Beruflich Dokumente
Kultur Dokumente
FMEA and SIL Assessment of the BD120 Dual Level Trip Amplifier
Prepared By: RM Consultants Ltd Genesis Centre Birchwood Science Park Risley Warrington Cheshire WA3 7BH
13239 J4102
PROJECT: Instrument FMEA and SIL Assessment TITLE: FMEA and SIL Assessment of the BD120 Dual Level Trip Amplifier REVISION RECORD ISSUE DATE AUTHOR CHECKED BY APPROVED BY
August 2006
R I Wright
J Jones
R I Wright
September 2006
R I Wright
J Jones
R I Wright
November 2006
R I Wright
A Fox
R I Wright
FORM RM 11A
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc) 30 November 2006
SUMMARY: A Failure Modes and Effects Analysis has been performed for the Lee-Dickens BD120 dual level trip amplifier. This has been used to determine the overall rate of failure of the unit, the dangerous failure rate, the Safe Failure Fraction, the probability of failure on demand and the corresponding Safety Integrity Level. The analysis was performed on the basis (i) that the unit trips on high level and (ii) that the unit trips on low level. In both cases, the analysis assumed that the output relay de-energises on trip (fail safe with regard to power failure). The results for the output relay contact opening on trip and closing on trip were derived. In addition, two versions of the trip amplifier have been analysed the unit without the header used for an input range of 4-20mA, and the unit with a header used for thermocouple, resistance thermometer, potentiometer, voltage and other current range inputs. It is concluded that the BD120 achieves SIL2 with a proof test interval of 1 year or less, except when the instrument with the header is used in the trip on low input mode. In this case only SIL1 is achieved, a 9 month or less proof test interval being required to achieve SIL2.
DISTRIBUTION:
FORM RM 11B
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc) 30 November 2006
Revision Sheet
Issue No A B C
Change/Reference Documents Issued to client for review. Approved by client RV4 added to FMEA of Block A as some failure modes affect other channel.
FORM RM 11C
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc) 30 November 2006
BD120
Iss 3 Apr 08
SPECIFICATIONS
Please note that the following are typical ranges. Other ranges available, please contact sales office.
Potentiometers (3 wire)
Between 0 and 10K ohms Minimum span 10 ohms Maximum span 10K ohms
INPUTS: D C Current
0-1mA into 100 ohms 0-10mA into 10 ohms 4-20mA into 10 ohms Option: Upscale drive on loss of 4 to 20mA input signal Other current inputs as required Minimum current 10A, Maximum current 100mA
Response Time
30mS or better
Contact Ratings
Max current 2A Max voltage 220V dc / 250V ac Maxi load 60W 62.5VA
Power Required
3VA Maximum
GENERAL: Thermocouples
Type B, E, J, K, N, R, S & T Temperature covered: Type Range MinTemp Change B 600 to 1800C 400C E -260 to 1000C 65C J -200 to 1200C 80C K -260 to 1370C 100C N 0 to 1300C 150C R 50 to 1760C 400C S 80 to 1760C 400C T -260 to 400C 100C Automatic cold junction compensation Open circuit thermocouple monitoring upscale or downscale drive
Switching Differential
0.5% of span approx
Temperature Coefficient
0.1% of span/_ 10C (for inputs > 100mV) + Cold junction error, for thermocouple inputs
D C Voltage
Range: -250 and +250 Volts DC Minimum voltage span 5mV Maximum voltage span 500V Input Impedance: 1M or greater
Switching Mode
Relay energises or de-energises on rising or falling signal as required
A C Current
0 to 1A
Set Points
270 screw driver potentiometer through front panel
A C Voltage
0 to 250 V
Resistance (2 wire)
Between 0 and 20K ohms Minimum span 5 ohms Maximum span 20K ohms
Weight
145 gms
MECHANICAL DETAILS
TERMINATION DETAILS Terminal 1 Power Supply Neutral 2 Power Supply Live 3 Power Supply Earth
Terminal 7 Relay N/O 8 Common Top Trip 9 Relay N/C 10 Relay N/O 11 Common Lower Trip 12 Relay N/C
DC mV/V 2 Wire 3 Wire Resistance Slidewire Pot Thermometer
AC AC DC Current Volts mA
T/Cs
~ ~
~ ~
-ve +ve
-ve +ve
-ve +ve
0% 100%
0% Wiper 100%
- HHNF = High High Non Fail Safe - HLNF = High Low Non Fail Safe
- LLFS = Low Low Fail Safe - HLFS = High Low Fail Safe
H = High Trip = Alarm condition above the set point L = Low Trip = Alarm condition below the set point FS = Fail Safe = Relay normally energised to de-energise in the alarm condition NF = Non Fail Safe = Relay normally de-energised to energise in the alarm condition
LEE-DICKENS LTD, Rushton Road, Desborough, Kettering, Northants, NN14 2QW Tel: 01536-760156
CONTENTS Page No
1. 2.
INTRODUCTION METHODOLOGY 2.1 2.2 2.3 2.4 Scope FMEA PFD and SFF Safety Integrity Level
1 1 1 2 3 3 4 5 5 5 5 6 7 7 8 9
3. 4.
FAILURE RATE DATA RESULTS 4.1 4.2 4.3 4.4 4.5 4.6 Total Failure Rates Circuit Block FMEA System Level FMEA (Trip on High Level) System Level FMEA (Trip on Low Level) PFD and SIL Each Channel PFD and SIL Dual Redundant Channels
5. 6.
CONCLUSIONS REFERENCES
Tables 1-9
10
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
30 November 2006
1.
INTRODUCTION The Lee-Dickens BD120 is a trip amplifier with a dual trip threshold. It can be configured by means of internal links for the output relays to energise or de-energise on the input exceeding the trip level. The unit can therefore be configured for either channel to trip on high input or trip on low input with the option to fail safe or non-fail safe on power failure. Normally open and normally closed relay contacts are available. This report details the FMEA study performed on the BD120. The FMEA study has calculated the system failure rate, identified potential failure modes and their likely effect upon the system, categorised the failure effects into a number of failure types and used this data to determine the Safe Failure Fraction (SFF), Probability of Failure on Demand (PFD) and the corresponding BS EN 61508 Safety Integrity Level (SIL).
2. 2.1
METHODOLOGY Scope Two analyses have been performed firstly assuming that the unsafe state results in a high input (trip on high) and secondly that the unsafe state results in a low input (trip on low). Results are derived both for the output relay contacts opening on trip (which would be the normal mode of operation in safety-related applications) and for the output relay contacts closing on trip. It has been assumed that in safety-related applications the instrument will be configured so that the final output relay de-energises when an unsafe state is reached. In addition, two versions of the BD120 have been analysed, with and without the header. The version without the header is used for 4-20mA inputs. The version with the header is used for thermocouple, resistance thermometer, potentiometer, voltage and other current range inputs according to what components are fitted in the header block and their values. As there are many variations according to the input type and range, the analysis has been performed for just one variant, chosen as being the most complex i.e. that for an R Type thermocouple with range 0-500C. The analysis considers hardware reliability with respect to random hardware failures and the architectural constraints when determining the SIL of the instrument. avoidance and control of systematic failures are not considered. Measures for the
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
2.2
FMEA The FMEA has been carried out using the circuit diagrams References 3-5. The circuit of the BD100 has been divided into the following functional blocks: Block A Threshold setting and comparator; Block B Power supply; Block D Input (header version); Block E Input (non-header version). (Block C is not used in this instrument.) Each functional block has been subjected to FMEA using the following process. Each
component has been considered in turn. The potential failure modes of the component have been identified (e.g. open circuit, short circuit) and the effect on the output of the functional block has been described. Each failure effect has been classified using a set of categories appropriate to that functional block. For example, an amplifier may have the following failure categories: High gain; Low gain; Output stuck high; Output stuck low.
