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Challenges
& Test Solutions
Design Challenges
LTE Development Lifecycle
Chipset development
Antenna Techniques
Resistance to Fading & AWGN
Voice over LTE
Design and Test Challenges - LTE
Power consumption
– Always an issue, especially with first-generation
devices
– Need to perform measurements under realistic
conditions, with multiple tasks running in parallel
and at high data rate
Multiple radio standards:
– LTE + WCDMA (FDD + TD-LTE) + GSM/GPRS +
CDMA2000 + WiFi
– Need to be tested in combinations
Smaller form factors
– USB dongle, embedded module, PC Card
– Can cause heat dissipation and EMC issues which,
again, need to be tested under realistic conditions
Expected LTE Development Process
PHY TEAM
PROTOCOL/BASEBAND
BB
MAC/RLC
TEAM
HL Development
(Host test)
Chipset development
7100 TM500
SISO Single-input single-output
• AWGN
– Affects UE more adversely. When combined with Fading,
notable fluctuation in data throughput rate occurs
Effects of Fading and AWGN
FADING– multipath reception
– Time varied amplitude and phase
AWGN – background interference
– Affects SNR (Signal to Noise Ratio)
UL and DL channels
– VSA for testing UE UL signal generation from UE
• Test transmission of PRACH/PUSCH etc
– VSG for testing UE DL reception and MIMO
• Test reception of PBCH, PDCCH etc
• use predefined waveforms generated from
software such as Matlab
– Digital IQ / DigRF for testing BB if RF not ready
– Fading simulator to test multipath fading
– Following initial testing of UL/DL channels and signals,
combined testing is required (eg for Cell Search)
• Achieved by using a protocol tester
LTE UE RF Testing
Tx characteristics Rx characteristics
– Transmit power (MOP/MPR) – Reference sensitivity level
– UE maximum input level
– Output power dynamics
– Adjacent channel selectivity
– Transmit Signal Quality
– Blocking characteristics
– Output RF spectrum emissions
– Intermodulation
– Spurious Emission characteristics
– Transmit Intermodulation – Spurious emissions
– Performance requirements
RF Test Applications Overview
Conformance &
Non Signalling RF Signalling RF Production
Regulatory
RF Design
Protocol Design Sample
RF Design Regulatory
System Product Test
Module Test Pre-Conformance
Performance Signalling &
RF Module Test Conformance
Integration Non-signalling
3GPP 36.521RF Tests
RF
RFPARAMETRIC
PARAMETRICMEASUREMENTS
MEASUREMENTS
6.2.2 UE Maximum Output Power The tests listed are some of the key tests
6.2.3 Maximum Power Reduction (MPR) required for RF testing
6.3.2 Minimum Output Power
6.3.3 Transmit OFF power
6.5.1 Frequency Error
6.5.2.1 Error Vector Magnitude (EVM)
6.6.1 Occupied bandwidth
6.6.2.1 Spectrum Emission Mask
6.6.2.3 Adjacent Channel Leakage power Ratio
6.7 Transmit inter-
inter-modulation
7.3 Reference sensitivity level
7.4 Maximum input level
7.5 Adjacent Channel Selectivity (ACS)
7.6.1 In-
In-band blocking
7.6.3 Narrow band blocking
Protocol Test Equipment
Requirements
PERFORMANCE MEASUREMENTS
FUNCTIONAL
RF PARAMETRIC TEST
MEASUREMENTS
Cell Selection
Cell Selection / Re-Selection
RRC Connection/Release
Cell Re-Selection
Attach Context Activation /Release
Authentication Location Update
DetachSession Establishment /Release
Mobile Originated
Location Update, / Mobile Terminated
Measurement
Mobile Originated Call Reporting
CipheringTransmit Timing Accuracy
Mobile Terminated Call
Inter-Freq Handover
Handover including Inter-RAT
Multi-Cellular Technology Call
Quality Measurement Reports
A-GPS
Advanced Callbox Testing
Adjust Cell Conditions Dynamically
using GUI and Analyse UE responses
– All Transmission Modes
• SISO, MIMO
– Channel Configurations
– Cell Power Levels
– Interference
– Fading conditions
• Timing Advance
• Cell Edge Performance
LTE Test Equipment Requirements