (14.93)
0.225 (5.72) 0.015 (0.38)
MAX
0.018 (0.46)
0.200 (5.08)
15 0.008 (0.20)
0.125 (3.18) SEATING
0.026 (0.66) 0.065 (1.65) 0
0.100 (2.54) PLANE
0.014 (0.36) BSC 0.045 (1.14)
REV. E –15–
AD7884/AD7885
OUTLINE DIMENSIONS
C01353–0–2/03(E)
0.180 (4.57)
0.048 (1.22) 0.165 (4.19)
0.042 (1.07) 0.056 (1.42)
0.042 (1.07) 0.020 (0.51)
MIN
6 40
0.048 (1.22) 7 PIN 1 39 0.021 (0.53)
0.042 (1.07) IDENTIFIER
0.013 (0.33)
0.630 (16.00)
TOP VIEW 0.050 BOTTOM VIEW
(PINS DOWN) (1.27) 0.590 (14.99) (PINS UP)
BSC
0.032 (0.81)
0.026 (0.66)
17 29
18 28
0.040 (1.02)
0.656 (16.66) 0.120 (3.05) 0.025 (0.64)
SQ
0.650 (16.51) 0.090 (2.29)
0.695 (17.65)
SQ
0.685 (17.40)
Revision History
Location Page
–16– REV. E