Jitter-Wander Measurements Guide

Jitter and Wander Measurement Guide
Jitter and Wander It is essential that developers of sys- These requirements can be broken
Jitter and wander are essentially short tem components study and under- down into three categories:
and long term signal rate movements stand how NEs are likely to behave as
across networks. SONET/SDH are, by individual elements under ideal con- ± Jitter and wander at output inter-
definition, synchronous systems ditions. By so doing, requirements faces
which require phase stability in clock can be better defined in accordance ± Jitter and wander tolerance of input
and data signals throughout the net- with and incorporated into standards interfaces, and
work. Network elements (NE) are for system components such as ITU-T ± Jitter and wander transfer functions
subject to a number of interference recommendation G.783.
factors that can affect synchronisation Although precision test equipment
and transmission quality, resulting in The right test solution ± Acterna can provide immediate results on how
bit errors, slips and data loss. Jitter ANT-20 Advanced Network Tester specific components measure up to
and wander measurements are In the fiercely competitive telecom- these requirements, various com-
deployed to quantify these errors and munications arena, technological and ponents require distinctly different
enable network operators to maintain economic excellence is crucial to com- instrument set-ups.
synchronicity within acceptable limits. mercial success.Acterna,with its firm
commitment to sustained leadership This guide is intended to provide sup-
International compatibility in all aspects of the communications port in setting up the Acterna ANT-20
To achieve international compatibility network life cycle, is dedicated to jitter test instrument.
at network interfaces, the ITU-T along helping customers rise to the market's
with other standardisation bodies, challenges in order to ensure
define maximum permissible limits economic value in their businesses.
for jitter and wander. These limits
apply to network interfaces in which With technologies developing rapidly
system components are incorporated the Acterna ANT-20 advanced network
into a complete network. Examples tester is designed to meet customers'
can be found in ITU-T Recommendati- future needs. This flexible platform
ons G.823, G.824 and G.825. enables customers to adapt to tech-
nological change and can accommo-
date the DSn, SONET, SDH and/or
ATM requirements, as well asnew-
standards, higher bit rates and the
intelligent system components of the
future.
Contents
1 Jitter measurement 3
Measuring jitter 3
Output jitter measurement,
instrument set up and application settings 3
Peak to peak jitter 4
RMS jitter 5
Phase hit measurement 7
Mapping jitter measurement 7
Combined (pointer) jitter measurement 9
Maximum tolerable jitter (MTJ) 13
Fast maximum tolerable jitter (FMTJ) 15
Jitter transfer function (JTF) 16
2 Wander Measurement 18
How to measure wander 18
Instrument setup 19
MTIE/TDEV offline wander analysis 20
Wander measurement of clock source 21
Wander generation and measurement
of device under test (DUT) 22
Wander measurement for synchronous
signals 22
Wander measurement for asynchronous
signals 22
Wander tolerance measurement 24
Pointer wander measurement 25
3 Jitter and wander test equipment 29
2
Jitter measurement
Measuring jitter Data Tx/Rx
To measure jitter effects, the incoming signal is regenerated electrical bal. 1.5 to 2 Mbps Rx [12], Tx [13]
to produce a virtually jitter-free signal for comparison electrical unbal. 1.5 to 155 Mbps Rx [14], Tx [15]
purposes (figure 1). No external reference clock source is electrical 622 Mpbs Rx [16]
electrical 2.5 Gbps Rx [43], Tx [46]
required for jitter measurement. The maximum measurable
electrical 10 Gbps Rx [114], Tx [104]
jitter frequency is a function of the bit rate that ranges at
optical 52, 155, 622 Mbps Rx [17], Tx [18]
up to 80 MHz. optical 2.5 Gbps Rx [44], Tx [47]
optical 10 Gbps Rx [113], Tx [103]
Table 1 Recommended interfaces dependent on signal under test
Tx
DUT
Instrument and application setup
Rx
Virtual instruments (VI) required
Jitter measurement
± Signal Structure
ANT-20
± O.172 Jitter Generator/Analyzer
Figure 1 Basic principle of jitter measurement
Step 1 Add the VIs required to the list of those used in the
The unit of jitter amplitude is measured in unit intervals Application Manager.
(UI). 1 UI corresponds to an error measuring one bit or one Step 2 Click on the ªJITº button (figure 3) in the Application
bit clock period. Test times on the order of minutes are Manager to open/activate the O.172 Jitter
necessary to accurately measure jitter. Generator/Analyzer window.
Output jitter measurement, instrument setup and Figure 3 Application manager

application settings
Output jitter (jitter generation) measurement is used to Measurement setting
determine the amount of jitter on a data signal. Here, the Step 1 In the Mode menu, select either PP+RMS or PP+PH
signal under test is connected to the receiver of the command for measuring jitter peak values and
Acterna ANT-20 Advanced Network Tester (figure 2). The rms values or number of phase hits. The O.172 Jitter
test duration is not defined according to specific standards Generator/Analyzer window will open (figure 4).
but is dependent on the application. In most cases how-
ever, a measurement time of 60 seconds is recommended.
The maximum Peak-to-Peak Jitter (UIpp) and RMS value
(UIrms) ± or the number of Phase Hits (PH) during the test
interval ± are the most important parameters. Table 1
shows the recommended interfaces for use dependent on
the signal under test.
Tx
Network
element
Rx
Jitter measurement
ANT-20
Tx
Network
Rx
Jitter measurement
ANT-20
Figure 4 O.172 Jitter Generator/Analyzer window showing output jitter
Figure 2 Output jitter measurement setup results screen
3
Step 2 In the Settings menu, select the General ... com- Important
mand (figure 5). ± Ensure the optical level lies between the ±10 and
±12 dBm range.
± Always use the lowest possible measurement range.
± Ensure the correct filter setting is being used.
± Allow a warm up time of at least 30 minutes.
Peak to Peak (UIpp) jitter

For this procedure, the signal under test is connected to
the receiver of the Acterna ANT-20 Advanced Network
Tester. A measurement time of 60 seconds is recom-
mended to produce an adequate output jitter result for the
data signal under test. During the test interval, peak-to-
peak jitter (UIpp) is the important parameter. The distance
Figure 5 O.172 jitter general settings dialog box
between the highest and lowest jitter value is therefore
refered to as as the jitter amplitude.
The root mean square (RMS) integration period can be set
to measure RMS values via the Rx section (an integration Interpretation of results
period of 1 second is sufficient in most cases). The average The test set determines the positive and negative values
function may be used to acquire a quieter, current display for a phase variation (leading and lagging edges) and the
of the peak-to-peak indication. The Hit Threshold amplitudes results updated continuously as Current Values. In addition
allow the tolerable +/± peak levels, beyond which the unit to this, the Maximum Values occurring during a measure-
detects phase hits, to be specified. ment interval are also recorded and displayed. Measured
values should not exceed those recommended under ITU,
Step 1 Start the measurement by pressing function ANSI, ETSI and Telcordia regarding requirements for net-
key F5 or clicking the green traffic signal icon in work interfaces and equipment. Figure 6 shows a tabular
the Application Manager. view of an output jitter result.
ITU-T G.783 Characteristics of SDH equipment functional blocks

ITU-T G.811 Timing characteristics of PRCs
ITU-T G.812 Timing requirements of SSU slave clocks
ITU-T G.813 Timing characteristics of SDH equipment slave clocks
(SEC)
ITU-T G.823 Jitter and wander within networks based on 2048 kbps
ITU-T G.825 Jitter and wander within networks based on the SDH
ANSI T1.105.03 SONET-Jitter at network interfaces
ANSI T1.102 Digital Hierarchy- Electrical interfaces
ANSI T1.101 Synchronization interface standards for digital networks
Telcordia GR-253 SONET transport systems common generic criteria
Telcordia GR-499 Transport systems generic requirements
ETSI EN 302 084 The control of jitter and wander in transport networks
ETSI EN 300 462-3-1 The control of jitter and wander within synchronization
networks
ETSI EN 300 462-5-1 Timing characteristics of slave clocks suitable for
operations in SDH
ETSI EN 300 462-6-1 Timing characteristics of primary reference clocks
synchronization supply to SDH and PDH equipment
synchronization supply to equipment in local node Figure 6 Tabular view of output jitter result
applications
Table 2 List of recommendations for jitter generation (output jitter)
measurements
4
The Jitter versus time screen provides a graphical display
of the measured jitter values and records the +/± peak,
peak-to-peak or RMS value of the jitter versus time
(figure 7). This presentation format is particularly useful for
long-term in-service monitoring and for troubleshooting.
Peak to peak view
!
!
!
Figure 7 Graphical representation of output jitter result (jitter versus time)
Manual peak-peak correction method Step 1 Loop back the ANT-20 (connect TX output to RX input)
The manual correction method can be used for measuring Step 2 Set the appropriate signal structure ensuring the optical input levelis
very low jitter values to improve the accuracy of the within the range expect at the DUT output.
measurement result. This is achieved by reducing the Step 3 Read the jitter result/value. In the example below, the value represents
the total amount of intrinsic jitter ± Rx and Tx ± for the particular
influence of intrinsic jitter caused by the ANT-20. If the signal structure.
value measured is in the range of the intrinsic jitter noise 0.045 UIpp at OC-192
floor (intrinsic jitter approximately 4
- 30% of the measured Step 4 As the actual TX portion is unkown the jitter value should be reduced
result), it is recommended that the residual component by the typical Tx value of approximately 0.02 UIpp for OC-192. In this
example, the factor C can be used as a correction value for subsequent
caused by Rx be subtracted.
DUT measurements.
C = 0.045 UIpp ± 0.020 UIpp = 0.025 UIpp
Diagram 1 below outlines a potential method for reducing Step 5 Measure at DUT output. For example:
the influence of intrinsic jitter on a measurement result. 0.080 UIpp
Step 6 Subtract the correction value for intrinsic jitter C from the result. In
the example below, the value is a realistic estimation of the DUT out-
put jitter for this indidual case.
0.080 UIpp ± C = 0.080 UIpp ± 0.025 UIpp = 0.055 UIpp
IMPORTANT: If the measurement result of the DUT does not differ significantly
from the intrinsic result, this may be an indication of correlation between the
DUT and the intrinsic jitter. In this case, it is recommended not to apply the
described correction method.
Potential method for reducing the influence of intrinsic jitter on
a measurement result.
RMS jitter
To perform this measurement, the signal under test must
be connected to the ANT-20s receiver. The RMS value of
the jitter signal provides a clear indication of the jitter
noise power. The significant parameter here is the RMS
value (UIrms) during the test interval.
5
Interpretation of results Whereas peak values are momentary values, RMS values
The test set determines the RMS in UI and results are represent an indication of the jitter noise power during a
updated every second (GUI refresh time) according to the certain integration period. The relation between RMS and
set integration period (figure 8). Measured values should peak to peak values is not fixed and depends on the time
not exceed those recommended under ITU, ANSI, ETSI and function of jitter. The relationship between noise-like
Telcordia regarding requirements for network interfaces signals that include small and high peak amplitudes in
and equipment. particular appear to be hightened when compared with the
commonly known relationship of sinusoidal signals.
The relationship of a typical jitter signal is described in

