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Introduction Performance characteristics Comparator Gain and Response Time Offset Cancellation Techniques Comparators with Hysteresys Latched Comparators Power Consumption
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Introduction
Denitions
A comparator detects whether its input is larger or smaller than a reference voltage
Vin Vref + Vout Vref Vin
The output of a comparator a digital signal (1 or 0 level) Overdrive If the input of the comparator is driven with a voltage larger than the minimum voltage required to achieve the correct digital level, the comparator is overdriven
Use of comparators
Threshold detector Zero-crossing detector High immunity noise digital line receiver
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Performance characteristics
Voltage gain (Av ) Differential DC gain of a comparator Input offset (Vos ) Voltage that must be applied to the input to obtain a transition between the low and the high state Response time (tr ) Time interval between the instant when a step input is applied and the instant when the output reaches the corresponding logic level (depends on the input step amplitude)
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Response Time [ns]
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Performance characteristics
Overdrive recovery Time interval required to recover from overdrive (the response time, for a given input step amplitude, depends on how much the comparator was previously overdriven)
Vov
50 40 30 20 10 0 0 20 40 60 80 Overdrive Voltage [mV] 100 120
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Performance characteristics
Latching capability A latch command and an unlatch command store and release the output logic state Power supply rejection ratio (PSRR) Transfer function between the supply rails and the output of the comparator Power consumption Power dissipated at DC (static) and during comparisons (dynamic) Hysteresis The threshold voltage for rising input signals is different from the threshold voltage for falling input signals
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1.0 0.8 0.6 0.4 0.2 0.0 tr 0 1 2 3 Time (Arbitrary Scale) 4 A v Vin
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gm vin
vin gm t = CL
tn n!
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vout / vin
3 2 n=1 1 0 0 1
n=2
n=3
2 t g m / CL
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For a small gain we achieve a smaller response time with a single stage than with several stages For a large gain we achieve a smaller response time with several stages than with a single stage n Av ,n 1 2 2 4.5 3 10.6 4 26 5 64.8 6 163 7 416 8 1067 9 2755
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Vin
+ S&H
1 Vi
+ Vos
Vout 1 2 0 T
t t
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sT 2
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During phase 1 the gain stage is in unity-gain closed-loop conguration and Vos is sampled on capacitor C During phase 2 the gain stage is in open-loop conguration and the offset-free comparison is performed Capacitor C represents an output load of the gain stage during phase 1 Stability of the gain stage during phase 1 has to be considered
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Cc
With the autozero technique the comparator can only detect zero-crossing
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The offset is canceled and the input voltage of the comparator during the comparison phase becomes V+ V = (Vin Vref ) + Vos,res The comparator operates with the same input common-mode voltage independently of the value of Vref
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The gain of the comparator is Av = Av ,1 Av ,2 Av ,n The offset of the third stage is referred to the input attenuated by the factor Av 1 Av 2 It is negligible The input referred offset without autozero is Vos = Vos,1 + 1 Vos,2 Av ,1
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The clock feedthrough at the opening of S1 and S2 determines two equivalent offset errors at the input of A1 and A2 (Vos,ck,1 and Vos,ck ,2 ) Vos,res = Vos,2 1 1 + Vos,ck ,1 + Vos,ck ,2 Av ,1 (1 + Av ,2 ) Av ,1
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S1 is driven with phase 1, while S2 and S3 with phase 1d The charge injected by S1 is collected on C1 and the equivalent offset is amplied by Av ,1 , but since S2 is still on, the output voltage of A1 is sampled and stored onto C2 Vos,1 and Vos,ck ,1 are completely canceled, while Vos,2 and Vos,ck ,2 are referred to the input attenuated by a factor Av ,1 Vos,res = Vos,2 1 1 + Vos,ck ,2 Av ,1 (1 + Av ,2 ) Av ,1
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Vin 2 1
C1 1
M2 C2 1
M4
M6
M8 Vout M7
M1
M3
M5
During the autozero phase M1 , M2 , M3 and M4 are diode-connected The current consumption is not controlled Large W /L for M1 , M2 , M3 and M4 Fast inverters with large transconductance Low response time but large power consumption
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1 Vin+ Vin 2 2 1
S1 C + C 1 S2 1 Vout Vout+
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IBias
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VB1
M3 M1
M4 Vout M2
Vin VB2
M5 M6 M7
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M3 VB1 M1
M4
