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Best Practices in Transformer Maintenance

NWPPA, Anchorage, AK October 2009


Wayne Bishop Business Development Manager

Todays Presentation
Introduction to OMICRON Meeting the Challenges in our Industry Condition Assessment of Transformers New Technologies for Testing (Peter Fong) F )
Current Transformer Testing Dielectric Response Analysis

OMICRON

January 13, 2008

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OMICRON
World Leader in the design and manufacture of test instruments for f t ft ti t t f power system apparatus Test Instruments in 130 countries Team of 400 employees worldwide p y

OMICRON

January 13, 2008

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OMICRON worldwide
A truly international team with a worldwide network

Houston / USA

Boston/ USA

Korea Shanghai / China Hong Kong

Stafford / Great Britain New Delhi / India Cergy / France Bahrain

Madrid / Spain Klaus / Austria

Berlin / Germany Melbourne / Australia Erlangen / Germany

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11/9/2009

BUprim - Hardware
The Innovations in Primary Testing!
MPD600 (PD) DIRANA (DFR)

CPC 100 Multifunctional Primary Test Set CP GB1 Grounding Box

CP CU1 Coupling Unit

CPC 100 + CP TD1 Power Factor Testing CT Analyzer FRAnalyzer (SFRA)

11/9/2009

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BUsec - Hardware

CMC 256plus

CMC 356

CMS 156

CMC 156

CMB IO-7

CMS 252

CMA 156

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11/9/2009

Challenges Facing our Industry


With deregulation of the energy markets, the life span of electrical assets becomes critical. p All assets including all transformers have to be in service as long as possible. For transformers this can mean continuous operation over the life span of the asset at full load or even more since redundant transformer assets are not available.

OMICRON

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S tuat o o ost o dust y Situation for Most of Industry

A large percentage of transformers are in service for more than 25 years with the health of the transformers not often known. t ft k About 35% - 40% of all transformer faults are caused by y breakdowns in the aged insulation. Temperature Moisture

OMICRON

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Situation Today
Many of the transformers in Germany have an age of 25-30 years
100 90

No. of transforme f ers

80 70 60 50 40 30 20 10 0 1-5 6-10 11-15 16-20 21-25 26-30 31-35 36-40 41-45 46-50 51-55

Age of transformers / years Betriebsalter der Transformatoren in Jahren

Problem: faults happen more often with increasing age


OMICRON Page 9

Healthy 90 year old

OMICRON

January 13, 2008

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Healthy?
Blood Tests Urinalysis Urinal sis Temperature and Blood Pressure Ultrasound MRI Family Health History Life Style, Environment Stress Style Environment,

OMICRON

January 13, 2008

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Is thi I this a Healthy Transformer? H lth T f ?

OMICRON

January 13, 2008

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Similar M th d l Si il Methodology
Healthy Person ? Blood Tests, Urinalysis, p Temperature Family History Stress, Environment, Workplace, Lifestyle Type of Care Healthy Transformer ? DGA, Power Factor, % Moisture Insulation Transformer Design History Load Profile, Location of ti f L d P fil L Transformer Maintenance Program (TBM, CBM, RCM)
January 13, 2008 Page 13

OMICRON

Transformer Diagnostics
Review Patients History
Family History of y y
High Blood Pressure and Heart Disease High Cholesterol, Cancer Risks, etc.

Review History of Transformer


Maintenance History Operational History Service Advisories Factory Tests Site Inspections Routine Tests

OMICRON

January 13, 2008

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Generator Transformer 27/400kV

HV Bushing Measuring Tap LV Bushing

Diverter Switch Tap Selector Core C


OMICRON

Tapped Winding High Voltage Winding Low V l L Voltage Wi di Winding


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Failure Mode Properties

Dielectric St Di l t i Stress Thermal Degradation Mechanical Stress

OMICRON

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Maintenance Philosophies
Time Based Maintenance (TBM)
Perform Routine P P f R ti Preventative Maintenance t ti M i t

Reliability Centered Maintenance (RCM)


Focus Resources on Bad Actors

Condition Based Maintenance (CBM)


Require Indication while In-service

The Maintenance Spectrum


Run to Failure Diagnostic Overkill

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November 9, 2009

Transformer Tests
DGA/Oil Screen/Furans Power Factor and Capacitance Excitation Current Turns Ratio (TTR) SFRA Leakage Reactance DC Winding Resistance Dielectric Frequency Response IR
OMICRON January 13, 2008 Page 18

Dielectric DGA Oil Screen PF/Cap Excitation Current TTR Partial Discharge Dielectric Frequency Response
OMICRON

Thermal DGA Oil Screen Thermal Imaging DC Winding Resistance

Mechanical SFRA Leakage Reactance Capacitance Excitation Current DC Winding Resistance

January 13, 2008

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Electrical Measurement Methods I


Measurement Method
Winding resistance (static) Winding Wi di resistance i t (dynamic)

Application
Contact problems, broken or loose connections, broken conductors Contact problems at the diverter switch, broken transition resistors

Indicated by
High internal temperatures, e.g. indicated by DGA results or Buchholz Relay DGA, Buchholz Relay High through-fault currents

Kind of on-/offTest* line


FRT off

FRT FRT FT FT FT

off off off off off

Leakage reactance (stray Winding deformation reactance) Frequency Response of Broken parallel strands the Stray Losses (FRSL)

High internal temperatures, e.g. indicated by DGA results High internal temperatures, No-load impedance Core problems, shorted turns e.g. e g indicated by DGA results High internal temperatures, Magnetising current Core problems, shorted turns e.g. indicated by DGA results F=Fingerprint, R=Routine, T=Troubleshooting, S=Special

OMICRON

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Electrical Measurement Methods II


Measurement Method Turns ratio Frequency Response Analysis (FRA) Insulation resistance Capacitance and p Dielectric Dissipation Factor Dielectric Response Measurement (FDS M t and PDC) Partial Discharge Application After Buchholz Relay Winding deformation, winding displacement, core faults, faulty screen or core Insulation problems Main insulation: ageing, g g, moisture - Bushings: ageing, partial Main insulation: ageing, moisture - B hi i t Bushings: ageing, partial Insulation problems Indicated by Buchholz Relay has High through-fault currents, transportation Breakdowns, Buchholz Relay DGA high water content in oil / hi h di l t i il high dielectric losses DGA Kind on-/offof line Test* T off F(R)T off

FRT FRT

off on/off

FRT T

off ff on/off

F=Fingerprint, R=Routine, T=Troubleshooting, S=Special g p g p

OMICRON

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