equation 1 in which RMS jitter is defined for a integration
period of T.
ÐÐÐÐÐÐÐÐÐÐÐÐÐ
H 1T $[ j(t)] dt
T
JRMS = 2
Equation 1
Here, the square root is calculated over the mean value of

the squared signal. This procedure is illustrated in table 3
for a noise-like (random) jitter signal with small peaks of
+1 UI.
1.50
Current RMS 1.00
Squared Signal
0.50
Figure 8 Tabular view of output jitter results ± RMS

Jitteramplitude
0 0.00
0 20 40 60 80 100 RMS 120
Value
The jitter versus time RMS presentation also illustrates the 0.25
UIrms
±0.50 Noise-like Jitter
change in RMS value over the measurement time and 2 UIpp
records the +/± peak, peak-to-peak or RMS value of the jitter

±1.00
versus time. This presentation format is particularly useful Integration Time T
for long-term in-service monitoring and for troubleshooting. ±1.50

Time
RMS Value p-p-Random Square of Random
Figure 10 RMS value of random jitter
RMS view
!
!
!
Figure 9 Graphical representation of output jitter ± RMS
6
The red curve represents a jitter signal with a peak-peak Mapping jitter measurement
amplitude of 2 UIpp. The squared signal is shown in yellow. Mapping jitter is jitter caused by the mapping processes in
The square root of the area below the yellow curve yields synchronous network elements (NE). Bit stream gaps
an RMS value (blue line) of approximately 0.25 UIrms. caused by the bit stuffing procedure lead to variations in
the plesiochronous tributary signal. Phase locked loop
The relation between UIpp and UIrms in this example is (PLL) circuits used in the desynchronizer of NEs are help to
2 UIpp/0.25 UIrms = 8. Practical experience has shown smooth out the phase steps. Remaining phase modulation
that such relationships lie predominantly between 5 and is observed as mapping jitter at the PDH interfaces.
10 for noise-like jitter.
In order to test mapping jitter, the ANT-20 transmits a
The same calculation can also be made with a typical sinus- plesiochronous signal to the tributary interface of the DUT
oidal jitter test signal. Assuming an amplitude of 2.0 UIpp in the event of full channel measurement (figure 12). This
± leading to a squared signal of 1.0 UIpp ± the square root signal is then mapped into a synchronous signal structure,
of the area below the 1.0 UIpp squared amplitude curve demapped and fed into the measurement instrument that
would yield an RMS value (blue line) of approximately thenchecks for phase modulation. Once this measurement
0.71 UIrms. The relation between UIpp and UIrms in this setup has been established, the offset of the transmitted
Ð±
example is 26H2 , which equals 2.83. signal must be tuned to allow for the highest amount of
jitter to be measured on the receiver side.
Phase hit measurement Additional pointer actions can lead to additional amounts
Phase hits occur when a definable jitter +/± peak threshold of jitter. Therefore, it is essential that both the measure-
is exceeded. Events of this kind are recorded using a ment instrument and DUT are synchronized to the same
counter. The current counter reading indicates how often reference clock.
the phase hit threshold has been exceeded from the time
measurement commenced. Both positive and negative
REF
counts can be monitored with the ANT-20 Jitter Analyzer.
Ref. clock in
A phase hit measurement records how often the tolerable [25]
Offset variation
jitter amplitudes (adjustable +/± limits) are exceeded.
Based on a count of phase hits (PH), the user is able to W E STM-N loop
E A
better assess the jitter behavior. S
ADM
S
T T
E1
ANT-20 tributaries
Jitter E1
measurement
E1
Figure 12 Analysis of mapping jitter at tributary ouputs ± full channel

measurement
Display of current threshold transgression count
Phase hit measurement is interrupted and counters

stopped if either the synchronization or AC line supply fails.
Counting resumes once the instrument resynchronizes
itself after the interruption.
The yellow warning icon indicates an

interruption in the measurement.
Figure 11 Output jitter result screen illustrating phase hits
The jitter vs. time +/± peak presentation is also able to

illustrate the distribution characteristics of phase hits
(homogenously or in bursts) over the measurement time.
7
Table 3 outlines the interfaces recommended for use in full Bit rate (kbps) Jitter measurement bandwidth
and half channel measurements. Measurement mode High pass filter Low pass filter
1 544 W 10 Hz 40 kHz
Full channel measurement H 8 kHz 40 kHz
electrical bal. 1.5 to 2 Mbps Rx [12], Tx [13] 2 048 W 20 Hz 100 kHz
electrical unbal. 1.5 to 155 Mbps Rx [14], Tx [15] H1 (only for certain 700 Hz 100 kHz
ref. clock in [25] 1.5/2 Mpbs, 1.5/2 MHz national use)
H2 18 kHz 100 kHz
Half channel measurement, additional 6 312 W 10 Hz 60 kHz
electrical 155 Mbps Tx [15] H 3 kHz 60 kHz
electrical 2.5 Gbps Tx [46] 34 368 W 100 Hz 800 kHz
electrical 10 Gbps Tx [104] H 10 kHz 800 kHz
optical 52, 155, 622 Mbps Tx [18] 44 736 W 10 Hz 400 kHz
optical 2.5 Gbps Tx [47] H 30 kHz 400 kHz
optical 10 Gbps Rx Tx [103] 139 264 W 200 Hz 3.5 MHz
H 10 kHz 3.5 MHz
Table 3 Recommended interfaces dependent on signal under test
Table 4 Mapping jitter measurement bandwidth

Virtual instruments (VI) required When setting the mapping offset range, mapping jitter
± Signal structure measurements need to generate SONET/SDH signals with
± O.172 Jitter Generator/Analyzer different bit rate offsets in the mapped payload signal. To
obtain the maximum mapping jitter, the mapping offset
Measurement setting should be varied in the entire allowed offset range of a
To set the clock source, the ANT-20 must be set to an particular bitrate. The measurement must then be repeated
external clock source to to avoid unforeseen pointer adjust- with varying offset values to determine the worst case
ments and wander activities in addition to the set signal offset. This variation must however be within the values
offset. permitted in accordance recommendation G.783. Table 5
provides an overview of the permissable payload mapping
Step 1 Select Settings... in the Interface menu in the Signal offset ranges.
Structure VI.
Step 2 Select the external reference source format to be Bit rate (kbps) Max. mapping Proposed mapping
offset range (ppm) offset step width (ppm)
used for interface [25] within the Clock Source dia-
1 544 +50 5
log box (1.5 Mbps, 2 Mbps, 1.5 MHz, or 2 MHz are 2 048 +50 5
supported). 6 312 +33 3
34 368 +20 2
When setting the measurement bandwidth, different jitter 44 736 +20 2
139 264 +15 1
weighting filter combinations are used depending on the
bit rate (figure 12). For each particular measurement, a Table 5 Permitted payload mapping offset ranges
wide band (W) and a high band (H) filter combination of

high-pass and low-pass filters are specified (table 4).
Figure 14 Signal structure ± Tx offset
Interpretation of results
The maximum peak to peak results are important when
judging the mapping jitter behavior of the DUT. The most
important results for the mapping jitter measurement are
the peak to peak values measured with the worst case
Figure 13 Filter bandwidth settings
offset and the correct filter settings (figure 15).
8
Combined (pointer) jitter measurement
Jitter generated by the simultanous occurance of two
effects ± mapping jitter and pointer jitter ± is refered to as
combined jitter. In addition to the mapping effect, pointer
action can also cause phase jumps on the tributary side. To
simulate and measure combined jitter, the DUT must be
stimulated with defined pointer sequences together with
Figure 15 Mapping jitter results the worst case offset on the plesiochronous payload of the
SONET/SDH signal. This signal is then applied to a syn-
The ITU-T, ANSI, ETSI and Telcordia standards define the chronous signal, demapped and measured at the tributary
maximum peak to peak jitter values caused by mapping output by the jitter measurement instrument (figure 16).
jitter (table 6). Table 8 outlines recommendations covering Combined jitter only occurs at the tributary interfaces of
mapping jitter measurements. SONET and SDH NEs. Table 8 outlines the interfaces
recommended for use with signals under test.
Bit rate Jitter Maximum peak-to-peak mapping jitter (UIpp)
(kbps) measurement
REF
bandwidth
ITU-T ANSI ETSI Telcordia
[25]
G.783 T1.105.03 EN 300417-1-1 GR-253 Pointer simulation
1 544 W * 0.7 * 0.7 (+ offset variation)
H 0.1 - * - STM-N W E STM-N loop
including E1 E A
2 048 W * n.a. * n.a. S ADM S
H 0.075 n.a. 0.075 n.a. T T
6 312 W * 1.0 n.a. - E1