Each component has been allocated a failure rate (see Section 3) and the proportion of the total failure rate due to each failure mode has been estimated. In general, all failure modes of a component are considered equally probable. However, for resistors, open-circuit is considered to be responsible for 80% of all failures with short-circuit comprising the remainder. The frequency of each failure mode was calculated by summing the component failure mode frequencies resulting in each functional block failure category. This process was repeated for each functional block. Finally, the effect of each functional block failure category on the unit as a whole was deduced and categorised into system effect categories. For the variant which trips on high level, the categories are: Fails to trip; Trips at too high level; Spurious trip; Trips at too low level; No or little effect.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
These may be categorised into safe or dangerous failures. Taking the trip on high level variant, the effects Fails to trip and Trips at too high level are considered to be dangerous with the remaining failure modes being considered safe. In this instrument, all dangerous failures are undetected i.e. they would only be detected by a proof test of the instrument.
2.3
PFD and SFF The PFD is calculated from the frequency of dangerous, undetected failures (du) and the interval between proof tests (T) using the formula:
PFD =
duT 2
The SFF is calculated from the frequency of safe failures (s), the frequency of dangerous detected failures (dd) and the total system failure rate () as follows:
SFF =
s + dd
2.4
Safety Integrity Level In order to achieve a certain SIL as defined by BS-EN 61508 (Reference 1), various aspects must be satisfied. The aspects covered here are the PFD and the architectural constraints. The PFD requirements for systems operated in an on demand mode of operation where the demand rate is low is: Safety Integrity Level 4 3 2 1 PFD 10-5 < 10-4 10-4 < 10-3 10-3 < 10-2 10-2 < 10-1
In addition, there are constraints on the SIL which can be achieved by a given degree of redundancy (fault tolerance) and SFF. The constraints depend on whether the sub-system can be considered to by Type A or Type B. In order to be considered to be a Type A system the following requirements must be met: a) the failure modes of all constituent components are well defined; b) the behaviour of the subsystem under fault conditions can be completely determined and
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
c) there is sufficient dependable failure data from field experience to support claimed rates of failure for detected and undetected failures. Requirement (a) is met as the instrument is inherently simple, uses discrete component or simple IC circuitry and contains no software. That the behaviour of the instrument under fault conditions can be completely determined, Requirement (b), is demonstrated by the FMEA contained in this report. Failure rate data is taken from MIL-HDBK-217F (Reference 2) which is an industry accepted data source for electronic components. It is generally accepted to be conservative. It is therefore considered that Requirement (c) is also met and the unit can be considered to be a Type A sub-system. The architectural constraints for a system comprising components of Type A are as shown below:
Safe Failure Fraction <60% 60% - <90% 90% - <99% 99% 0 SIL1 SIL2 SIL3 SIL3
Hardware Fault Tolerance 1 SIL2 SIL3 SIL4 SIL4 2 SIL3 SIL4 SIL4 SIL4
Thus, for a single monitor (Fault Tolerance = 0), in order to achieve SIL2, the SFF must be >60% and in order to achieve SIL3 the SFF must be >90%.
3.
FAILURE RATE DATA Failure rates have been taken from the MIL-HDBK-217 handbook of electronic reliability data (Reference 2). This reference gives reliability data for a large number of electronic components for a number of operational conditions and environments. For this analysis the parts count methodology from Reference 2 was used. This type of analysis makes a number of assumptions about the operational conditions of the components and is acceptable for use in this type of analysis. It is generally more conservative than using the parts stress method which requires significant data regarding operational conditions of components. For this calculation it has been assumed that the operational environment of the monitors will be that of a ground fixed environment as defined in Reference 2. This will be appropriate for the industrial environment to which these monitors will be exposed. The overall failure rate of the system is determined from the summation of the failure rates of the components.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
4.
RESULTS As described in Section 2, the FMEA has been carried out in sections. Tables 1-4 show the calculation of component failure rates and the FMEA for the following blocks respectively: Block A Threshold setting and comparator; Block B Power supply; Block D Input (header version); Block E Input (non-header version). The results for the header and non-header versions of the instrument are then derived from the analysis of the blocks.
4.1
Total Failure Rates The total failure rate for the header and non-header versions are calculated from the block failure rates as follows: Block Failure Rate y-1 (header version) A (x2) B D E TOTALS 5.12E-02 1.82E-02 3.60E-02 1.05E-01 Failure Rate y-1 (nonheader version) 5.12E-02 1.82E-02 1.65E-02
8.59E-02
4.2
Circuit Block FMEA Tables 1 to 5 show the FMEAs for Blocks A (trip on high level), Block A (trip on low level), B, D and E. The FMEAs for Block A distinguishes between those failures affecting the normally open relay contacts, the normally closed relay contacts or both. In addition, the FMEAs for Block A indicates whether failures are revealed by the front panel red or green LEDs. Failures in Blocks B, D or C will affect both the normally open and the normally closed relay contacts and will not be detected by operation of the LEDs. omitted from the FMEA. Therefore, the relevant columns are
4.3
System Level FMEA (Trip on High Level) Tables 6 and 7 show the overall FMEA for the non-header and header versions respectively for applications which trip on a high level.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
The results of the FMEA for a single channel are summarised below. high level or trips at a higher level. The SFF has also been calculated. Without header Failure mode n/o relay contact Fails to trip on high input Trips at higher level 4.36E-03 3.31E-03 n/c relay contact 4.16E-03 3.31E-03 7.47E-03 2.81E-02 3.14E-03 2.15E-02 5.27E-02 6.01E-02 87.6%
The dangerous,
undetected failure rate is the sum of the failure rates for the failure modes for failure to trip on
With header n/o relay contact 1.13E-02 3.31E-03 1.46E-02 2.79E-02 1.02E-02 2.68E-02 6.50E-02 7.96E-02 81.7% n/c relay contact 1.11E-02 3.31E-03 1.44E-02 2.81E-02 1.02E-02 2.68E-02 6.52E-02 7.96E-02 81.9%
