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A novel X-ray diffraction technique (XAPS) was successfully applied to CL-20 powders. The effects of synthesis, grinding, and static loads on the extent of microstrain and defect development in CL-20 particles were quantitatively determined. The greater half-width values observed for the samples subjected to grinding and static loads indicated greater microstraisi and defect density.
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Originaltitel
R. Yazici and D. Kalyon- Microstrain and Defect Analysis of CL-20 Crystals by Novel X-Ray Methods
A novel X-ray diffraction technique (XAPS) was successfully applied to CL-20 powders. The effects of synthesis, grinding, and static loads on the extent of microstrain and defect development in CL-20 particles were quantitatively determined. The greater half-width values observed for the samples subjected to grinding and static loads indicated greater microstraisi and defect density.
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A novel X-ray diffraction technique (XAPS) was successfully applied to CL-20 powders. The effects of synthesis, grinding, and static loads on the extent of microstrain and defect development in CL-20 particles were quantitatively determined. The greater half-width values observed for the samples subjected to grinding and static loads indicated greater microstraisi and defect density.
Copyright:
Attribution Non-Commercial (BY-NC)
Verfügbare Formate
Als PDF, TXT herunterladen oder online auf Scribd lesen