ANT-20 tributaries
H 0.1 - n.a. - Jitter E1
measurement
34 368 W * n.a. * n.a.
H 0.075 n.a. 0.075 n.a.
Figure 16 Combined (pointer) jitter measurement setup
44 736 W 0.4 0.4 * 0.4
H 0.1 - * -
Data Tx/Rx
139 264 W * n.a. * n.a. electrical bal. 1.5 to 2 Mbps Rx [12], Tx [13]
H 0.075 n.a. 0.075 n.a. electrical unbal. 1.5 to 155 Mbps Rx [14]
(proposed)
electrical unbal. 155 Mpbs Tx [15]
* = for further study ** = Pointer sequence C n.a. = not applicable electrical 2.5 Gbps Tx [46]
Table 6 Maximum peak-to-peak mapping jitter as defined by ITU-T, electrical 10 Gbps Tx [104]
ANSI, ETSI and Telcordia optical 52, 155, 622 Mbps Tx [18]
optical 2.5 Gbps Tx [47]
optical 10 Gbps Tx [103]
Important
± Always use the lowest possible measurement range. Reference clock TX
± Ensure the correct filter settings and the worst case ref. clock in [25]
offset on the tributary Tx side are being used. Table 8 Recommended interfaces for signal under test
± Ensure a warm up time of at least 30 minutes.
ITU-T G.783 Characteristics of SDH equipment functional blocks Combined jitter measurement must be carried out under
ANSI T1.105.03 SONET jitter at network interfaces worst case conditions, that is with the offset on the tributary
signal ± within recommended values ± generating the
ETSI EN 300 417-1-1 Definitions and terminology for synchronization networks
highest jitter. The offset causing the highest jitter on the
Table 7 List of recommendations for XXX mapping jitter measurements tributary side must first be determined in accordance with
the steps set out in chapter 1.3 Mapping jitter measure-
ment. The measurement time should be 60 seconds or at
least the length of the pointer sequence used.
Virtual Instruments (VI) required

± Signal structure
± Pointer generator
± PDH generator
9
To set the transmitter, the various signal structures for the The most important results in combined (pointer) jitter
interfaces at Rx and Tx must also be set as appropriate. measurement are the peak to peak values measured with
Combined (pointer) jitter measurement is performed via the appropriate filter settings. Different jitter weighting
half channel measurement. filter combinations are used depending on the bit rate. For
each particular measurement, a wide band (W) and a high
Figure 17 illustrates the effects of an E1 PDH signal con- band (H) filter combination of high pass and low pass
nected to Rx OC-192 Tx, and a signal that has been fed into filters are specified (table 8).
a DUT.
Bit rate (kbps) Jitter measurement bandwidth
Measurement mode High pass filter Low pass filter
1 544 W 10 Hz 40 kHz
H 8 kHz 40 kHz
2 048 W 20 Hz 100 kHz
H1 (only for certain 700 Hz 100 kHz
Fig 17 Signal structure for combined (pointer) jitter measurement national use)
H2 18 kHz 100 kHz
In order to set the clock source, the ANT-20 must be 6 312 W 10 Hz 60 kHz
synchronized to an external clock/data signal to avoid H 3 kHz 60 kHz
34 368 W 100 Hz 800 kHz
unforeseen pointer adjustments and wander activities in
H 10 kHz 800 kHz
addition to the set pointer sequence. 44 736 W 10 Hz 400 kHz
H 30 kHz 400 kHz
Step 1 Select Settings... in the Interface menu in the Signal 139 264 W 200 Hz 3.5 MHz
Structure VI. H 10 kHz 3.5 MHz
Step 2 Select the external reference source format to be Table 8 Jitter measurement bandwidth (G.783, GR-253, EN 300 417-1-1)
used for interface [25] within the Clock Source
dialog box (1.5 Mbps, 2 Mbps, 1.5 MHz, or 2 MHz As part of step 2, the combined (pointer) jitter measure-
are supported). ment should then be performed to should include the
Step 3 The worst case mapping jitter offset should then worst case mapping offset as well as additional introduced
be determined as described under: Chapter 1.3 pointer sequences.
Mapping jitter measurement
ITU-T, ANSI, ETSI and Telcordia standards specify the
Combined jitter measurement results should include both, various pointer sequences for each tributary bit rate.
mapping jitter and pointer jitter. It is therefore advantageo- Table 9 gives an overview of the pointer sequence types
us to first evaluate the mapping offset value for which the required in accordance with ITU-T recommendations O.172
maximum mapping jitter is obtained (figure 18). and G.783. The equivalent recommendations from ITU-T,
ANSI, Telcordia and ETSI can be found in table 10.
G.783 Pointer test sequence SDH tributary bit rate (kbps) and SDH unit
1 544 2 048 6 312 34 368 44 736 139 264
ID Description TU-11 TU-12 TU-2 TU-3 AU-3 AU-4
a Single alternating X X X
b Regular + double X X X
c Regular + missing X X X
d Double alternating X X
e Single X X X
f Burst X X X
g1 Periodic 87-3 X X
g2 Periodic 87-3 with add X X
g3 Periodic 87-3 with cancel X X
h1 Periodic X X X
h2 Periodic with add X X X
h3 Periodic with cancel X X X
Table 9 G.783 Pointer test sequence types
Figure 18 PDH offset settings
10
Pointer sequence ITU-T G.783 ANSI Telcordia ETSI Cool-down period
Fig. 10-2 T1.105.03 GR-253 EN 300 417-1-1 After the initialization period and in the case of single and
Single alternating a ± ± B burst pointer tests, it is recommended that a 30-second
Regular + double b ± ± D cool-down period be allowed where no pointer activity is
Regular + missing c ± ± E
present in the test signal. For periodic test sequences
Double alternating d ± ± C
Single e A1 (Fig.2) Fig. 5-29 ±
(both continuous and gapped) a 30-second cool-down
Burst f A2 (Fig.3) Fig. 5-30 ± period is recommended during which the periodic sequence
Phase transient burst fp A3 (Fig.4) Fig. 5-31 ± is applied so that a steady state condition is maintained. If
Periodic 87-3 g1 A4 (Fig.5b) Fig. 5-33 b ± necessary, the period should be extended to include an
Periodic 87-3 with add g2 A5 (Fig.5c) Fig. 5-33 c ± integral number of complete sequences.
Periodic 87-3 g3 A5 (Fig.5d) Fig. 5-33 d ±
with cancel
Periodic h1 A4 (Fig.6b) Fig. 5-34 b ± Measurement period
Periodic with add h2 A5 (Fig.6c) Fig. 5-34 c (D) During the measurement period, the jitter of the tributary
Periodic with cancel h3 A5 (Fig.6d) Fig. 5-34 d (E) output is measured for the recommended 60 seconds. If
Table 10 Pointer test sequences as defined by ITU-T, ANSI, necessary, the period can be extended to include at least
Telcordia and ETSI one complete pointer test sequence. In general two con-
secutive measuring periods are required, one for wide-band
Pointer sequence test procedure jitter and one for high-band jitter. The result at the end of
Complete test sequences for specific bitrate and pointer the measuring period is the maximum peak-peak jitter.
sequence consist of several defined periods. In order to
prime the pointer processor and prepare the equipment for Selecting the pointer sequence
the test sequence, initialization and cool-down periods The Pointer Generator enables the generation of test
must be applied prior to starting the measuring procedure. sequences in accordance with ITU-T G.783 and ANSI
T1.105.03 for AU/STS or TU/VT pointers. Both pointers can
be generated simultaneously or independently of each
Initialization Cool-down Measurement
60 s 41 period 460 s or 41 period other.
time
The time parameters are related to the ANT-20 settings of
INC 87-3 INC 87-3 INC 87-3 INC
the Pointer Generator VI. Table 11 shows the default values
for each pointer test sequence and the corresponding
range requirement.
time
Figure 19 Example pointer procedure for 87-3 INC periodic test sequence
Initialization period
To ensure that jitter on the demultiplexed tributary signal
is nevertheless affected in the event of single and burst
sequences, it is important that pointer movements are not
absorbed by the pointer processor. With periodic sequences,
the pointer processor must be in the same steady-state
condition it would be in if continual pointer movements
had always been present. For single and burst test
sequences, the initialization period should consist of
pointer adjustments applied at a rate higher than that of
the test sequence but lower than 3 pointer adjustments
per second in the same direction as the subsequent test
sequence. The initialization period should last at least until
a response is detected in the jitter measured on the
demultiplexed tributary signal. For this purpose it is re-
commended that a 60 second initialization period be used.
11
Pointer sequence ID ANT-20 parameters
Default values
Proposed ranges
ANT-20 setting n T1 T2 T3 T4 T5
Single alternating a 1 10 s n.a. n.a. 20 s (2 x T1) n.a.
ªINC/DECº 0.75 ... 30 s 1.5 ... 60 s
Regular + double b 40 n.a. 0.75 s 2 ms 30 s (40 x T2) n.a.
ªINCº or ªDECº 34 ms ... 10 s 0.5 ms ... 1 s 10 s ... 60 s
Regular + missing c 40 n.a. 0.75 s n.a. 30 s (40 x T2) 15 s (20 x T2)
ªINCº or ªDECº 34 ms ... 10 s 10 s ... 60 s 5 s ... 30 s
Double alternating d 2 10 s 0.5 ms n.a. 20 s (2 x T1) n.a.
ªINC/DECº 0.75 ... 30 s 0.5 ms ... 1 s 1.5 ... 60 s
Single e 1 n.a. n.a. n.a. 30 s n.a.
ªINCº or ªDECº 10 s ... 60 s
Burst f 3 n.a. 2 ms n.a. 30 s n.a.
ªINCª or ªDECª 0.5 ms ... 1 s 10 s ... 60 s
Phase transient burst fp 6 n.a. 0.5 s 0.25 s (T2/2) 30 s n.a.
ªINCº or ªDECº 0.1 ... 1 s 0.05 ... 0.5 s 10 s ... 60 s
Periodic 87-3 g1 n.a. n.a. 34 ms n.a. 3.06 s (90 x T2) n.a.
ª87-3 Incº or ª87-3 Decº 34 ms ... 10 s 3.06.. 900 s
Periodic 87-3 with add g2 n.a. n.a. 34 ms 0.5 ms 3.06 s (90 x T2) n.a.
ª43-44 Incº or ª43-44 Decº 34 ms ... 10 s 0.5 ... 2 ms 3.06 ... 900 s
Periodic 87-3 with cancel g3 n.a. n.a. 34 ms n.a. 3.06 s (90 x T2) n.a.
ª86-4 Incº or ª86-4 Decº 34 ms ... 10 s 3.06 ... 900 s
Periodic h1 1 n.a. n.a. n.a. 1s n.a.
ªINCº or ªDECº 34 ms ... 10 s
Periodic with add h2 1000 n.a. 34 ms 0.5 ms 34 s (1000 x T2) n.a.
ªINCº or ªDECº 34 ms ... 10 s 0.5 ... 2 ms 30 s ... 60s
Periodic with cancel h3 1000 n.a. 34 ms n.a. 34 s (1000 x T2) 17 s (500 x T2)
ªINCº or ªDECº 34 ms ... 10 s 30 s ... 60 s 15 ... 30 s
Table 11 ANT-20 time parameter settings ± default values and ranges
For some time parameter settings, fixed relations are pre-