Dangerous undetected failure rate du 7.67E-03 Spurious trip Trips at lower level Little or no effect 2.79E-02 3.14E-03 2.15E-02 Safe failure rate s 5.25E-02 Total failure rate 6.01E-02 SFF 87.3%
4.4
System Level FMEA (Trip on Low Level) Tables 8 and 9 show the overall FMEA for the non-header and header versions respectively for applications which trip on a low level. The results of the FMEA for a single channel are summarised below. Without header Failure mode n/o relay contact Fails to trip on low input Trips at lower level 1.39E-02 3.14E-03 n/c relay contact 1.37E-02 3.14E-03 1.68E-02 2.13E-02 3.31E-03 1.86E-02 4.33E-02 6.01E-02 72.0% With header n/o relay contact 1.39E-02 1.02E-02 2.42E-02 2.80E-02 3.31E-03 2.40E-02 5.54E-02 7.96E-02 69.6% n/c relay contact 1.37E-02 1.02E-02 2.40E-02 2.82E-02 3.31E-03 2.40E-02 5.56E-02 7.96E-02 69.9%
Dangerous undetected failure rate du 1.70E-02 Spurious trip Trips at higher level Little or no effect 2.11E-02 3.31E-03 1.86E-02 Safe failure rate s 4.31E-02 Total failure rate 6.01E-02 SFF 71.7%
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
4.5
PFD and SIL Each Channel The PFD and corresponding SIL for a single channel of the trip amplifier are given in the table below for various proof test intervals. As there is little difference between the n/o and the n/c relay contact outputs, only the n/o relay contact outputs are considered. Dangerous Undetected Failure Rate (/y) Trip on high level (without header) Trip on high level (with header) Trip on low level (without header) Trip on low level (with header) 7.67E-03 Probability of Failure on Demand (PFD) 1 year PTI 3.83E-03 SIL2 1.46E-02 7.28E-03 SIL2 1.70E-02 8.52E-03 SIL2 2.42E-02 1.21E-02 SIL1 6 month PTI 3 month PTI 1 month PTI 1.92E-03 SIL2 3.64E-03 SIL2 4.26E-03 SIL2 6.04E-03 SIL2 9.58E-04 SIL3* 1.82E-03 SIL2 2.13E-03 SIL2 3.02E-03 SIL2 3.19E-04 SIL3* 6.07E-04 SIL3* 7.10E-04 SIL3* 1.01E-03 SIL3*
* Limited to SIL 2 by the architectural constraints. It can be seen that the instrument generally has a PFD consistent with SIL 2 for a proof test interval of 3, 6 or 12 months. A PFD consistent with SIL 3 is achieved with a proof test interval of 1 month or less. However, as the SFF is in the range 60%-90%, from Section 2.4, the architectural constraints limit the SIL which can be claimed to SIL 2 for a single instrument. The exception is if the instrument with the header is used in the trip on low input mode. This only provides SIL 1 with a 1 year proof test. A proof test interval of 9 months or less is required to achieve SIL 2.
4.6
PFD and SIL Dual Redundant Channels This section considers an application in which both channels must fail in a dangerous manner to constitute a dangerous failure. For example, the trip amplifier may be used to generate a high and a high high alarm and operation of either would result in a safe state. The PFD and corresponding SIL are given in the table below for various proof test intervals. As there is little difference between the n/o and the n/c relay contact outputs, only the n/o relay contact outputs are considered.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
Dangerous Undetected Failure Rate (/y) Trip on high level (without header) Trip on high level (with header) Trip on low level (without header) Trip on low level (with header) 3.70E-03
Probability of Failure on Demand (PFD) 1 year PTI 1.85E-03 SIL2 5.30E-03 6 month PTI 3 month PTI 1 month PTI 9.25E-04 SIL3* 2.65E-03 SIL2 1.93E-03 SIL2* 3.71E-03 SIL2 4.63E-04 SIL3* 1.32E-03 SIL2 9.64E-04 SIL3* 1.85E-03 SIL2 1.54E-04 SIL3* 4.42E-04 SIL3* 3.21E-04 SIL3* 6.18E-04 SIL3*
1.06E-02
SIL2 3.85E-03
7.71E-03
SIL2 7.41E-03
1.48E-02
SIL2
* Limited to SIL 2 by the architectural constraints. In this case, the instrument has a PFD consistent with SIL 2 for a proof test interval of 12 months. SIL 3 is achieved by some combinations but it can be seen from Tables 6-9 that the SFF for this mode of operation is also in the range 60%-90% and so the architecture limits the SIL which can be achieved to SIL 2.
5.
CONCLUSIONS FMEA studies have been performed for the BD120 dual level trip amplifier when used in the trip on high input mode and when used in the trip on low input mode. The versions with and without the header have both been analysed. This has predicted the rate of failure of the instrument, the dangerous undetected failure rate and Safe Failure Fraction. From these parameters, the Probability of Failure on Demand, and the Safety Integrity Level (SIL) has been determined. It is concluded that the BD120 achieves SIL 2 with a proof test interval of 1 year or less, except when the instrument with the header is used in the trip on low input mode. In this case only SIL 1 is achieved, a 9 month or less proof test interval being required to achieve SIL 2. Note that is has been assumed that the instrument is configured to de-energise the output relays when the trip condition occurs, i.e. fails safe on loss of power.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
6.
REFERENCES
1. 2.
BS EN 61508, Functional safety of electrical/electronic/programmable electronic safetyrelated systems, Parts 1 & 2, 2002. Military Handbook: Reliability Prediction of Electronic Equipment, MIL-HDBK-217F, US Department of Defence, December 1991.
Circuit Diagrams
3. 4. 5. Drg No 9074, SM BD120 Circuit Diagram, Issue A Drg No 9075RSRS22 BD120 Circuit Diagram Circuit Diagram, Issue A Drg No 6594/RT1, Alphamini Thermocouple Type R Inputs, Issue 4.
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
Table 1: Component Failure Rate Calculation and FMEA for Block A (Trip on High Level)
Component Component Type Reference Component Size/Rating g Q EQUIP (/10 EQUIP (/y) hours)
6
Failure Mode
Effect
Failure Class
C09
Capacitor, plastic
1nf
8.40E-03 10
8.40E-02
7.36E-04
Little or no effect
Effect uncertain. Assume Spurious trip 50% spurious trip Effect uncertain. Assume Fails to trip on 50% fail to trip high input Little or no IC1 switches faster and effect
C10
Capacitor, plastic
10nf
8.40E-03 10
8.40E-02
7.36E-04
2.82% o/c
may "ring". Probably little effect s/c IC1 has low gain. O/P voltage = setpoint. TR1 can't turn on. C13 Capacitor, electrolyic s/c D01 Diode, switching 7.50E-03 8 6.00E-02 5.26E-04 2.02% o/c 10uf 1.90E-02 10 1.90E-01 1.66E-03 6.38% o/c Faster response but unclean switching near threshold. TR1 turns off Protects TR1 against voltage spikes on collector. Assume TR1 fails 50% s/c c/e Spurious trip Fails to trip on high input 50.0% 8.32E-04 25.0% 1.31E-04 Little or no effect 50.0% 8.32E-04 Spurious trip 50.0% 3.68E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
10
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
o/c
Protects TR1 against voltage spikes on collector. Assume TR1 fails 50% o/c c/e
Spurious trip
Spurious trip
Green LED fails to light in Little or no effect Little or no effect Fails to trip on high input
LED fails untripped condition Red LED Red LED fails to operate fails IC01 MC33171D Operational amplifier o/p low R03 Resistor 100k 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c o/p of IC1 goes low. 2.40E-02 10 2.40E-01 2.10E-03 8.06% o/p high on trip. o/p of IC1 stays high.
