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Devika Laishram
Basic concept
Source What kind of probe is used? How does the probe reach the sample? Interaction between probe and sample How does the signal of interest reach the analyzer? Characteristics of the analyzer
Source Interaction Analyzer
Sample
Heat* A field*
DIFFRACTION
Diffraction is a wave phenomenon in which the apparent bending and spreading of waves when they meet an obstruction. Diffraction occurs with electromagnetic waves, such as light and radio waves, and also in sound waves and water waves.
The most conceptually simple example of diffraction is double-slit diffraction, thats why firstly we remember light diffraction.
Width b Variable (500-1500 nm) Wavelength Constant (600 nm) Distance d = Constant
Basic Idea!
The general principles will be the same for each type of waves.
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Diffraction Methods
X-Ray Neutron Electron
= 1A
E ~ 0.08 eV interact with nuclei Highly Penetrating
= 2A
E ~ 150 eV interact with electron Less Penetrating
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Electron Diffraction
Electron diffraction has been used in the analysis of crystal structure. The electron, like the neutron, possesses wave properties;
2A
Electrons are charged particles and interact strongly with all atoms. So electrons with an energy of a few eV would be completely absorbed by the specimen. In order that an electron beam can penetrate into a specimen , it necessitas a beam of very high energy (50 keV to 1MeV) as well as the specimen must be thin (100-1000 nm)
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Electron Diffraction
If low electron energies are used, the penetration depth will be very small (only about 50 A), and the beam will be reflected from the surface. Consequently, electron diffraction is a useful technique for surface structure studies. Electrons are scattered strongly in air, so diffraction experiment must be carried out in a high vacuum. This brings complication and it is expensive as well.
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Electron diffraction
Electron beam impinges on surface of a crystal low energy electron diffraction diffracts from surface. Acts as wave. Measurement determines momentum eigenstates.
out going waves many grating different directions different spacings Peaks line up. Constructive interference.
Instrumentation
Electron gun produces focused e- beam 10 nA-10 mA E 20-200 eV. Magnetic shield expels residual magnetic fields. Sample positioned at "focus" of hemispherical grids. Diffracted electrons (elastically scattered) and secondary electrons (inelastically scattered) backscattered towards LEED optics in field free region. Diffracted electrons - spots Secondary electrons diffuse background After passing through G1 (ground) accelerated towards phosphor screen. Negative potentials applied to G2 and G3 to repel secondary electrons. Electrons strike phosphor photons. Front-view LEED & rear-view LEED. Image captured on photographic film or video camera.
LEED patterns
From the position of the diffracted beams, the 2D periodicity of the surface unit cell may be deduced as well as variations in the unit cell size induced by adsorption. From the variation of spot intensities with beam energy, the complete surface geometry, including bond lengths and angles, can be obtained.
Si(111) 7 X 7 LEED Pattern
LEED is the principal technique for the determination of surface structures. It may be used in one of two ways: Qualitatively : where the diffraction pattern is recorded and analysis of the spot positions yields information on the size, symmetry and rotational alignment of the adsorbate unit cell with respect to the substrate unit cell.
Quantitatively : where the intensities of the various diffracted beams are recorded as a function of the incident electron beam energy to generate so-called I-V curves which, by comparison with theoretical curves, may provide accurate information on atomic positions.
When electron beam diameter is larger than domain size on surface: the presence of multiple (rotational) domains increases complexity of diffraction pattern. Two domains in real space
Change energy record intensity curve as its function for certain individual spots. (another method is with fixed energy but varied incidence angle).
Structure analysis
Calculation of amplitude (A) and phase (d) due to (a) ion core scattering (b) multiple scattering (c) inelastic events (d) surface vibration (effect of temperature)
RHEED
A TYPICAL SETUP IS SHOWN ON THE PREVIOUS SLIDE. HIGH ENERGY ELECTRONS ARE SENT AT GRAZING ANGLE TO THE SURFACE AND SCATTERS ONTO A SCREEN. AGAIN A PATTERN IS OBTAINED ON THE SCREEN THAT REFLECTS SURFACE SEGMENTS WHEN IT COMES TO DETERMINING ATOMIC STRUCTURE VERY FEW STUDIES ARE PRESENTED THE BIG ADVANTAGE IS THE GRAZING ANGLE THAT LEAVES THE SURFACE FREE FOR EVAPORATORS
Instrumentation of RHEED
A sample holder with the prepared sample. An electron gun-The electron gun generates a beam of electrons which strike the sample at a very small angle. Photo-luminescent detector screen- which collect the diffracted electrons & form the regular pattern on the screen. although modern RHEED systems have some additional parts to optimize the technique.
Figure:- The most basic setup of a RHEED system.
a) GaAs(100) - 1x1
b) GaAs(100) - 2x1
Different stages of layer-by-layer growth by nucleation of 2D islands and the corresponding intensity of the diffracted RHEED beam.
(a) Transmission through high and wide crystal; (b) Transmission through high and narrow crystal; (c) Transmission through short and wide crystal; (d) Diffraction from nearly flat asperities.
In LEED low energy electrons provide large elastic scattering cross-section for back-scattered electrons with short penetration depth. In RHEED high energy electrons provide large elastic scattering cross-section for forwardscattered Electrons with grazing incidence to keep short penetration depth. RHEED: theory less well developed than LEED, includes many more multiple scattering events and many more inelastic events; The quantitative RHEED usually not performed. Diffraction pattern: streaks; sensitive to roughness, surface must be very flat. LEED: theory well developed and can do quantitative analysis. Gives information not only in-plane but also out-of-plane. Diffraction pattern: spots.
EXPERIMENTAL DATA
Range of elements
Destructive
LEED
RHEED
All
No, except in special cases of electron-beam damage. 4-20. 0.1ML; atomic positions to 0.1 . Typically 200; best systems 5mm Typically 0.1mm; best systems ~10mm.
All
Same as LEED.
2-100 . Same as LEED. Same as LEED. 200mm x 4mm; best systems 0.3nm x 6 nm.
Imaging capability
Main uses
No.
Monitoring surface structure, in-situ growth .
Thank You!