configured in the ANT- 20. These relations or conditions are
listed in table 12.
Pointer sequence Relations and conditions between time parameter settings

a T1 given: T4 = 2 x T1
b T2 and T4 given: n = T4/T2, where n = Integer, T3 5T2
c T2 and T4 given: n = T4/T2, where n = Integer, T5 = T4/2
d T1 given: T4 = 2 x T1, T2 55T1
fp T2 and T4 given: T3 = T2/2, T2 5
5T4
g1 T2 given: T4 = 90 x T2
g2 T2 given: T4 = 90 x T2, T3 5T2
g3 T2 given: T4 = 90 x T2
h2 T2 and T4 given: n = T4/T2, where n = Integer, T3 5T2
h3 T2 and T4 given: n = T4/T2, where n = Integer, T5 = T4/2
Table 12 Relations and conditions between time parameter settings
Instrument and application set-up

Step 1 Click the STS/AU button in the toolbar.
Figure 20 Example periodic 87-3 pointer sequence
Step 2 Select 87/3 INC from the STS/AU Pointer box.
Step 3 Set the distance between the two pointer actions in
the T2 entry box.
Step 4 Set the desired sequence length in the Mode box
and select whether single sequence or continuous
repetition (T4) should be used.
Step 5 Click on the AU/STS ON button to activate the
pointer sequence.
Step 6 Start the measurement by pressing F5 or by clicking
the green traffic light signal in the Application Manager
12
Interpretation of results Maximum tolerable jitter (MTJ)
The peak to peak results are necessary to evaluate the Maximum tolerable jitter measurement is used to deter-
combined (pointer) jitter behaviour of the DUT. mine the jitter amplitude on electrical and optical line and
The maximum peak to peak jitter values caused by combi- tributary inputs which causes errors and alarms. Here, the
ned jitter are defined by standards bodies including ITU-T, ANT transmits a specific test pattern with sinusoidal jitter
ANSI, ETSI and Telcordia (Table 13). at a defined frequency (figure 21). The jitter amplitude of
this signal is increased with a half interval progression
Bit rate Jitter Maximum peak-to-peak mapping jitter (UIpp) until errors occur at the output of the DUT. This amplitude is
(kbps) measurement
the MTJ result for the defined frequency. This measurement
bandwidth
is repeated for different frequencies with results used to
ITU-T ANSI ETSI Telcordia
G.783 T1.105.03 EN 300417-1-1 GR-253 form the MTJ graph. Table 15 lists the interfaces for use
1 544 W 1.5 1.3 * 0.7 dependent on the signal under test.
(1.9 ****)
H * - * -
2 048 W 0.4 n.a. 0.4 n.a. Jitter stimulation
H 0.075 n.a. 0.075 n.a. Tx
Network
6 312 W 1.5 * n.a. - element
Rx
H * - n.a. -
Error detection
34 368 W 0.4 n.a. 0.4 (0.75 **) n.a.
(0.75 ***) ANT-20
H 0.075 n.a. 0.075 n.a.

Figure 21 Maximum tolerable jitter set
44 736 W * 1.3 * 0.4
H * - * -
Data Tx/Rx
139 264 W 0.4 n.a. 0.4 (0.75 **) n.a.
electrical bal. 1.5 to 2 Mbps Rx [12], Tx [13]
(proposed)
electrical unbal. 1.5 to 155 Mbps Rx [14], Tx [15]
H 0.075 n.a. 0.075 n.a.
(proposed)
* = for further study ** = Pointer sequence C (EN 300 417-1-1) optical 52, 155, 622 Mbps Rx [17], Tx [18]
*** = Pointer sequence d (G.783) optical 2.5 Gbps Rx [44], Tx [47]
**** = Pointer sequence A5 (T1.105.03) n.a. = not applicable optical 10 Gbps Rx [113], Tx [103]
Table 13 Maximum peak-to-peak combined jitter Table 15 Recommended interfaces for useage depending on signal under
test
Important
± Always use the lowest possible measurement range. Instrument and application setup
± Make sure the correct filter settings and worst case Virtual instruments (VI) required
payload offset on the Tx side are selected ± Signal structure
± Apply the required pointer sequence ± O.172 Jitter Generator/Analyzer
± Ensure a warm up time of 30 minutes.
MTJ measurements must be performed under worst case or
ITU-T G.783 Characteristics of SDH equipment functional blocks 1dB optical penalty conditions as described in G.823,
ANSI T1.105.03 SONET Jitter at network interfaces GR-253 or T1.105.03. Here, the DUT receiver should
function with a level 1 dB that is higher than the sensitivity
limit. An adjustable attenuator is inserted between the
Table 14 List of Recommendations XXX for combined (pointer) jitter output (Tx) of the test set and the input (Rx) of the DUT.
measurement
The optical level is set so that a limit bit error rate of for
example 1±10 is obtained. As an example, at 10 Gbps this
BER corresponds to one bit error per second. When the
level is increased by 1 dB, bit errors should not occur. The
MTJ measurement is most commonly performed with an
error threshold of 1 (TSE) and a gate time of 1 s.
Appendix III of G.823 states that ª...The attenuation func-

tion is needed for optical interfaces to be able to determine
the 1 dB sensitivity penalty (in terms of optical power) at a
certain bit error ratio.º
13
Measurement settings Important
Follow the steps below using the O.172 Jitter Generator/ ± Check that the instrument is set to the correct wave-
Analyzer VI. length.
± Assure matching optical input power levels according to
Step 1 Select the MTJ command in the Mode menu, or click the 1 dB penalty approach.
on the corresponding button in the toolbar.
Step 2 Select the error source in the Error Source list field Interpretation of results
to be counted during the gate time. Results can be generated in table (figure 23) or graphic
Step 3 Enter the error threshold in the Error Threshold (figure 24) format.
field. This field provides a decision criterion for the
MTJ algorithm.
Step 4 In the Settling Time field, enter a delay for each
measurement to allow the DUT to settle on the
jittered signal before measurement (error count)
commences.
Step 5 Enter the required gate time in the Gate Time box
for the test intervals.
Step 6 In the Settings menu select MTJ or click on the SET
symbol.
Figure 22 MTJ Settings dialog box
These steps will open the Settings dialog box that con-
tains both the measurement frequencies for MTJ measure-
ment and the characteristic data for the tolerance mask
(figure 22).
Step 7 Predefinesd setting can be used or, if necessary,

scan frequencies selected and the tolerance mask
values modified according to individual test needs
needs.
Step 8 Confirm the input with OK.
Step 9 Press Start to commence measurement. Although
Figures 23 and 24 Maximum tolerable jitter result screen
measurement stops automatically, it can be halted
at any time by clicking on Stop.
14
Table format Instrument and application setup
± Measurement results are displayed in the table under UI. Virtual Instruments (VI) required
± Measurement results ± where tolerable jitter of the DUT ± Signal structure
is greater than the maximum amplitude that can be set ± O.172 Jitter Generator/Analyzer
on the jitter generator ± are indicated by the greater
than sign (4), for example 464 UI. It is recommended that FMTJ measurement be performed
± Measurement results that are below the tolerance mask under worst case condition or, 1 dB optical penalty as it is
are marked with an exclamation mark (!) in the table. refered to. In this case, the receiver of the DUT should work
with a level 1 dB higher than the sensitivity limit. An
Graphic format adjustable attenuator is inserted between the output (Tx)
± Measurement results are marked with a ª+º on the of the test set and the input (Rx) of the DUT as illustrated in
graphics. figure 25. The optical level is set so that a limit bit error
± Measurement results where the tolerable jitter of the rate of for example 1 ±10 is obtained. As an example, at
DUT is greater than the maximum amplitude that can be 10 Gbps this BER corresponds to one bit error per second.
set on the jitter generator are marked with ª~º on the When the level is increased by 1 dB, bit errors should not
graphics (instead of the ª+º). occur.
ITU-T G.823 Jitter and Wander within networks based on 2048 kbps Measurement Settings
ITU-T G.824 Jitter and Wander within networks based on 1544 kbps Follow the steps below using the O.172 Jitter Generator/
ITU-T G.825 Jitter and Wander within networks based on the SDH
Analyzer VI.
ANSI T1.105.03 SONET jitter at network interfaces
Telcordia GR-499 Transport systems generic requirements Step 1 Select the Fast MTJ command in the Mode menu or
ETSI EN 302 084 The control of jitter and wander in transport networks click on the corresponding button in the tool bar
Table 16 List of Recommendations for MTJ measurements (figure 26).
Fast maximum tolerable jitter