Spurious trip
TR2 can't turn off. Loss of Little or no hysteresis. Red LED permanently on. effect
s/c
TR2 can't turn on. Loss of Little or no hysteresis. Red LED fails effect to operate on trip.
20.0% 2.80E-04
R04
Resistor
100k
1.60E-02 10
1.60E-01
1.40E-03
5.37% o/c
TR2 can't turn on. Loss of Little or no hysteresis. Red LED fails effect to operate on trip.
80.0% 1.12E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
11
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
s/c
TR2 can't turn off. Loss of Little or no hysteresis. Red LED permanently on. effect Little or no Fails to trip on high input Little or no effect Spurious trip Spurious trip Little or no Spurious trip Little or no effect Little or no effect Spurious trip
R05
Resistor
100k
1.60E-02 10
1.60E-01
1.40E-03
Loss of hysteresis - poor TR1 permanently on. TR1 slow to turn off. TR1 turns off TR1 turns off Loss of hysteresis - poor TR1 turns off Reduced response time. Little effect. Increased gain and IC1 acts as integrator. Slow recovery from trip.
80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03
R06
Resistor
5k1
1.60E-02 10
1.60E-01
1.40E-03
R07
Resistor
5k1
1.60E-02 10
1.60E-01
1.40E-03
switching near threshold. effect R08 Resistor 5k1 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c s/c R09 Resistor 10M 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c
s/c
IC1 has low gain. O/P voltage = setpoint. TR1 can't turn on.
20.0% 2.80E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
12
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
Percentage Frequency for Mode for Mode (/y) 80.0% 1.12E-03 20.0% 2.80E-04
R10
Resistor
5K1
1.60E-02 10
1.60E-01
1.40E-03
Spurious trip
Slight changes in setpoint Little or no with temperature. No significant effect. effect Fails to trip on high input
R11
Resistor
5K1
1.60E-02 10
1.60E-01
1.40E-03
Slight changes in setpoint Little or no with temperature. No significant effect. effect Little or no effect Little or no effect Little or no effect Little or no effect Spurious trip Spurious trip
R23
Resistor
7k5
1.60E-02 10
1.60E-01
1.40E-03
Red LED brightness reduced. Red LED brightness increased. Red LED brightness reduced. Red LED brightness increased. 15V supply to op amp fails. TR1 turns off. ZD1 takes high current. Fuse blows. Relay deenergises
80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03 20.0% 2.80E-04 80.0% 1.12E-03 20.0% 2.80E-04
R24
Resistor
10k
1.60E-02 10
1.60E-01
1.40E-03
R27
Resistor
1k
1.60E-02 10
1.60E-01
1.40E-03
RLY01-a
Relay
1.20E-02 10
1.20E-01
1.05E-03
Relay de-energised
Spurious trip
25.0% 2.63E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
13
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
n/o contact 1 s/c n/o o/c n/c contact 1 s/c n/c o/c n/o contact 2 s/c n/o o/c n/c contact 2 s/c n/c o/c
No effect as in parallel
9.4% 9.86E-05
9.4% 9.86E-05
No effect as in parallel
9.4% 9.86E-05
9.4% 9.86E-05
No effect as in parallel
9.4% 9.86E-05
9.4% 9.86E-05
No effect as in parallel
Little or no effect
9.4% 9.86E-05
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
14
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
Percentage Frequency for Mode for Mode (/y) 10.0% 8.76E-05 10.0% 8.76E-05 80.0% 7.01E-04 10.0% 8.76E-05 10.0% 8.76E-05 80.0% 7.01E-04 50.0% 3.85E-05 50.0% 3.85E-05 50.0% 3.85E-05
RV03
Wirewound potentiometer
10k
1.00E-02 10
1.00E-01
8.76E-04
Trips at lower level Trips at higher level Fails to trip on high input Trips at higher level Trips at higher level Little or no effect Spurious trip Fails to trip on high input Little or no effect Little or no effect
o/c slider o/p of IC1 goes high. RV04 Wirewound potentiometer o/c bot 10k 1.00E-02 10 1.00E-01 8.76E-04 3.36% o/c top Reference voltage increases Reference voltage increases. o/c slider No effect on this channel TR01 Transistor 1.10E-03 8 8.80E-03 7.71E-05 0.30% o/c c-e s/c c-e TR02 Transistor 1.10E-03 8 8.80E-03 7.71E-05 0.30% o/c c-e Relay de-energises Relay can't de-energise Loss of hysterisis. Red LED fails to operate on trip. s/c c-e Loss of hysteresis. Red LED permanently on
50.0% 3.85E-05
2.56E-02 100.00%
2.56E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
15
30 November 2006
Component Size/Rating
Failure Mode
Effect
Failure Class
TOTALS Fails to trip on 3.70E-03 high input Trips at higher 2.63E-04 level Spurious trip Trips at lower level Little or no effect 1.28E-02 1.28E-02 1.44E-03 8.46E-03 8.76E-05 8.65E-03 8.76E-05 8.46E-03 8.46E-03 2.63E-04 3.51E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
16
30 November 2006
Table 2 Component Failure Rate Calculation and FMEA for Block A (Trip on Low Level)
Component Component Component Reference Type Size/Rating EQUIP g Q (/10
6
EQUIP (/y)
Failure Mode
Facilities Affected Effect Failure Class n/o relay contact n/c relay contact
hours)
C09
Capacitor, plastic
1nf
8.40E-03 10
8.40E-02 7.36E-04
Probably little effect Effect uncertain. Assume 50% spurious trip Effect uncertain. Assume 50% fail to trip IC1 switches faster and may "ring". Probably little effect
Little or no effect Spurious trip Fails to trip on low input Little or no effect
C10
Capacitor, plastic
10nf
8.40E-03 10
8.40E-02 7.36E-04
2.82% o/c
s/c
IC1 has low gain. O/P voltage = setpoint. TR1 can't turn on.
50.0%
3.68E-04
C13
Capacitor, electrolyic
10uf
1.90E-02 10
1.90E-01 1.66E-03
6.38% o/c
50.0%
8.32E-04
TR1 turns off Protects TR1 against voltage spikes on collector. Assume TR1 fails 50% s/c c/e
50.0% 25.0%
8.32E-04 1.31E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
17
30 November 2006
EQUIP g Q (/10
6
EQUIP (/y)
Facilities Affected Effect Failure Class n/o relay contact Protects TR1 against Assume TR1 fails 50% o/c c/e Fails to trip on low voltage spikes on collector. input n/c relay contact
hours)
s/c LE1 LED, dual 2.30E-04 8 1.84E-03 1.61E-05 0.06% Green Red IC01 MC33171D Operational amplifier o/p low R03 Resistor 100k 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c s/c R04 Resistor 100k 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c s/c R05 Resistor 100k 1.60E-02 10 1.60E-01 1.40E-03 5.37% o/c 2.40E-02 10 2.40E-01 2.10E-03
Relay RLY1-a deenergised Green LED fails to light in Red LED fails to operate
LED fails untripped condition LED fails on trip. 8.06% o/p high o/p of IC1 high.
o/p of IC1 low. TR2 can't turn off. TR2 can't turn on. TR2 can't turn on. TR2 can't turn off. Loss of hysteresis - poor switching near threshold.
