Beruflich Dokumente
Kultur Dokumente
References
LeCroy, Tektronix, Bertscope J. Hancock, Jitterunderstanding it, measuring it, eliminating it Part 1-3, From 2004 High Frequency Electronics A. Kuo etc. Jitter models and measurement methods for high-speed serial interconnects S. Tabatabaei etc, Jitter generation and measurement for test of multi-GBPS serial IO
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Outline
Introduction
Eye diagram What is jitter? Phase noise, spectrum vs. jitter Why is jitter important? What causes jitter?
Jitter fundamentals
Jitter components Jitter measurement views
Eye pattern
A very effective method of measuring time distortion thru a data transmission system is based on the eye pattern, displayed on an oscilloscope. The eye pattern is simply the superposition - over one unit interval of all the ZerotoOne and Oneto-Zero transitions, each preceded and followed by various combinations of One and Zero, and also constant One and Zero levels. The data sequence can be generated by a pseudo-random sequence generator (PRSG), which is a digital shift register with feedback connected to produce a max length sequence.
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Timing skew
Jitter
Voltage offset
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What Is Jitter?
Jitter: The deviation of the significant instances of a signal from their ideal location in time. Or simply, Jitter is how early or late a signal transition is with reference to when it should transition. The significant instances are the transition (crossover) points in a digital signal. Jitter is closely related to phase modulation.
S(t) = P 2 f t + (t) d
)
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What Is Jitter?
Phase noise can be analyzed from many points of view: It can be understood as - phase variation (phase noise) - timing variation (time shift of edges)
[seconds] mostly used, intuitive system description, independent of data rate.
(t )
t = 1 2 f d
t T
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Jitter causes transmission errors or in another wording: Jitter limits the transmission speed. Satisfy jitter budget BER (bit error rate) target Identify jitter components diminish/decrease deleterious effects on circuit performance from jitter Jitter limits the ability of A/D converters!
Note:
Bit errors can also be caused by voltage noise: If the momentary noise voltage exceeds the noise margin, a wrong value can be sampled even if the sampling takes place at the correct moment in time.
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Jitter applications
Signal jitter: Timing of a signal (topic of this presentation)
Jitter transfer: How strong, as a function of the jitter frequency, a jitter at an input is transmitted to an output in e.g., by a clock recovery circuit
Jitter tolerance: How much jitter, as a function of the jitter frequency, can be tolerated by a system
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Jitter is not a main system property, but Bit Error Rate (BER) is. Why not measuring BER directly?
BER measurement might take hours or days. BER gives little information about the mechanism that cause errors, but jitter does.
Signal
Ideal clock
1101001
Degraded
Noisy clock
1101101
Bit errors can also be caused by voltage noise: If the momentary noise voltage exceeds the noise margin, a wrong value can be sampled even if the sampling takes place at the correct moment in time.
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Types of Jitter
Data-Correlated
Data-Uncorrelated
Total Jitter (TJ) Deterministic Jitter (DJ) Data Dependent Jitter (DDJ) Inter-symbol Interference (ISI) Duty Cycle Distortion (DCD) Random Jitter (RJ)
Periodic Jitter PJ
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Types of Jitter
Jitter can be random or deterministic. In most cases, both types occur. PJ: Periodic Jitter (deterministic). Is a periodic variation in the phase. Causes: External coupling into the circuit, power supply noise, PLL comparator frequency feed-through RJ: Random Jitter Random changes in the phase. It is often assumed to be of Gaussian distribution. Causes: Thermal Noise, Shot Noise
Types of Jitter
Jitter can be random or deterministic. In most cases, both types occur. DCD: Duty Cycle Distortion (deterministic). Is the difference in the mean pulse width between positive and negative pulses in a clock. Causes: Amplitude offset, turn-on delay, saturation. ISI: Inter-Symbol Interference (deterministic) Previous signals have not rang down, before new data arrives. Causes: Impulse response is longer than a data bit.
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P[sin(2 ft )]
Phase modulated clock
P[sin(2 ft ) + 0.04 sin(0.2 ft ) / 3]
P[0.04 sin(0.2 ft ) / 3]
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f=1 GHz
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Square wave
70 60 50 40 30 20 10 0 0 .2 0 .4 0 .6 0 .8 1 1 .2 1 .4 1 .6 1 .8
F re q u e nc y (G H z)
8 0
6 0 4 0
Phase modulated
EMC symposium 2006, Portland Aug. 14-18, 2006
2 0
0 0 .6 0 .8 1 1 .2 1 .4 1 .6
F re q u e n c y (G H z)
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If the trigger point is 7 sigma away from the mean event, only 1 in 10e12 crossings will occur even beyond the trigger point.
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Time interval error and jitter trend (integral of time interval error)
What does it mean if the jitter trend is continuously increasing over time?
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Time interval error and jitter trend (integral of time Histogram in A Square Wave interval error)
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Channel Characteristics
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Channel Characteristics
Loss, reflections, S21 cross talk, added white noise, time variations
frequency Power
Frequency
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In
Out
Tx symbol 000010000000
Pulse response
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Tx symbol 000010011100
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Sampling oscilloscope
Spectrum Analyzer
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Timing Measurements:
Data: Time Interval Error (TIE), also called phase jitter. Clock: Period, Cycle-to-cycle. Eye diagrams (repetitive volts vs. time) Trend (time error vs. time) Histograms (hits vs. time error) Spectrum (time error vs. frequency) Bathtub curves (BER vs. eye opening) Phase noise
Views:
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TJp-p = N x rms + DJ
As mentioned on slide 11, RJ measurements must be decomposed from DJ components for total jitter estimation. Separating jitter components individually to diagnose root causes of jitters for further reducing TJ to meet jitter budget in systems. Probability density Function (PDF) of jittering edge timing
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Decomposition of jitter into Total Jitter (TJ), Random Jitter (RJ), Deterministic Jitter (DJ), Periodic Jitter (PJ), Data Dependent Jitter (DDJ), Duty Cycle Distortion (DCD), and Jitter induced by Inter symbol Interference (ISI) Jitter frequency spectrum
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Corrupter
Threshold
TIE trend
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Device noise (Shot noise, Thermal noise, and pink noise) RJ Power supply noise (RJ, PJ) Duty-Cycle Distortion DCD On-chip coupling BUJ
EMC symposium 2006, Portland Aug. 14-18, 2006
Device noise (Shot noise, Thermal noise, and pink noise) RJ Power supply noise (RJ, PJ) Duty-Cycle Distortion DCD On-chip coupling BUJ Mismatch terminations ISI
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