For Fast MTJ (FMTJ) measurements, given combinations of
jitter frequencies and jitter amplitudes that lie on the limit
curves as defined in standards, can be set on the jitter
generator. Each measurement point is classified as either
ªOKº or ªFailedº thus indicating whether the DUT has met
the limit curve.
Table 17 lists the interfaces to be used dependent on the
signal under test.
Jitter stimulation
Tx
Network
element
Rx
Error detection
ANT-20
Figure 25 FMTJ setup
Figure 26 FMTJ measurement VI

Data Tx/Rx
electrical unbal. 1.5 to 155 Mbps Rx [14], Tx [15] Step 2 Select the error source in the Error Source list field
electrical 2.5 Gbps Rx [43], Tx [46] to be counted during the gate time.
electrical 10 Gbps Rx [114], Tx [104] Step 3 In the Error Threshold field, enter the error
optical 52, 155, 622 Mbps Rx [17], Tx [18] threshold above which the DUT would be considered
optical 2.5 Gbps Rx [44], Tx [47]
as having failed the test. An error threshold cannot
be entered if an alarm is selected from the Error
Table 17 Recommended interfaces for useage depending on signal under
test
Source list box.
15
Important
± Check that the instrument is set to the correct wave-
length.
± Assure matching optical input power level in accordance
with the 1 dB penalty approach.
Each setting, respective of the measurement, is classified
as OK or Failed (figure 28). Table 18 lists the Recommen-
dations for FMTJ measurements.
ITU-T G.823 Jitter and Wander within networks based on 2048 kbps
ITU-T G.824 Jitter and Wander within networks based on 1544 kbps
Figure 27 FMTJ settings dialog box Telcordia GR-253 SONET transport systems common generic criteria
Telcordia GR-499 Transport systems generic requirements
Step 3 In the Settling Time field, enter a delay for each ETSI EN 302 084 The control of jitter and wander in transport networks
measurement to allow the DUT to settle on the Table 18 List of Recommendations for FMTJ measurements
jittered signal before measurement (error count)
commences.
Step 4 In the Settings menu, select MTJ or click on the SET Jitter transfer function (JTF)
icon (figure 27). Jitter transfer function (JTF) measurements are of particular
Step 5 If required, select individual frequency and ampli- importance when dealing with regenerators (equation 2).
tude combinations or use the predefined recom- Checks are carried out to demonstrate that the jitter gain
mendations for performing the measurement. of a regenerator is below a predefined value and attenuated
Step 6 Confirm entries by clicking OK. above a defined cut-off frequency. If this is not the case,
Step 7 Click Start to commence measurement. Measure- jitter accumulation occurs after several regenerators.
ment will stop automatically on completion or when JTF is measured by applying a signal with jitter that is
the Stop icon is clicked. constant over frequency or adjusted to the maximum
tolerable jitter (MTJ). The jitter analyzer measures the
resulting jitter amplitude at the output of the DUT at various
TX jitter frequencies (figure 29). The log of the ratio gives
the jitter gain or attenuation. For maximum measurement
accuracy a calibration measurement is necessary and
recommended.
Table 19 lists the interfaces to be used dependent on the
signal under test.
output jitter
Jitter transfer function: H (f) = 20 log
input jitter
Equation 2
Tx
1 DUT
Rx
ANT-20
1. Calibration measurement
2. Measurement with DUT
Figure 28 FMTJ result screen

Figure 29 Jitter transfer measurement setup
16
Data Tx/Rx
Table 19 Recommended interfaces for useage depending on signal under
test

Virtual Instruments (VI) required
± Signal structure
Measurement Settings Figure 31 JTF settings dialog box

Follow the steps below using the O.172 Jitter Generator/
Analyzer VI Step 5 To use the results of a previous MTJ measurement
for scan frequencies and amplitudes, click the
Step 1 Select JTF in the Mode menu or click on the MTJ Adaptation button. The MTJ results are then
corresponding button in the tool bar (figure 30). automatically matched to the permissible ranges
(measurement and frequency) of the jitter meter.
If no MTJ results available, the button is grayed out.
Step 6 Select whether single calibration measurement
(internally stored), or calibration measurement
before every JTF measurement are required. For
maximum measurement accuracy, calibration
measurement should be carried out before every
JTF measurement.
Step 7 Click Start to commence measurement. Measure-
ment will stop automatically on completion or when
the Stop icon is clicked.
Measurement results are displayed in two separate
windows. The default values for the scan frequencies and
the tolerance masks in the JTF-Settings window are set in
the window with the table display (figure 32).
Figure 30 JTF measurement VI
Step 2 In the Settling Time field, enter an appropriate

settling time for the various measurements steps
so that analysis starts once the DUT has settled.
Step 3 Use the predefined settings or click on the Set
button to individually confirm the scan frequencies
and amplitudes (figure 31).
Step 4 To perform measurements using a constant
For example:
amplitude for all scan frequencies, mark the Fixed
ANT-20 looped
Amplitude check box and enter the required
Mask
amplitude in the box below it. exceeded!
Figure 32 JTF result screen ± table format
17
Default values are dependent on bit rate and change auto-
matically when the bit rate is altered. Measurement results
Wander measurement
are displayed in the table under dB. Measurement results
that are below the tolerance mask are marked with an
exclamation mark (!) in the table. Measurement values are
Measuring Wander
Wander test equipment requires extremely precise external
indicated in the graph by a plus (+) character. See table 20
reference clock sources. The same input jacks are used for
for a full list of recommendations for jitter transfer function
the signal under test as with other ANT-20 measurements
measurements.
such as anomaly/defect analysis or performance and
pointer tests making it possible to perform these measure-
ments in parallel on all relevant interfaces. The wander
reference clock has a separate jack and can accept clock
signals at 1.5 MHz, 2 MHz, 5 MHz and 10 MHz as well as
data signals with bit rates of 1.5 Mbps and 2 Mbps
(figure 34).
Unlike jitter results which are given in UI, TIE values are
given as absolute values in seconds (s) or nano seconds
(ns). In addition to this, the extremely low frequency
components in the mHz/mHz range require test times of up
to several hours or days.
++++++++++++++
+
+ TIE
For example:
+
ª+º ANT-20 looped
+ DUT
ª+º DUT connected +
Note: Only one result can be shown!
REF
ANT-20
Figure 33 JTF result screen ± graph format time
Figure 34 Basic principle of wander measurement

Important
± Set the instrument to the correct wavelength.
The time interval error (TIE) value represents the time
± Make sure that the optical level is in the range between
deviation of a clock/data signal under test relative to the
±10 and ±12 dBm.
reference source (figure 35).
ITU-T G.705 Characteristics of PDH equipment functional blocks TIE measurement forms the basis for further maximum
ITU-T G.783 Characteristics of SDH equipment functional blocks time interval error/time deviation (MTIE/TDEV) calculations.
Telcordia GR-499 Transport systems generic requirements TIE
Table 20 List of recommendations for jitter transfer function measurements
TIE
time (t)
Observation
Intervals
Test period T
Figure 35 Determining TIE value
18
Instrument setup and application settings

Virtual Intruments (VI) required
± Signal structure
± Pointer Generator (for pointer wander measurement only)
Step 1 Add the VIs required to the list of those used in the
Application Manager (figure 35).
Step 2 Click on the JIT button to open/change to the O.172
Jitter Generator/Analyzer window.
Figure 36 Application Manager
Step 3 To define the TIE measurement setting, select TIE in

the Mode menu. The wander display (TIE vs. Time) Figure 39 Measurement settings dialog box
will appear in the O.172 Jitter Generator/Analyzer
window. Step 4 In the Settings menu select TIE and configure the
instrument in accordance with the references. Then
set the connector to be used and the frequency or
bit rate of the reference signal.
Current MTIE * and TIE values