Fails to trip on low input Fails to trip on low input Spurious trip Spurious trip Fails to trip on low input Little or no effect
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
18
30 November 2006
EQUIP g Q (/10
6
EQUIP (/y)
Facilities Affected Effect Failure Class n/o relay contact TR1 permanently on. TR1 slow to turn off. TR1 turns off TR1 turns off Loss of hysteresis - poor switching near threshold. TR1 turns off Reduced response time. Little effect. Increased gain and IC1 Little or no effect acts as integrator. Slow recovery from trip. IC1 has low gain. O/P Fails to trip on low input Fails to trip on low input Little or no effect Fails to trip on low input Little or no effect Spurious trip Little or no effect Fails to trip on low input Fails to trip on low input Little or no effect n/c relay contact
Percentage for Mode 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0%
Frequency for Mode (/y) 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04
hours)
R06
Resistor
5k1
1.60E-02 10
1.60E-01 1.40E-03
R07
Resistor
5k1
1.60E-02 10
1.60E-01 1.40E-03
5.37%
o/c s/c
R08
Resistor
5k1
1.60E-02 10
1.60E-01 1.40E-03
5.37%
o/c s/c
1.60E-01 1.40E-03
5.37% o/c
80.0%
1.12E-03
20.0%
2.80E-04
R10
Resistor
5K1
o/c
80.0%
1.12E-03
s/c
20.0%
2.80E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
19
30 November 2006
EQUIP g Q (/10
6
EQUIP (/y)
Facilities Affected Effect Failure Class n/o relay contact o/p of IC1 stays high. Slight changes in setpoint Spurious trip Little or no effect n/c relay contact
with temperature. No significant effect. Red LED brightness reduced. Red LED brightness increased. Red LED brightness reduced. Red LED brightness increased. 15V supply to op amp fails. Fails to trip on low TR1 turns off. ZD1 takes high current. Fuse blows. Relay deenergises o/c Relay de-energised Contact can't open Spurious trip Fails to trip on low input No effect as in parallel with Little or no effect n/o contact 2 input Spurious trip Little or no effect Little or no effect Little or no effect Little or no effect
20.0%
2.80E-04
R23
Resistor
7k5
o/c s/c
R24
Resistor
10k
1.60E-02 10
1.60E-01 1.40E-03
5.37%
o/c s/c
R27
Resistor
1k
1.60E-02 10
1.60E-01 1.40E-03
5.37%
o/c
s/c RLY01-a Relay 1.20E-02 10 1.20E-01 1.05E-03 4.03% Coil or s/c n/o contact 1 s/c n/o contact
2.80E-04
2.63E-04
9.86E-05 9.4%
9.86E-05
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
20
30 November 2006
EQUIP g Q (/10
6
EQUIP (/y)
Failure Mode 1 o/c n/c contact 1 s/c n/c contact 1 o/c n/o contact 2 s/c n/o contact 2 o/c n/c contact 2 s/c n/c contact 2 o/c
Facilities Affected Effect Failure Class n/o relay contact n/c relay contact
hours)
Spurious trip
9.4% 9.86E-05
No effect as in parallel with Little or no effect n/c contact 2 Contact can't open Fails to trip on low input No effect as in parallel with Little or no effect n/o contact 1 Contact can't open. Spurious trip
No effect as in parallel with Little or no effect n/c contact 1 Trips at lower level
9.4% 9.86E-05
RV03
1.00E-02 10
1.00E-01 8.76E-04
8.76E-05
o/c bot
10.0%
8.76E-05
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
21
30 November 2006
EQUIP g Q (/10
6
EQUIP (/y)
Failure Mode
Facilities Affected Effect Failure Class n/o relay contact n/c relay contact
hours)
o/c slider o/p of IC1 goes high. RV04 Wirewound 10k potentiomet er o/c bot Reference voltage increases. o/c slider No effect on this channel TR01 Transistor 1.10E-03 8 8.80E-03 7.71E-05 0.30% o/c c-e s/c c-e TR02 Transistor 1.10E-03 8 8.80E-03 7.71E-05 0.30% o/c c-e s/c c-e Relay de-energises Relay can't de-energise Loss of hysterisis. Red LED fails to operate on trip. Loss of hysteresis. Red LED permanently on 1.00E-02 10 1.00E-01 8.76E-04 3.36% o/c top Reference voltage increases.
Spurious trip Trips at higher level Trips at higher level Little or no effect Spurious trip Fails to trip on low input Little or no effect Little or no effect
10.0%
8.76E-05
2.56E-02 100.00%
2.56E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
22
30 November 2006
TOTALS
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect 8.76E-05 5.72E-03 2.63E-04 1.00E-02 8.76E-05 5.91E-03 2.63E-04 1.00E-02 0.00E+00 0.00E+00 5.01E-03 3.61E-03 9.25E-03 9.05E-03 0.00E+00 0.00E+00
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
23
30 November 2006
EQUIP (/y)
Failure Mode
Effect
Failure Class
C14
Capacitor, electrolyic
100uf
1.90E-02 10
1.90E-01 1.66E-03
Large ripple on power rails. Threshold Large ripple on output drops to low value. Fuse blows. No output. Zero output voltage
50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 100.0%
8.32E-04 8.32E-04 8.67E-04 8.67E-04 8.67E-04 8.67E-04 8.67E-04 8.67E-04 8.67E-04 8.67E-04 1.75E-04
D3
Diode
Power rectifier
2.20E-02
1.98E-01 1.73E-03
Half wave rectifies. Increase in ripple Little or no effect but probably little effect. Fuse blows. No output. Zero output voltage
D4
Diode
Power rectifier
2.20E-02
1.98E-01 1.73E-03
Half wave rectifies. Increase in ripple Little or no effect but probably little effect. Fuse blows. No output. Zero output voltage
D5
Diode
Power rectifier
2.20E-02
1.98E-01 1.73E-03
Half wave rectifies. Increase in ripple Little or no effect but probably little effect. Fuse blows. No output. Zero output voltage
D6
Diode
Power rectifier
2.20E-02
1.98E-01 1.73E-03
Half wave rectifies. Increase in ripple Little or no effect but probably little effect. Fuse blows. No output. No power output Zero output voltage Zero output voltage
F1
Fuse
2.00E-02
2.00E-02 1.75E-04
0.96% o/c
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
24
30 November 2006
Component Type
Component Size/Rating
EQUIP (/y)
Failure Mode 0.01% o/c 51.87% any No power output No power output
Effect
Failure Class
Reflow solder
1.40E-04 3.60E-01
1 3
100.0% 100.0%
1.82E-02 100.00%
1.82E-02
TOTALS Zero output voltage Large ripple on output Little or no effect 1.39E-02 8.32E-04 3.47E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
25
30 November 2006
EQUIP (/y)
Failure Mode
Effect
Failure Class
C01
Capacitor, plastic
10nF
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c s/c
Possible noise on the output. significant effect on trip function No output signal. Possible noise on the output. significant effect on trip function No output signal. Possible noise on the output. significant effect on trip function No output signal. Possible noise on the output. significant effect on trip function No output signal. Probably little effect Reference voltage drops to zero. output. function
No Little or no effect Output zero No Little or no effect Output zero No Little or no effect Output zero No Little or no effect Output zero Little or no effect Reference zero
50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0% 50.0%
3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04 3.68E-04
