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Agilent Medalist 3070 Software Release 05.

40pb Release Notes


Medalist 3070 Software Release 05.40pb
The new Agilent Medalist 3070 In-circuit test 05.40pb release will improve stability and quality of the software. More than 60 customers requests that contain defects and enhancements are enhanced as shown in the Appendix A. New features are included in this release.

Whats New in Medalist 3070 Software Release 05.40pb?


This latest software release 05.40pb has the following new features and benefits: Latest Features iYET : intelligent Yield Enhancement Test ScanWorks 3.7 Quick Overview A dynamic re-test strategy that automatically re-tests failing unpowered tests IEEE 1149.6 is fully supported on ScanWorks 3.7 software Benefits Higher throughput Fewer false calls Fewer escapes A complete boundary scan solution to resolve the testing capabilities of AC-coupled differential signals and advanced I/O Get firewall protection from startup to shutdown Take control of security settings Help protect PC from harmful attachments

Medalist 3070 Software 05.40pb on Windows XP Service Pack 2 (SP2)

05.40pb will be supported on Windows XP service Pack 2 with advanced security technologies to protect PC against virus, hackers and worms

Note: * Windows is a U.S. registered trademark of Microsoft Corporation.

Important Notes for Medalist 3070 Software Release 05.40pb Customers: Compatibility Statement
On a system updated to revision 05.40pb software, various files in board directories will automatically be modified for compatibility the first time they are accessed. Revision 05.40pb is fully compatible with version 05.32pX but a system loaded with a revision prior to 05.32pX (e.g., 05.2X, 04.XX, B.03.XX) cannot be used to develop or run board directories that have been developed or run on a 05.40pb system. However, a 05.40pb system can be used to develop and run board directories that have been developed or run on a system with a revision prior to 05.40pb.

System Requirements
The minimum hardware and software requirements to install Agilent Medalist 3070 software release 05.40pb on your desktop or notebook PC are as follows: Platform: Windows XP Professional SP2 Hardware: Recommended RAM - 512 MB Minimum Disk Space 1 GB Other: Screen resolution minimum - 1024x768 Anti-Virus and Firewall software are recommended to be installed

Availability
The Agilent Medalist 3070 software release 05.40pb will be shipped to customers who are on the Agilent software update services contract. New 3070 systems will be shipped with 05.40pb in the fall of 2006.

Appendix A Improvement of Medalist 3070 Software Release 05.40pb based on customers requests:
Description Change Request Identification

BSDL package file STD_1149_6_2003 now contains compatible syntax with Asset. T313 Control Card timeout (psync) no longer occurs on first run of TestJet testing. Installation of 3070 TDW software no longer disables CAMCAD license. Compilation of a STAPL file using PLD ISP, when the DRSCAN command is directly using ACA data, no longer reports any errors. Issue with Xvision displaying a license dialog error message for no apparent reason has been resolved. Service Documentation N1161A has been updated. Probe select will allocate 50-Mil probes or 39-Mil probes correctly based on clearance. Site Prep manual on 3PY power configuration has been updated. The dissipation specification has been corrected to show 37000 BTU for a 4-module Series II or Series 3 system in Site Prep manual. RS232 Input buffer now flushes out when BT-Basic commands are executed. The user manual has been edited to eliminate the non-working option from the BT-Basic command description: "topology node data$". Boundary Scan tests (.vcl files) with colon (:) format are now converted correctly. SYNC port no longer triggers unexpected pulse during first TestJet test. Flash Programming Guide has been updated in user documentation [chapter 7]. TestPlan PSLIMIT algorithm has been corrected for parallel DUT power supplies. Flash Programming Guide has been updated in user documentation [chapter 6]. IPG generation on X-Tree device no longer causes "Internal error 125/204/110 " The user manual has been edited for correct syntax under syntax reference topology device data. Java Version V1.4.0_01 has been included in this release. Fixture keep-out now works correctly during probe selection for transfer pin assignments. 3070 TDW is now supported on Windows XP The Flash70 compiler no longer gives a misleading warning (DGC447) when flash is enabled without date block. Compilation of large jam files like pld isp' no longer generates internal error /95/159/11 and DGC159.

CR13176 CR13647 CR13778 CR14451 CR14991 CR15060 CR15218 CR15480 CR15802 CR15840 CR15905 CR16234 CR16357 CR16481 CR16500 CR16513 CR16515 CR16857 CR17072 CR17213 CR17214 CR17423 CR17574

ScanWorks is now optional during Installation. The F10, F11 or <Delete> keys now work properly on 3070 PC platform during the execution of the BT-Basic SoftKey commands. Redundant error messages for a failing test with delay for cooling have been removed. Updated error message to reflect more explicit statement when compiling an unsupported JAM instruction. Foot switch now sends "start" command when using the OIL(Operator Interface Localization). Internal error issue has been resolved during compilation of a Silicon Nails test. Issues with additional spaces while using Xilinx SVF files have been fixed. Autodebug for panelized board no longer encounters: R160 Array not dimensioned at line 1284. Syntax checker is fixed for "no fill" as an eod statement option. Agilent SPD (Scan Port Driver) tool is now generating correct pattern for Parallel Toggle test. System Diagnostics should now test all 4 modules in parallel. Qstats "histogram" report showing for mean, standard deviation, Cpk, etc. can now be saved and printed. Using a BT-Basic "image" statement with the bit spec "b now works correctly for either input or output. Internal error -11 message will no longer occur when 40 character node names are used in short tests. Internal error -11 messages will no longer occurs while generating short tests using IPG Test Consultant. Coverage Analyst now includes Board Test Grader quality information for panelized boards. Diagnostics now able to detect a short between adjacent mint pins on an AnalogPlus card. Pushbutton Q-stats histogram report now supports 10 windows. Problem with closing Q-stats histogram windows has been resolved. The IGNCR register 1 setting for RS232 now works on the PC platform. The ONLCR and ONOCR register 2 settings for RS232 now works on the PC platform. 3070 User Documentation syntax reference has been updated. \ causing R32 Software internal error 20755 " in BScan Interconnect test has been resolved. BSDL compiler now supports IEEE 1149.6 attributes. Error message: "S594 "end/display/highlight" expected." has been updated. NIST cal program front page now has additional information about the calibration.

CR17678 CR17827 CR18350 CR18455 CR18478 CR18550 CR18607 CR18680 CR18698 CR18847 CR18964 CR19033 CR19689 CR19722 CR19723 CR20653 CR20796 CR20862 CR20869 CR20886 CR20887 CR21832 CR21920 CR21932 CR21990 CR22016

Probe Selection (fixture component) algorithm is corrected in Test Consultant to handle cases where two probes are located very closely. VTEP errors with inaccessible pins have been fixed. Silicon nails using 200n/100n vector timings are now transferred over from custom lib to vcl tests. Auto Silicon Nails no longer wrongly assigns non-digital nodes as inputs in ITL file. Conversion Tools now handles symbolic links for panelized board. The user manual has been updated to reflect the correct arguments for call statements to test subroutines [chapter 1]. ERROR PDF140 no longer occurs when compiling board_xy for panel. Running IPG no longer generates "Internal Error -11" when on a Boundary Scan Chain.

CR18193 CR22049 CR22168 CR22171 CR22204 CR22220 CR22227 CR22274

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