!
* max. TIE value in reference to

the observed measurement time
!
Figure 37 TIE result screen

Different connectors are used dependent on the different
bitrates at the measurement interface. These include:
Up to 622 Mbps ± BAL [34] or UNBAL [35]
2488 Mbps ± UNBAL [54]
9953 Mbps ± BAL [121] or UNBAL [122]
Step 5 Select the sample rate required. The low-pass filter

is set automatically. For most cases a sampling rate
of 30 samples per seconds is recommended.
Step 6 Click OK to confirm.
Step 7 To set the measurement time, click on the Aplication
Manager and choose Measurement Settings from
Figure 38 Wander Settings dialog box the menu (figure 39). Then set the appropriate
measurement time in the gate time window.
19
Step 8 Press the function key F5 or click the green traffic line with recommendations outlined in ETSI EN 300462,
signal icon in the Application Manager to commence EN 302084, ITU-T G.811, G.812, G.813 and ANSI.
measurement.
Instrument application and setup
Important Step 1 Starting the MTIE/TDEV Analysis program from the
± For reliable results the accuracy of the measurement O.172 Jitter Generator/Analyzer VI.
reference clock should be approximately ten times as After displaying the TIE results the MTIE/TDEV
accurate as the accuracy of the DUT. software can be directly initiated by pressing the
± Ensure the optical level is between the range of TDEV button in the TIE measurement window.
±10 and ±12 dBm when measuring optical signals. Results of the TIE measurement are automatically
± Ensure the recommended sampling rate is being used. loaded.
± Allow a warm up time of 30 minutes. Step 2 Click on the MTIE/TDEV button. The MTIE/TDEV
± It is recommended that a short term measurement be analysis software will open and display the
carried out prior to any very long term measurements to TIE graph (figure 40).
prevent ineffective use of measuring time through offset Step 3 Click the MTIE/TDEV button in this window to
and mask exceed failures for example. enable TDEV if required. The values will then be
calculated and displayed.
A range of pre-defined tolerance masks from the
Masks list box can be selected. They can be used to
give a quick overview of whether the measured
values meet the tolerance requirements.
Step 4 Click on Analysis to display the measurement re-
sults are displayed together with the selected
masks.
Possible evaluations
The check boxes at the lower left of the MTIE analysis
window can be used to select the values for display (Zoom
Marker functionality. The displayed graph can be printed
out and MTIE/TDEV results exported in CSV file format via
Figure 40 TIE analysis screen ± MTIE/TDEV offline software
the Export menu (figure 41).
MTIE/TDEV offline wander analysis

Storing results
The MTIE/TDEV Offline Analysis software provides precise
To store results, the Export menu must be selected followed
time domain analysis of MTIE and TDEV with reference to
by either MTIE or TDEV. This will open the Save As dialog
the captured TIE vs. Time graph. The program evaluates
box.
TIE values measured using the Acterna ANT-20 test set,
The target directory must then be chosen and the CSV
includes the mask for a variety of signal sources and is in
format set to ensure interoperability with calculation ore
spreadsheet software such as Microsoftâ Excel. Click Save
to start the export process.
!
MTIE values
!
TDEV values
Selection of
!
Passed/Failed indication
Figure 41 MTIE analysis result screen
20
Interpretation of MTIE/TDEV results
Reference
MTIE and TDEV may yield different results depending on For example
PRC TSR-37
the type of interference signal (table 21). As well as the
obvious effects due to frequency offset and drift, the typical
Wander
noise processes encountered in oscillators are also listed. Rx reference
As the table shows, the MTIE calculation is the only method
described that can detect the important (and frequently
occurring) case of frequency offset. The TDEV calculation
also gives information about frequency drift or oscillator
noise. If, for example, the slope of the TDEV curve ANT-20
corresponds to the square root of s, this would indicate
Figure 42 Verifiying accuracy of a PRC
phase modulation with white noise.
Buffers are used in digital switches, synchronous cross- Maximum tolerable interval error (MTIE) provides a measure
connects and add-drop multiplexers to compensate for of the long-term stability of a clock signal. In contrast, time
phase variations. The MTIE value is useful for configuring deviation (TDEV) analysis is a calculation of the clock
the buffer, in other words, the buffer is dimensioned signal's short-term stability. TDEV curves are used for
according to the specified limit value for MTIE. If this value assessing oscillator performance.
is not exceeded it can be safely assumed that no buffer
overflows will occur and hence frame slips will be absent. Table 22 gives an overview of recommendations for jitter
and wander measurement.
If results appear to include a phase ramp (consistantly Data Rx
increasing or decreasing) this may be eliminated via the electrical balanced 1.5 to 2 Mbps Rx [12]
MRTIE function. See section 2.5 Wander measurement for electrical unbalanced 1.5 to 155 Mbps Rx [14]
asynchronous signals for further information. electrical 622 Mpbs Rx [16]
electrical 2.5 Gbps Rx [43]
electrical 10 Gbps Rx [114]
Process Slope of Possible causes
optical 52, 155, 622 Mbps Rx [17]
MTIE TDEV
optical 2.5 Gbps Rx [44]
Frequency offset s - Clock not from PRS optical 10 Gbps Rx [113]
Frequency drift - s2 Delay variations due to
temperature changes Wander reference
wander ref. clock up to 622 Mbps [34] or [35]
White noise Phase Modulation - s-1/2 Typical parasitic noise processes
wander ref. clock 2.5 Gbps [54]
(WPM) in different types of oscillators
wander ref. clock 10 Gbps [121] or [122]
Flicker Phase Modulation (FPM) - s-0
White noise Frequency - s1/2 Table 22 Interfaces for use dependent on signal under test and reference
Modulation (WFM)
Flicker Frequency Modulation - s Instrument and application setup
(FFM)
Follow the instrument application and setup procedure
Random Walk Frequency - s3/2
Modulation (RWFM) under Measuring wander on pages 18 to 20.
Table 21 MTIE/TDEV interpretation
Important
± For reliable results the accuracy of the measurement
Wander measurement of a clock source reference clock should be approximately ten times as
(TIE/MTIE/TDEV) accurate as the accuracy of the DUT.
The wander measurement of a clock source is used for ± Ensure the optical level is between the range of
verifying the accuracy of a primary reference clock or a DUT ±10 and ±12 dBm when measuring optical signals.
(figure 42). Here, the clock signal to be measured is com- ± Ensure the recommended sampling rate is being used.
pared with an external reference clock. To ensure reliable ± Allow a warm up time of 30 minutes.
measurement results it is important that the accuracy of ± It is recommended that a short term measurement be
the reference clock is essentially better than the accuracy carried out prior to any very long term measurements to
of the DUT. prevent ineffective use of measuring time through offset
and mask exceed failures for example.
± For reliable wander measurement, the minimal measure-
ment time must be at least twelve time the length of
the required TDEV mask.
21
ITU-T O.172 Jitter and Wander measuring equipment for SDH signals Instrument and application setup
ITU-T G.810 Definitions and terminology for synchronization networks Follow the procedure in section Instrument setup
ETSI EN 300 462-3 The control of jitter and wander within synchronization Important
networks (specifies MTIE and TDEV masks)
± For reliable results the accuracy of the measurement
Table 23 Overview of recommendations for jitter and wander testing reference clock should be approximately ten times as
accurate as the accuracy of the DUT.
± Ensure the optical level is between the range of
Wander generation measurement of DUTs ±10 and ±12 dBm when measuring optical signals.
(TIE/MTIE/TDEV) ± Ensure the recommended sampling rate is being used.
Every SDH network element (NE) commonly makes use of ± Allow a warm up time of 30 minutes.
an internal clock (SEC/SMC). This clock source may be ± It is recommended that a short term measurement be
synchronized via an external synchronization signal or via carried out prior to any very long term measurements to
the data signal on the line input. To check the quality of the prevent ineffective use of measuring time through offset
internal clock source, the clock of the reference source is and mask exceed failures for example.
compared with that of the transmitted data signal. The ± For reliable wander measurement, the minimal measure-
difference is referred to as wander. The ANT-20 can be ment time must be at least twelve time the length of
used to perform measurements on all interfaces of the the required TDEV mask
instrument.
ITU-T O.172 Jitter and Wander measuring equipment for SDH signals
Figure 43 illustrates wander generation with a DUT and ITU-T G.810 Definitions and terminology for synchronization networks
with synchronization via an external synchronization input. ETSI EN 300 462-1-1 Definitions and terminology for synchronization networks
Table 24 gives and overview of the recommendations for Table 25 overview of recommendations for wander generation measurement
testing.
wander generation measurement testing.
Wander measurement at network interfaces with

T4
Reference
SEC
For example synchronous signals (TIE/MTIE/TDEV)
TSR-37
DUT OC-N/STM-N The wander measurement for synchronous signals is used
for verifying the wander performance of synchronous data
Wander signals (figure 44). Here, the data signal to be measured is
Rx reference
compared to an external reference clock. To acquire reliable
measurement results it is important that the accuracy of
the reference clock is essentially better than the expected
accuracy of the synchronous signal. Table 26 lists the inter-
faces recommended for use dependent on the signal under
ANT-20 test and references.
Figure 43 Wander generation with DUT
PRC
Data Rx Reference
electrical balanced 1.5 to 2 Mbps Rx [12] For example
TSR-37
electrical unbalanced 1.5 to 155 Mbps Rx [14]
electrical 622 Mpbs Rx [16]
electrical 2.5 Gbps Rx [43] Signal source
electrical 10 Gbps Rx [114] For example Network
2 Mbps
optical 52, 155, 622 Mbps Rx [17]
optical 2.5 Gbps Rx [44] Wander
Rx reference
optical 10 Gbps Rx [113]
Wander reference
wander ref. clock up to 622 Mbps [34] or [35]
Table 24 Interfaces for use dependent on signal under test and reference ANT-20
Figure 44 Wander measurement at network interfaces
22
Data Rx measurement, the frequency offset is determined and sub-
electrical balanced 1.5 to 2 Mbps Rx [12] tracted from the result so that only the network wander is
electrical unbalanced 1.5 to 155 Mbps Rx [14] displayed. Figure 45 illustrates the instrument application
electrical 622 Mpbs Rx [16] setup for wander measurement with asynchronous signals.
electrical 2.5 Gbps Rx [43]
electrical 10 Gbps Rx [114]
Asynchronous
optical 52, 155, 622 Mbps Rx [17] clock source
for example Reference
optical 2.5 Gbps Rx [44] +50 ppm For example
optical 10 Gbps Rx [113] TSR-37
Wander reference
wander ref. clock up to 622 Mbps [34] or [35] Signal source
For example Network
wander ref. clock 2.5 Gbps [54] 2 Mbps
Wander
Table 26 Interfaces for use dependent on signal under test and reference Rx reference