C02
Capacitor, plastic
10nf
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c s/c
C03
Capacitor, plastic
1nf
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c s/c
C04
Capacitor, plastic
1nf
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c s/c
C05
Capacitor, plastic
0.1uf
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c s/c
C08
Capacitor, plastic
0.1uf
8.40E-03 10
8.40E-02
7.36E-04
2.05%
o/c
Possible common mode noise on the Little or no effect No significant effect on trip not floating. Increased Little or no effect
s/c
Input
50.0%
3.68E-04
susceptibility to common mode noise. No significant effect. C11 Capacitor, plastic 0.1uf 8.40E-03 10 8.40E-02 7.36E-04 2.05% o/c Probably little effect Little or no effect 50.0% 3.68E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
26
30 November 2006
Component Reference
Component Type
Component Size/Rating
EQUIP (/y)
Effect
Failure Class
Frequency for Mode (/y) 3.68E-04 3.68E-04 3.68E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03 2.80E-04 1.12E-03
15V supply to Blocks A fails. Possible noise on the output. significant effect on trip function No output signal. Output voltage increases Output voltage permanently zero Output voltage permanently zero significant
+15VSupply to Block A fails No Little or no effect Output zero Output too high Output zero Output zero
50.0% 50.0% 50.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0% 20.0% 80.0%
H1-C01
Capacitor, plastic
0.1uf
8.40E-03 10
8.40E-02
7.36E-04 2.05%
o/c s/c
H1 - R01
Resistor
13K
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R02
Resistor
110R
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
Small increase in output voltage but not Little or no effect Very low gain. Output near zero. No significant effect No significant effect Output voltage permanently zero No significant effect Output voltage permanently high Output voltage permanently zero Output voltage high Output voltage high Output voltage permanently zero H1-R9 forces output to maximum Output voltage high unless coincident fault. Output zero Little or no effect Little or no effect Output zero Little or no effect Output too high Output zero Output too high Output too high Output zero Output too high Output too high
H1 - R03
Resistor
110R
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R04
Resistor
SOT
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R05
Resistor
SOT
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R06
Resistor
30R
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R07
Resistor
8K2
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R08
Resistor
8K2
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
H1 - R09
Resistor
6M8
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
27
30 November 2006
Component Reference
Component Type
Component Size/Rating
EQUIP (/y)
Effect
Failure Class
H1 - R10 H1 - RV01
Not fitted 10K 2.00E-02 10 2.00E-01 1.75E-03 4.87% o/c top o/c bot o/c slider
Not fitted. Assumed upscale drive on t/c Little or no effect Output voltage permanently zero Output voltage permanently high Output voltage permanently high Output zero Output too high Output too high
IC03
ZRB500 reference
voltage 5V
2.40E-02 10
2.40E-01
2.10E-03 5.85%
o/c
Common mode voltage may exceed Little or no effect allowable limits. failure. Unlikely to cause Increased Little or no effect
s/c
Input
not
floating.
50.0%
1.05E-03
susceptibility to common mode noise. No significant effect. IC04 Operational amplifier o/p low IC05 ZRB500 reference s/c o/p high o/p low R01 Resistor 30k 1.60E-02 10 1.60E-01 1.40E-03 3.90% o/c s/c R28 Resistor 13k 1.60E-02 10 1.60E-01 1.40E-03 3.90% o/c Reference voltage drops to zero Reference voltage increases. Reference voltage decreases. Increased output voltage No output signal. Reference voltage drops to zero Reference zero Reference too high Reference too low Output too high Output zero Reference zero 25.0% 25.0% 25.0% 80.0% 20.0% 80.0% 5.26E-04 5.26E-04 5.26E-04 1.12E-03 2.80E-04 1.12E-03 voltage 5V 2.40E-02 10 2.40E-01 2.10E-03 5.85% o/c Output zero Reference voltage rail increases to 15V Output zero Reference too high 50.0% 25.0% 1.05E-03 5.26E-04 OP07 2.40E-02 10 2.40E-01 2.10E-03 5.85% o/p high Output too high Output too high 50.0% 1.05E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
28
30 November 2006
Component Reference
Component Type
Component Size/Rating
EQUIP (/y)
Effect
Failure Class
Reference voltage increases. Reference voltage drops to zero exceeded. If IC5 goes o/c reference
R02
Resistor
1k
1.60E-02 10
1.60E-01
1.40E-03 3.90%
o/c s/c
Absolute max forward current for IC5 Reference too high voltage rail increases to 15V
s/c
Absolute max forward current for IC5 Reference zero exceeded. If IC5 goes s/c reference Little or no effect Reference too high Reference too high Reference zero Little or no effect Reference too low voltage drops to zero
10.0%
1.40E-04
RV01
Cermet trimmer
2k
2.00E-02 10
2.00E-01
1.75E-03 4.87%
No effect Reference voltage increases to 15V Reference voltage increases. Reference voltage drops to zero No effect Reference voltage decreases.
RV02
Cermet trimmer
10k
2.00E-02 10
2.00E-01
1.75E-03 4.87%
ZD01
Zener diode
15V
2.40E-02
1.92E-01
1.68E-03 4.68%
o/c s/c
15V supply to Blocks A increases to 30V +15VSupply to Block A approx. 15V supply to Blocks A fails. too high +15VSupply to Block A fails
3.60E-02 100.00%
3.60E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
29
30 November 2006
TOTALS Output too high Output zero Reference too high Reference too low Reference zero +15VSupply to Block A too high +15VSupply to Block A fails Little or no effect Total 9.69E-03 3.60E-02 1.21E-03 8.23E-03 7.55E-03 3.05E-03 1.93E-03 3.45E-03 8.41E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
30
30 November 2006
EQUIP (/y)
Failure Mode
Effect
Failure Class
C01 C02
1.40E-04
1.40E-04 8.40E-02
1.23E-06 7.36E-04
Two input connectors in parallel. No effect Possible noise on the output. No significant effect on trip function No output signal. No output signal. Probably little effect Reference voltage drops to zero. Possible common mode noise on the output. No significant effect on trip function
Little or no effect Little or no effect Output zero Output zero Little or no effect Reference zero Little or no effect
8.40E-03 10
C03 C05
1.40E-04
1.40E-04 8.40E-02
1.23E-06 7.36E-04
8.40E-03 10
C08
Capacitor, plastic
0.1uf
8.40E-03 10
8.40E-02
7.36E-04
4.45% o/c
s/c
Input not floating. Increased susceptibility to common mode noise. No significant effect.
Little or no effect
50.0%
3.68E-04
C11
Capacitor, plastic
0.1uf
8.40E-03 10
8.40E-02
7.36E-04
Probably little effect 15V supply to Blocks A fails. Common mode voltage may exceed allowable limits. Unlikely to cause failure.