M7
Vin
M2
M5 VB2
M6
M8
M12
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If S1 is opened while S2 is still closed, the additional offset caused by the clock feedthrough from S1 is attenuated by a factor 1/ (1 + Av ,2 ) When S2 is opened the clock feedthrough produces an equivalent input referred offset Vos,az on Caz , which referred to the input becomes Av ,2 Vos,ck = Vos,az Av ,1 If Av ,1 is larger than Av ,2 , then Vos,ck is reduced (optimal choice is Av ,2 = Av ,1 )
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VB1
M3 M1
M4 Vout
Vin VB2
M2
M6
M7
Vin, aux
M5
Av ,1 gm1,2 = Av ,2 gm6,7
M8
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Vref,L
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Vref,H
Vin
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M8
M6 Vout M2 Vin
Vref
M1
VB2 M9
VB1
M5 M7
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Transistors M10 and M11 create a positive feedback loop that, besides introducing hysteresis, makes the response time of the comparator faster
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Latched Comparators
In latched comparators, comparison is performed at given time instants (controlled by the Latch signal) and the result is maintained until the next comparison is performed Latched comparators are typically used in sampled-data systems (e.g. data converters), where the latch signal is the clock A latched comparator consists of a gain stage followed by a latch stage and eventually a set-reset ip-op to hold the output signal while the latch is reset (Latch signal) The latch stage is based on a positive feedback loop Very fast response time
In
Gain Stage
S R
Set-Reset Flip-Flop
Out
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Latched Comparators
Simple latch stage
VB Vout Vin+ M1 Latch M7 M5 M6 M2 M3 M4 Vout+ Vin
During the reset phase (Latch) M1 , M3 and M2 , M4 form two inverters with active load The parasitic capacitances at nodes Vout+ and Vout are precharged to the desired logic signals
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Latched Comparators
During the latch phase (Latch) the positive feedback is enabled and the latch reaches a stable state The state of the latch depends on the logic level precharged in the parasitic capacitances Thanks to the regenerative behavior of the positive feedback loop the response time is very short even with small input signals The offset of the latch cannot be canceled with autozero or auxiliary stages To reduce the offset transistors M5 and M6 must have relatively large area (WL) Speed limitation Since the latch is reset before each comparison overdrive recovery is not an issue
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Latched Comparators
Differential stage with regenerative load
Latch M3 Vout Vin+ VB M1 M5 M2 M6 M4 Vout+ Vin
The input signal unbalances the currents owing in M1 and M2 When the Latch signal is applied, in the regenerative loop (M3 and M4 ) the transistor with the largest current wins
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Latched Comparators
Latch stage with double regenerative loop
Latch Vout Latch M5 M6 M7 M8 M9 M10 Latch Vout+ Latch
Vin+ M1
M2
M3 M4
Vin
Double positive feedback loop Fast response One positive feedback loop strengthens the other
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Latched Comparators
Combination between gain stage and latch
VB2 M3 M4 Vout Vout+ Vin Vin+ Latch VB1 M5 M9 M8 Latch M1 M2 M6 M7
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Latched Comparators
Complete latched comparator
Latch
M20 VB
M3
M4
M10
M11
M12
M13
M14
M15
M1 Vin
M2 Vin+
M5 Latch M7
M6 M16 M17
M8
M9
M18
Gain Stage
Set-Reset Flip-Flop
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Power Consumption
Comparator with two gain stages, autozero and latch
2 Vin 1 Vi
1 A1
+
Cin
A2 C1
+
gm,1 Vi
gm,2 Vo
C2
The voltage at the output of the rst stage is Vo (t) = gm,1 C1 gm,2 C2
t
Vin (t) dt
0
Vout (t) =
Vo (t) dt
0
Latch
Vo
Vout
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Power Consumption
For constant or slowly varying signal at the end of the comparison phase (/fck ) the output voltage Vout is Vout fck = 1 gm,1 gm,2 Vin 2 C1 C2 fck
2
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Power Consumption
If the input voltage of a gain stage exceeds the critical value Vcrit = nkT /q or Vcrit = (VGS Vth ) /2, the output current saturates to the maximum value Imax = 2ID To achieve a given value of Vout the current in the second stage must be Vout C2 fck ID,2 > 2 The current in the rst stage can be obtained from ck gm,1 > Vcrit C1 f , Vin,min < Vcrit Vin,min I > D,1
Vcrit C1 fck 2
The obtained values of ID,1 and ID,2 lead to the minimum theoretical value of the comparator power consumption In practical designs a safety margin has to be considered
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References
Main textbook
F. Maloberti, Analog Design for CMOS VLSI Systems, Springer-Verlag, 2001.
Other references
B. Razavi, Design of Analog CMOS Integrated Circuits, McGraw-Hill, 2001. D. Johns and K. Martin, Analog Integrated Circuit Design, Wiley, 1997. W. Sansen, Analog Design Essentials, Springer-Verlag, 2006. P. Allen and D. Holberg, CMOS Analog Circuit Design, Oxford University Press, 2002.
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