Follow the instrument application and setup procedure
under Measuring wander on pages 18 to 20.
ANT-20
Important
± For reliable results the accuracy of the measurement Figure 45 Wander measurement with asynchronous signals
reference clock should be approximately ten times as

accurate as the accuracy of the DUT. Data Rx
electrical balanced 1.5 to 2 Mbps Rx [12]
± Ensure the optical level is between the range of
electrical unbalanced 1.5 to 155 Mbps Rx [14]
±10 and ±12 dBm when measuring optical signals. electrical 622 Mpbs Rx [16]
± Ensure the recommended sampling rate is being used. electrical 2.5 Gbps Rx [43]
± Allow a warm up time of 30 minutes. electrical 10 Gbps Rx [114]
± It is recommended that a short term measurement be optical 52, 155, 622 Mbps Rx [17]
carried out prior to any very long term measurements to optical 2.5 Gbps Rx [44]
optical 10 Gbps Rx [113]
prevent ineffective use of measuring time through offset
and mask exceed failures for example. Wander reference
± For reliable wander measurement, the minimal measure- wander ref. clock up to 622 Mbps [34] or [35]
ment time must be at least twelve time the length of
the required TDEV mask
Table 28 Interfaces to be used dependent on signal under test and reference
ITU-T G.810 Definitions and terminology for synchronization networks Instrument setup and application
ITU-T G.823 Jitter and Wander within networks based on 2048 kbps Follow the instrument application and setup procedure
ITU-T G.824 Jitter and Wander within networks based on 1544 kbps under Measuring wander on pages 18 to 20.
MRTIE calculation
ETSI EN 302 084 The control of jitter and wander in transport networks
The MTIE/TDEV Offline Analysis software provides precise
Table 27 Overview of recommendatios for Wander measurement at network
interfaces with synchronous signals (TIE/MTIE/TDEV)
time domain analysis of MTIE and TDEV in reference to the
captured TIE vs. Time graph. The program evaluates TIE
values measured using the Acterna ANT-20. Evaluation is
Wander measurement for asynchronous signals performed acording to ETSI EN 300462, EN 302084, ITU-T
(MRTIE) G.811, G.812, G.813 and ANSI T1.101 recommendations,
Maximum relative time interval errors (MRTIE) measure- and include the masks for the various signal sources. This
ment is used if the source is not available during wander software also includes MRTIE calculation. Table 29 lists the
analysis due to spatial separation for example. In this case, recommendations for performing wander generation
MTIE analysis can have a frequency offset superimposed measurements.
on it. It is a function of the clock difference between the
signal and the reference used for measurement. In MRTIE
23
Step 1 After displaying the TIE results, the MTIE/TDEV soft- ± If there are doubts as to whether the traffic signal to be
ware can be started immediately by pressing the measured is synchronous to the reference clock, per-
TDEV button in the ANT-20 jitter VI when the unit is form a short TIE measurement and check for offset first.
in TIE measurement mode. Results from the TIE
measurement are loaded automatically (table 29). ITU-T G.823 Jitter and Wander within networks based on 2048 kbps
Step 2 The offset must be removed (click eliminate in the ETSI EN 302 084 The control of jitter and wander in transport networks
frequency offset window) to acquire the MRTIE. Table 29 Recommendations for wander generation measurement
Wander tolerance measurement/Maximum Tolerable

Wander (MTW)
The Maximum Tolerable Wander (MTW) function is used
to perform automatic wander tolerance measurements
that conform to ITU-T G.823, G.824, G.825, O.172 and
ETSI EN302084 recommendations. Here, the DUT is
stressed with a wander amplitude of a given frequency and
the DUT output checked for definable errors (figure 48).
The measurement is repeated for different frequencies and
the results (OK/failed) displayed.
Table 30 lists the recommendations for performing MTW

Figure 46 TIE result screen ± the blue line illustrates TIE with eliminated measurements.
offest
Reference
Step 3 Click the MTIE/TDEV button. Then select analysis in For example
TSR-37
the next window to display the MRTIE (figure 47).
Ref. clock in
[25]
Tx
DUT
Rx
ANT-20
Figure 48 Wander tolerance measurement setup
Data Tx/Rx
electrical unbal. 1.5 to 155 Mbps Rx [14], TX [15]
Figure 47 MRTIE analysis result screen
Important
Reference clock TX
± For reliable results the accuracy of the measurement ref. clock in [25]
reference clock should be approximately ten times as Table 30 Interfaces to be used dependent on signal under test and reference
accurate as the accuracy of the DUT.
± Ensure the optical level is between the range of For this measurement, the input level must be 1 dB higher
±10 and ±12 dBm when measuring optical signals. than the sensitivity level of the interface. The sensitivity
± Ensure the recommended sampling rate is being used. level must be determined by decreasing the signal level
± Allow a warm up time of 30 minutes. of the TX signal without wander modulation until a BER
± It is recommended that a short term measurement be of 10±10 occurs. This is the sensitivity level of the DUT.
carried out prior to any very long term measurements to Once this has been determined, the power level should be
prevent ineffective use of measuring time through offset increased by 1 dB for the tolerance measurement. The error
and mask exceed failures for example. threshold should be one error.
24
The ANT-20's generator is normally synchronized externally NB: The MTW function can only be activated once the
in MTW mode. This is performed by connecting an appro- generator has been set to wander (TX WAN). The
priate reference signal to socket [25]. An appropriate generator must be set back to jitter (TX JIT) to enable
message will be displayed once MTW measurement use of other automatic jitter measurement functions
commences and if the internal clock source is used for such as MTJ, F-MTJ, JTF, after performing MTW
MTW measurement. Variable combinations of wander measurements.
amplitudes and wander frequencies are set once measure-
ment is initiated. The output signal is modulated for one Step 3 Select the error source (for example, TSE, Test
period of the wander frequency for each combination of v- Sequence Error) in the Error Source list box.
alues. The measurement point is then marked as OK (no Step 4 In the Error Threshold box, enter the error threshold
alarms or bit errors detected) or Failed (alarms or bit errors above which the result will be assessed as Failed.
detected). An error threshold cannot be entered if an alarm
was selected in the Error Source box.
Instrument setup and application Step 5 In the Settling Time box, enter the time allowed for
Follow the instrument application and setup procedure the DUT to settle after each frequency/amplitude
under Measuring wander on pages 18 to 20 and apply the setting is activated before counting errors (Gate
following additional steps described: Time).
Step 6 Select the MTW command from the Settings menu
Step 1 Synchronize the measuring instrument to the same or click on the SET icon in the toolbar (figure 50).
reference used by the DUT to avoid unforeseen
wander or pointer activity due to synchronization If required, user specified frequency/amplitude combinati-
differences. ons can be used for the measurement by simply double
Step 2 Click on interface/settings in the signal structure clicking on the values to be changed or selecting one of
window (figure 49). In the interface settings dialog the pre-defined values as recommended by the standards.
box, set the clock source format provided to be Click OK to confirm entries.
connected to the reference clock in [25] interface.
Figure 49 Interface settings dialog box Figure 50 MTW settings dialog box
Use the following procedure to select the settings in the Step 1 If required, the Tx bitrate offset can be set to the
O.172 Jitter Generator/Analyzer window. maximum value allowed. An example of the signal
structure virtual instrument can be seen in figure 51.
Step 1 Select the Wander command from the TX menu in
the O.172 Jitter Generator/Analyzer window, or click
on the TX WAN icon in the toolbar.
Step 2 Select the MTW command from the Mode menu or
click on the MTW icon in the toolbar.
Figure 51 Signal Structure VI
25
Step 2 Click Start to commence measurement. Measure- Pointer wander measurement
ment stops automatically once all measurement Pointer wander is the simultaneous occurrence of mapping
points have been tested. It can also be stopped and pointer wander in synchronous network elements at
manually at any time by clicking on Stop. plesiochronous interfaces when the DUT is stimulated with
definable pointer actions at the SONET/SDH interface
Important according to G.783, T1.105.03 and GR-253. Both types of
± Measurement times may be quite long due to the wander occur only at tributary interfaces of SONET and SDH
frequency settings. network elements.
± Thoroughly check the optical level for the DUT input.
Figure 53 illustrates a typical setup to perform pointer
Interpretation of results wander measurement. Table 32 gives and overview of the
Depending on the alarm/error monitoring result, each interfaces to be used dependent on the signal under test
setting is classified as OK or Failed. and reference.
Reference
For example
TSR-37
DX
Ref. clock Tx
in [25]
Wander
Reference
[in]
Rx PDH tributary
DS1/DS3
LP filter, e.g.
DS1 ± 100 Hz
ANT-20
DS3 ± 10 Hz
Figure 53 Pointer wander measurement setup
Data Tx/Rx
Figure 52 MTW result screen electrical 622 Mpbs Rx [16]
Table 31 gives an overview of recommendations for MTW
measurement
Wander reference
ITU-T G.812. Timing requirements of SSU slave clocks
ITU-T G.813 Timing characteristics of SDH equipment slave clocks wander ref. clock up to 622 Mbps [34] or [35]
ITU-T G.823 Jitter and Wander within networks based on 2048 kbps wander ref. clock 2.5 Gbps [54]
ITU-T G.824 Jitter and Wander within networks based on 1544 kbps wander ref. clock 10 Gbps [121] or [122]
ETSI EN 302 084 The control of jitter and wander in transport networks Reference clock TX
ETSI EN 300 462-4-1 Timing characteristics of slave clocks suitable for ref. clock in [25]
synchronization supply to SDH and PDH equipment
Table 32 Interfaces to be used dependent on signal under test and reference
operation in SDH equipment
ETSI EN 300 462-7-1 Timing characteristics of slave clocks suitable for Instrument setup and application
synchronization supply to equipment in local node Follow the instrument application and setup procedure
applications under Measuring wander on page 20 and apply the
Table 31 Overview of recommendations for MTW measurements following additional steps described:
26
In order to set up pointer wander measurement, the trans- Measurement of single INC/DEC sequence for the
mitter pointer generation needs to be configured to the STS pointer
appropriate signal structure with the required sequences. The Pointer Generator enables test sequences (in accord-
The receiver must also be configured to wander measure- ance with ITU-T G.783 and ANSI T1.105.03 recommen-
ment (TIE vs. Time). dations) to be generated for AU/STS or TU/VT pointers.
Both pointers can be generated simultaneously or
Setting the transmitter independently of each other (figure 56).
To set the transmitter the different signal structures for
the interfaces at Rx and Tx must be set as applicable.
Pointer wander measurement is performed via half channel
measurement.
Figure 54 illustrates an OC-192 Tx signal being fed into a

DUT and E1 PDH signal for Rx.
Figure 54 OC-192 Tx signal being fed into a DUT and E1 PDH signal for Rx
When setting the clock source, the ANT-20 must be set to

an external clock/data signal to avoid unforeseen pointer
adjustments and wander activities in addition to the set
pointer sequence.
Step 1 Click on Settings in the Interface menu in the Signal

Structure VI.
Step 2 Select the external reference source format for
interface [25] to be used from the Clock Source box
and click OK to confirm (figure 55).
Figure 56 Pointer generator dialog box
Step 1 Click the AU/STS button in the toolbar.