IC03
5V
2.40E-02 10
2.40E-01
2.10E-03
12.71% o/c
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
31
30 November 2006
Component Reference
Component Type
Component Size/Rating
EQUIP (/y)
Effect
Failure Class
Input not floating. Increased susceptibility to common mode noise. No significant effect.
Little or no effect
50.0%
IC05
5V
2.40E-02 10
2.40E-01
2.10E-03
Reference voltage rail increases to Reference too high 15V Reference voltage drops to zero Reference voltage increases. Reference voltage decreases. No output signal. Reference voltage drops to zero Absolute max forward current for IC5 exceeded. If IC5 goes o/c reference voltage rail increases to 15V Reference zero Reference too high Reference too low Output zero Reference zero Reference too high
R01 R02
Link Resistor
Reflow solder 1k
1.40E-04
1.40E-04 1.60E-01
1.23E-06 1.40E-03
1.60E-02 10
s/c
Absolute max forward current for IC5 exceeded. If IC5 goes s/c reference voltage drops to zero
Reference zero
10.0%
1.40E-04
R28
Resistor
13k
1.60E-02 10
1.60E-01
1.40E-03
Reference voltage drops to zero Reference voltage increases. Increased output voltage No output signal. No output signal. No effect Reference voltage increases to 15V
Reference zero Reference too high Output too high Output zero Output zero Little or no effect Reference too high
R29
Resistor
62R
1.60E-02 10
1.60E-01
1.40E-03
R30 RV01
Reflow solder 2k
1.40E-04
1.40E-04 2.00E-01
1.23E-06 1.75E-03
2.00E-02 10
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
32
30 November 2006
Component Reference
Component Type
Component Size/Rating
EQUIP (/y)
Failure Mode
Effect
Failure Class
Percentage Frequency for Mode for Mode (/y) 1.40E-03 1.75E-04 1.75E-04 1.40E-03 8.41E-04 8.41E-04
o/c slider Reference voltage increases. RV02 Cermet trimmer 10k 2.00E-02 10 2.00E-01 1.75E-03 10.59% o/c top o/c bot Reference voltage drops to zero No effect
Reference too high Reference zero Little or no effect Reference too low +15VSupply to Block A too high +15VSupply to Block A fails
o/c slider Reference voltage decreases. ZD01 Zener diode 15V 2.40E-02 8 1.92E-01 1.68E-03 10.17% o/c s/c 15V supply to Blocks A increases to 30V approx. 15V supply to Blocks A fails.
1.65E-02 100.00%
1.65E-02
TOTALS Output too high Output zero Reference too high Reference too low Reference zero +15VSupply to Block A too high +15VSupply to Block A fails Little or no effect Total 4.29E-03 1.65E-02 1.21E-03 1.12E-03 6.52E-04 3.05E-03 1.93E-03 3.45E-03 8.41E-04
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
33
30 November 2006
Block A1
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
2.47E-02
Block A2
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
2.47E-02
Block B
1.39E-02
1.39E-02
1.39E-02
1.39E-02
1.39E-02
1.39E-02
1.39E-02
1.39E-02
1.82E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
34
30 November 2006
Component Reference
Failure Mode
Effect
Failure Class Output 1 n/o relay contact n/c relay contact 8.32E-04
Outputs Affected Output 2 n/o relay contact 8.32E-04 n/c relay contact 8.32E-04 contact 8.32E-04 Both n/o relay n/c relay contact 8.32E-04
Total Frequency
Effect uncertain but will tend to Spurious trip reduce trip threshold and/or de-energise relay therefore spurious trip likely.
8.32E-04
8.32E-04
8.32E-04
Little or no effect
Little or no effect
Little or no effect
3.47E-03
3.47E-03
3.47E-03
3.47E-03
3.47E-03
3.47E-03
Block E
Output too high Output zero Reference too high Reference too low Reference zero
Tends to trip too early Fails to trip at all Trips at too high level Trips at too low level Trips at any input
Trips at lower level Fails to trip on high input Trips at higher level Trips at lower level Spurious trip Little or no effect
1.65E-02
+15VSupply to Block A Output of comparator low. fails Little or no effect Spurious trip Little or no effect
Spurious trip
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
Little or no effect
4.29E-03
4.29E-03
4.29E-03
4.29E-03
4.29E-03
4.29E-03
8.69E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
35
30 November 2006
Component Reference
Failure Mode
Effect
Failure Class Output 1 n/o relay contact TOTALS Fails to trip on high input 4.36E-03 Trips at higher level du Spurious trip Trips at lower level Little or no effect s ltotal SFF 3.31E-03 7.67E-03 2.79E-02 3.14E-03 2.15E-02 5.25E-02 6.01E-02 87.3% 4.16E-03 3.31E-03 7.47E-03 2.81E-02 3.14E-03 2.15E-02 5.27E-02 6.01E-02 87.6% n/c relay contact
Outputs Affected Output 2 n/o relay contact n/c relay contact contact Both n/o relay n/c relay contact
Total Frequency
6.52E-04 3.05E-03 3.70E-03 1.94E-02 3.05E-03 8.60E-03 3.11E-02 3.48E-02 89.4% 2.88E-03 3.63E-02 3.63E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
36
30 November 2006
Block A1
Fails to trip on high input Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect Trips at higher level Spurious trip Trips at lower level Little or no effect
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
2.47E-02
Block A2
Fails to trip on high input Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect Trips at higher level Spurious trip Trips at lower level Little or no effect
Fails to trip on high input Trips at higher level Spurious trip Trips at lower level Little or no effect
2.47E-02
Block B
Relay de-energises. Spurious trip. Spurious trip Effect uncertain but will tend to reduce trip threshold and/or deenergise relay therefore spurious trip likely. Spurious trip
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.82E-02
Little or no effect
Little or no effect
Little or no effect
3.47E-03
3.47E-03
3.47E-03
3.47E-03
3.47E-03
3.47E-03
3.60E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
37
30 November 2006
Component Reference
Failure Mode
Effect
Outputs Affected Output 2 n/o relay contact n/c relay contact contact Both n/o relay n/c relay contact
Total
Block D
Output too high Output zero Reference too high Reference too low Reference zero
Tends to trip too early Fails to trip at all Trips at too high level Trips at too low level Trips at any input
Trips at lower level Fails to trip on high input Trips at higher level Trips at lower level Spurious trip Little or no effect
+15VSupply to Block A Output of comparator low. fails Little or no effect Spurious trip Little or no effect
Spurious trip
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
1.21E-03
Little or no effect
9.69E-03
9.69E-03
9.69E-03
9.69E-03
9.69E-03
9.69E-03
1.06E-01
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
38
30 November 2006
Component Reference
Failure Mode
Effect
Failure Class Output 1 n/o relay contact TOTALS Fails to trip on high input Trips at higher level ldu Spurious trip Trips at lower level Little or no effect s total SFF 1.13E-02 3.31E-03 1.46E-02 2.79E-02 1.02E-02 2.68E-02 6.50E-02 7.96E-02 81.7% 1.11E-02 3.31E-03 1.44E-02 2.81E-02 1.02E-02 2.68E-02 6.52E-02 7.96E-02 81.9% n/c relay contact
Outputs Affected Output 2 n/o relay contact n/c relay contact contact Both n/o relay n/c relay contact
Total
7.55E-03 3.05E-03 1.06E-02 1.94E-02 1.02E-02 1.40E-02 4.36E-02 5.42E-02 80.4% 2.88E-03 3.63E-02 3.63E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
39
30 November 2006
Block A1
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
2.47E-02
Block A2
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
2.47E-02
Block B
Relay de-energises. Spurious trip. Effect uncertain but will tend to reduce trip threshold and/or deenergise relay therefore spurious trip likely.
