I n d u s t r i a l M e a s u r i n g Te c h n o l o g y f r o m C a r l Z e i s s

ST-ATAC.
Dynamic 3D Probe Head with
Adaptive Touch Advanced Control

S I M P LY M E A S U R E
Spectrum of Applications

Fast, dynamic data acquisition by • Complete collision protection of the mobile

means of single-point probing in probe part.
the production of automobiles, • All also possible with long probes – even if they
machines, tools and patterns – are mounted laterally for the measurement of
totally free from probe bending deep bores – and even with very high probe
and mechanical hysteresis. masses.
Sturdy, durable, wear-free
Optimal use of measuring volume
design, and all with high sensi-
• If spatial probe orientation is performed using
bility – constant in all spatial
articulating probe holders, valuable measuring
directions and therefore direc-
space is lost primarly in the Z-range, but also in
tionally independent.
the X- and Y-directions:
• Much larger CMMs are required for workpieces
Flexible, universal,reliable
of the same size.
• For all length measurements on prismatic parts
• The use of probe changing system greatly
or quick point sequences on any surfaces. Com-
reduces this loss in measuring volume.
plete testing of the workpiece using only a few
probe combinations.
Drastically reduced setting-up
• A plausibility test is available to identify probing
times
errors.
• Prequalified probe combinations eliminate the
preparation times otherwise needed to configu-
rate the probes. Your CMM is instantly ready for
use.

With articulating probe holders, With ST-ATAC , the CMM

a serious part of CMM measuring measuring range is optimal-
range gets lost. ly used.

Articulating probe holder ST-ATAC

lost area
typical Z-measuring range

lost
area
remaining
meas. range Zeiss-typical nomination of
Z-measuring range:
lost area from lower edge of adapter
plate
High-accuracy probe change
• Highly accurate electromagnetic mounting
mechanism provides a repeatability of with-
in 1 µm without recalibration.
• The Probe change can be performed manual-
ly or CNC controlled in connection with a
probe change magazine.

Fully automatic measurement

• Due to the use of a probe changing system.
Uninterrupted multi-shift operation for the
measurement of different parts – even with
automatic loading.

Simple operation
• Brief probe changing times, only one CNC
calibration. An appropriately configurated
probe combination can be assigned to each
workpiece.

Data storage
• All calibration data is stored and can be re-
called at a later time.

Measuring ranges: Probe systems in comparison

ST-ATAC
with probe
changer

Articulating
probe holder
Technology

The unique combination of the

technical features gives the
ST-ATAC a wide application
spectrum at a high precision.

Dual principle
• Piezoelectric elements supply the actual prob-
ing pulse. They are located in front of the buck-
ling mechanism.
• Three-point bearing as a mechanical buckling
mechanism, to acknowledge the probing con-
tact and protect the ST when contact is made or First, virtually force-free probing pulse, then mechanical
deflection: condition for reliable probing.
a collision occurs.

Electr. signal
Force-free and direction-indepen-
dant probing
• The probing pulse is generated on the slightest
Piezo signal
contact with the part with a measuring force of
less than 0.01 N, in other words, virtually force-
free.The probing pulse is generated prior to the
mechanical probe head deflection, with the
reading of the length-measuring system being
stored. These two conditions must be met be-
Mechanical contact Mechanical contact
fore the measured data can be recorded. closed open
• As a result, the deflection forces, which differ as
a function of the bearing and direction, do not Measuring force on
contact < 0.01 N
affect the measuring result: The ST-ATAC pro-
vides constant accuracy in all probing directions.
No special calibration is required when measur-
ing probing objects inclined in three dimensions.
ATAC for even better probing security

a) e.g. with standard

Piezo signal probing conditions

b) e.g. with light drilling oil

contamination

intelligent c) e.g. with flexible work-

on-line piece materials and very
computation thin probes
trigger
of contact
treshold
point

contact point probing pulses

 Specifications

General ST-ATAC
Design Directionally independent 6-way probe head with dual principle
(mechanical and piezo pulses).
For single-point measurement
Probe mounting system Held electromagnetically via adapter plates
Adapter plate diameter = 44 mm (1.7 in.)

Performance Data
Probing directions 6; ±X, ±Y, ±Z
Measuring force on data transfer < 0.01 N
at mechanical deflection: Vertical: up to 5 N
Horizontal: up to 1,4 N
Overshoot X, Y: ±14 mm (±0.55 in.)
Z: ± 7 mm (±0.28 in.)
Permiss. probe mass 200 g (0.44 oz)
Permiss. probe length 200 mm (8 in.)
Min. ball tip diameter Standard 1.5 mm (0.06 in.)
Special probes 1.0 mm (0.04 in.)
Probe changing repeatability 1 µm / 200 mm probe length (0.000 039 in. / 8 in. probe length)
Repeatability 0.5 µm / 60 mm probe length (0.000 020 in. / 2.36 in. probe length),
with 8mm (0.31 in.) ball tip diameter
Permissible sound level 75 dBA at sinusodial excitation
80 dBA noise

Permissible environmental Conditions

Ambient operating temperature +5 °C to +40 °C (41 °F to 104 °F)
Carl Zeiss

E-mail: imt@zeiss.de
D-73446 Oberkochen
Unternehmensbereich

Fax: +49 73 64/20-38 70

Industrielle Meßtechnik

Sales: +49 18 03/33 63 36

Service: +49 18 03/33 63 37

Internet: http://www.zeiss.de
60-20-107-e Printed in Germany. VII/99 Noo
Subject to technical modification and to changes in scope and design.
Printed on chlorine-free paper.
© Carl Zeiss © conception, text and design: Carl Zeiss.