Step 2 Select INC/DEC from the AU/STS Pointer box.
Step 3 Set the distance between two pointer actions in the
T2 entry box.
Step 4 Set the desired sequence length in the Mode box,
then select either single sequence or continuous
repetition.
Step 5 Click on the STS/AU ON button to activate the
pointer sequence.
For detailed descriptions of all available pointer sequences,

Figure 55 Interface settings dialog box please read part 7 Technical Background of the ANT-20
manual.
Step 3 To select a sequence, pointer generation must first
be configured.
27
To set the receiver for TIE measurement, follow the pro- consist of pointer adjustments applied at a rate exceeding
cedure described below. that of the test sequence, but lower than 3 pointer adjust-
ments per second, in the same direction as the subsequent
Step 1 In the Wander Settings dialog, set the frequency or test sequence. The initialization period should last at least
bitrate of the reference signal, connector to be used until a response is detected in the jitter/wander measured
and the sampling rate (figure 57). on the demultiplexed tributary signal For this purpose it is
recommended that a 60 second initialization period be
used.
Cool-down period
After the initialization period and in the case of single and
burst pointer tests it is recommended that a 30-second
cool-down period is allowed where no pointer activity is
present in the test signal.
For periodic test sequences (both continuous and gapped)
a 30-second cool-down period is recommended during
which the periodic sequence is applied so that a steady
state condition is maintained. If necessary, the period
Figure 57 Wander settings dialog box should be extended to include an integral number of
complete sequences.
Step 2 The low-pass filter is set automatically. For DS1
measurements, 300 samples/s (LP filter = 100Hz) Measurement Period
are required. DS3 measurements for example should During the measurement period the wander (TIE) of the
be performed with 30 samples/s (LP filter = 10 Hz). tributary output is measured. The recommended measuring
period is 100 seconds. If necessary, the period can be
Pointer sequence test procedure extended to include at least one complete pointer test
Complete test sequences for specific bitrate and pointer sequence.
sequence consist of several defined periods. In order to
prime the pointer processor and prepare the equipment for Table 33 gives an overview of recommendations covering
the test sequence, initialization and cool-down periods pointer sequence for pointer jitter/wander measurements.
must be applied prior to starting the measuring procedure.
The following sections explain the rationale for these Important
different periods. ± For reliable results the accuracy of the measurement
reference clock should be about ten times better than
the accuracy of the device under test.
Initialization Cool-down Measurement
60 s 41 period 460 s or 41 period ± If measuring optical signals make sure that the optical
time
level is in the range between ±10 and ±12 dBm.
± Make sure that you are using the recommended
INC 87-3 INC 87-3 INC 87-3 INC
sampling rate.
± For very long-term measurements it is recommended to
time
make a previous short term measurement to prevent
Figure 58 Example pointer procedure for 87-3 INC periodic test sequence ineffective use of measuring time by failures (e.g. offset,
mask exceed).
Initialization period
To ensure that wander on the demultiplexed tributary signal Interpretation of results
is nevertheless affected in the event of single and burst An overrun of the recommended masks indicates an error
sequences, it is important that pointer movements are not of the desynchronizer.
absorbed by the pointer processor.
Telcordia GR-253 (2000), SONET transport system common generic criteria
Section 5.7
For periodic sequences, the pointer processor must be in ANSI T1.105.03 (2002) SONET jitter at network interfaces
the steady-state condition it would be in if continual ITU-T G.783 (2000) Characteristics of SDH equipment functional blocks
pointer movements had been constantly present. For single Table 33 List of recommendations covering pointer sequences for pointer
and burst test sequences, the initialization period should jitter/wander measurements
28
Jitter and wander test equipment
A jitter/wander test set consists of the following functional PLL bandwidth also determines the lower limit frequency
blocks: for jitter measurement that is to say, components below
± Pattern clock converter this frequency are not detected. An external reference is
± Reference clock generator therefore used for wander measurements.
± Phase meter
± Weighting filters The voltage fluctuations at the output of the phase meter
± Peak value detector (with possible rms & phase hit are proportional to the phase fluctuations. Put another
determination). way, the output signal corresponds to the jitter/TIE vs. time
curve. Standardized weighting filters connected after this
The pattern clock converter generates the clock signal from limit the frequency spectrum of the jitter signal. The
the digital signal, with all its attendant phase deviations. positive and negative peak values of the filtered signal
This clock signal is then compared to the reference clock in are measured and displayed as the jitter result in UIpp
the phase meter provided either by the reference clock (additional alternatively RMS or PH).
generator (jitter measurement) or an external reference
(wander measurement). The filtered signal is available at a demodulator output for
further external processing. Further time and frequency
The reference clock generator provides a phase reference domain analysis of the jitter is thus possible by using an
by slowly tracking the jittered input clock with the aid of a oscilloscope, selective level meter or spectrum analyzer for
phase locked loop (PLL). The PLL has a lowpass filter with a example.
cutoff frequency in the range of 1 Hz (ANT-20: 0.1 Hz) so
that high-frequency jitter components are filtered out. The Figure 59 illustrates the principle of jitter/wander analyzers.
Output voltage proportional to

phase difference between signal clock
Clock with Jitter-free and reference clock
jitter/wander reference clock
Demodulator
output
Pattern j HP LP UIpp
Digital signal Ext.
(with jitter
and wander) Clock U
UIrms
Pattern clock Int. Phase Jitter Peak-to-peak
converter detector weighting and RMS
filters evaluation
Result
evaluation
and
display
Ext. reference LP
clock input
PLL PLL
(for wander
measurement) 10 Hz TIE MTIE
Internal Lowpass
reference clock
generation
Figure 59 Block diagram of a jitter/wander analyzer
29
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Jitter and Wander Measurement Guide

3 Jitter and wander test equipment 29

Output jitter measurement, instrument setup and Figure 3 Application manager

Peak to Peak (UIpp) jitter

ITU-T G.783 Characteristics of SDH equipment functional blocks

Peak to peak view

Figure 7 Graphical representation of output jitter result (jitter versus time)

The relationship of a typical jitter signal is described in

Here, the square root is calculated over the mean value of

Current RMS 1.00

Figure 8 Tabular view of output jitter results ± RMS

records the +/± peak, peak-to-peak or RMS value of the jitter

for long-term in-service monitoring and for troubleshooting. ±1.50

Figure 10 RMS value of random jitter

Figure 9 Graphical representation of output jitter ± RMS

Figure 12 Analysis of mapping jitter at tributary ouputs ± full channel

Display of current threshold transgression count

Phase hit measurement is interrupted and counters

The yellow warning icon indicates an

The jitter vs. time +/± peak presentation is also able to

Instrument and application setup

wide band (W) and a high band (H) filter combination of

Figure 14 Signal structure ± Tx offset

6 312 W * 1.0 n.a. - E1

Virtual Instruments (VI) required

Figure 18 PDH offset settings

For some time parameter settings, fixed relations are pre-

Pointer sequence Relations and conditions between time parameter settings

Instrument and application set-up

H 0.075 n.a. 0.075 n.a.

Appendix III of G.823 states that ª...The attenuation func-

Figure 22 MTJ Settings dialog box

Step 7 Predefinesd setting can be used or, if necessary,

Fast maximum tolerable jitter

Figure 25 FMTJ setup

Figure 26 FMTJ measurement VI

Figure 28 FMTJ result screen

Instrument and application setup

Measurement Settings Figure 31 JTF settings dialog box

Figure 30 JTF measurement VI

Step 2 In the Settling Time field, enter an appropriate

Figure 32 JTF result screen ± table format

Figure 34 Basic principle of wander measurement

Table 20 List of recommendations for jitter transfer function measurements

Figure 35 Determining TIE value

Instrument and application setup

Figure 36 Application Manager

Step 3 To define the TIE measurement setting, select TIE in

Current MTIE * and TIE values

* max. TIE value in reference to

Figure 37 TIE result screen

Step 5 Select the sample rate required. The low-pass filter

MTIE/TDEV offline wander analysis

Figure 41 MTIE analysis result screen

Wander measurement at network interfaces with

Figure 43 Wander generation with DUT

Figure 44 Wander measurement at network interfaces

Instrument and application setup

reference clock should be approximately ten times as

Wander tolerance measurement/Maximum Tolerable

Table 30 lists the recommendations for performing MTW

Figure 48 Wander tolerance measurement setup

Figure 53 Pointer wander measurement setup