1.39E-02 8.32E-04
1.82E-02
Little or no effect
Little or no effect
Little or no effect
3.47E-03 3.47E-03
3.47E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
40
30 November 2006
Component Reference
Outputs Affected Failure Mode Effect Failure Class Output 1 Output 2 Both
Total Frequency
Block E
Output too high Output zero Reference too high Reference too low Reference zero
Tends to trip too late Spurious trip Trips at too high level Trips at too low level Never trips
Trips at lower level Spurious trip Trips at higher level Trips at lower level Fails to trip on low input
1.12E-03 1.12E-03 6.52E-04 6.52E-04 3.05E-03 3.05E-03 1.93E-03 1.93E-03 3.45E-03 3.45E-03 8.41E-04 8.41E-04
1.12E-03 1.12E-03 1.12E-03 6.52E-04 6.52E-04 6.52E-04 3.05E-03 3.05E-03 3.05E-03 1.93E-03 1.93E-03 1.93E-03 3.45E-03 3.45E-03 3.45E-03 8.41E-04 8.41E-04 8.41E-04 3.45E-03 3.45E-03 6.52E-04 6.52E-04
1.65E-02
+15VSupply to Block A No absolute max ratings exceeded. Little or no effect too high +15VSupply to Block A Output of comparator low. No trip fails Little or no effect Little or no effect Little or no effect Fails to trip on low input
1.21E-03 1.21E-03
1.21E-03
4.29E-03 4.29E-03
4.29E-03
8.69E-02
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
41
30 November 2006
Component Reference
Outputs Affected Failure Mode Effect Failure Class Output 1 TOTALS Fails to trip on low input Trips at lower level du Spurious trip Trips at higher level Little or no effect s total SFF 1.39E-02 1.37E-02 3.14E-03 3.14E-03 1.70E-02 1.68E-02 2.11E-02 2.13E-02 3.31E-03 3.31E-03 1.86E-02 1.86E-02 4.31E-02 4.33E-02 6.01E-02 6.01E-02 71.7% 72.0% 1.39E-02 3.14E-03 1.70E-02 2.11E-02 3.31E-03 1.86E-02 4.31E-02 6.01E-02 71.7% 1.37E-02 4.66E-03 4.66E-03 3.14E-03 3.05E-03 3.05E-03 1.68E-02 7.71E-03 7.71E-03 2.13E-02 1.54E-02 1.54E-02 3.31E-03 3.05E-03 3.05E-03 1.86E-02 8.60E-03 8.60E-03 4.33E-02 2.71E-02 2.71E-02 6.01E-02 3.48E-02 3.48E-02 72.0% 77.8% 77.8% Output 2 Both
Total Frequency
3.45E-03 3.45E-03
2.55E-02 2.26E-02
7.71E-05
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
42
30 November 2006
Block A1
Fails to trip on low Fails to trip on low input input Trips at lower level Spurious trip Trips at higher level Little or no effect Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
2.47E-02
Block A2
Fails to trip on low Fails to trip on low input input Trips at lower level Spurious trip Trips at higher level Little or no effect Trips at lower level Spurious trip Trips at higher level Little or no effect
Fails to trip on low input Trips at lower level Spurious trip Trips at higher level Little or no effect
2.47E-02
Block B
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.39E-02 8.32E-04
1.82E-02
Large ripple on output Effect uncertain but will tend to reduce trip threshold and/or deenergise relay therefore
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
43
30 November 2006
Component Reference
Failure Mode
Effect
Outputs Affected Output 2 n/o relay contact n/c relay contact Both n/o relay contact n/c relay contact
Total Frequency
Little or no effect
Little or no effect
Little or no effect
3.47E-03
3.47E-03
3.47E-03
3.47E-03 3.47E-03
3.47E-03
Block D
Output too high Output zero Reference too high Reference too low Reference zero
Tends to trip too late Spurious trip Trips at too high level Trips at too low level Never trips
Trips at lower level Spurious trip Trips at higher level Trips at lower level Fails to trip on low input Little or no effect
8.23E-03 8.23E-03 7.55E-03 7.55E-03 3.05E-03 3.05E-03 1.93E-03 1.93E-03 3.45E-03 3.45E-03 8.41E-04 8.41E-04
8.23E-03 7.55E-03 3.05E-03 1.93E-03 3.45E-03 8.41E-04 3.45E-03 3.45E-03 7.55E-03 7.55E-03
3.60E-02
+15VSupply to Block Output of comparator low. Fails to trip on low input A fails Little or no effect No trip Little or no effect Little or no effect
1.21E-03
1.21E-03
1.21E-03
1.21E-03 1.21E-03
1.21E-03
9.69E-03
9.69E-03
9.69E-03
9.69E-03 9.69E-03
9.69E-03
1.06E-01
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
44
30 November 2006
Component Reference
Failure Mode
Effect
Failure Class Output 1 n/o relay contact TOTALS Fails to trip on low input Trips at lower level du Spurious trip Trips at higher level Little or no effect s total SFF 1.39E-02 1.02E-02 2.42E-02 2.80E-02 3.31E-03 2.40E-02 5.54E-02 7.96E-02 69.6% 1.39E-02 1.37E-02 1.02E-02 2.40E-02 2.82E-02 3.31E-03 2.40E-02 5.56E-02 7.96E-02 69.9% 1.37E-02 n/c relay contact
Outputs Affected Output 2 n/o relay contact n/c relay contact Both n/o relay contact n/c relay contact
Total Frequency
1.39E-02 1.02E-02 2.42E-02 2.80E-02 3.31E-03 2.40E-02 5.54E-02 7.96E-02 69.6% 1.39E-02
1.37E-02 4.66E-03 1.02E-02 1.02E-02 2.40E-02 1.48E-02 2.82E-02 2.23E-02 3.31E-03 3.05E-03 2.40E-02 1.40E-02 5.56E-02 3.94E-02 7.96E-02 5.42E-02 69.9% 72.6%
4.66E-03 1.02E-02 1.48E-02 2.23E-02 3.05E-03 1.40E-02 3.94E-02 5.42E-02 72.6% 4.66E-03
3.45E-03
3.45E-03
3.24E-02
2.95E-02
7.71E-05
1.37E-02 4.66E-03
3.45E-03
3.45E-03
( H:\Product Information\FMEDA Reports\BD Series Reports\PDF Files\FMEA and SIL Assessment Reports\Assessments with Datasheets Added\BD120 R06-151(W)C With Datasheet.doc)
45
30 November 2006