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Pareto Analysis is used to record and analyse data relating to a problem in such a way as to highlight the most significant areas, inputs or issues. Pareto Analysis often reveals that a small number of failures are responsible for the bulk of quality costs, a phenomenon called the Pareto Principle. This pattern is also called the 80/20 rule and shows itself in many ways. For example: 80% of sales are generated by 20% of customers. 80% of Quality costs are caused by 20% of the problems. 20% of stock lines will account for 80% of the value of the stock. A Pareto diagram allows data to be displayed as a bar chart and enables the main contributors to a problem to be highlighted. As a basic Quality Improvement tool, Pareto Analysis can: define categories of defects which cause a particular output (product, service, unit) to be defective; count the frequency of occurrence of each defect; display graphically as a bar chart, sorted in descending order, by frequency of defect; use a second y axis to show the cumulative % of defects .
Pareto Analysis
Examples
When possible, use Minitabs version, as an industry standard, rather than creating one in Excel - refer to Example 1 in this section Use a series of Pareto charts to drill down to more detail - Example 2 Recognise the 80: 20 principle but if the original Pareto is very flat be prepared to cut the defects in a different way, say 40:60 - Example 3 Minitab gives an extra dimension to Pareto Analysis - Example 4
Pareto Analysis
600 500
300
20 0
Defect
Count Percent Cum %
23 23
22 45
11 56
8 65
4 68
3 71
3 75
3 77
3 80
3 83
3 85
2 87
2 89
2 91
2 92
1 94
1 95
95 100
Pareto Analysis
Percent
Count
400
40 30 20 10 0
1st level Analysis gives Design as main cause of failure 2nd level Analysis gives breakdown of Design
Defect
Count Percent Cum %
57 75.0 75.0
13 17.1 92.1
4 5.3 97.4
2 2.6 100.0
Design Faults
100 50 80 40
Percent
Count
Count
60 30 20 10 0 40 20 0
ec nn Co t le du Mo e r qu To tor Mo s ld Co rt Sta n Tra u sd od rM ce ule IC AS n atio libr Ca IOP n Imo
Defect
Count Percent Cum %
21 36.8 36.8
10 17.5 54.4
8 14.0 68.4
8 14.0 82.5
5 8.8 91.2
3 5.3 96.5
2 3.5 100.0
Pareto Analysis
Percent
Defect
Count Percent Cum %
18 7.6 7.6
13 5.5 13.0
11 4.6 17.6
11 4.6 22.3
11 4.6 26.9
10 4.2 31.1
9 3.8 34.9
9 3.8 38.7
8 3.4 42.0
At first glance, this looks unhelpful. But of 238 data points, most were counts of 1 or 2. A full Pareto would be very flat. Therefore after the first cumulative 42% of defects (100) , the balance of defects (138) are blocked together as others. This enables us to see that a top 9 of defects can be analysed - most are S-clip problems (links between ICs and PCB)
Pareto Analysis
Percent
Count
Evening
Scratch
Count
10
Count
Peel 10
5 Other
Night
15 Count 10 5 Count 15 10 5
Weekend
Smudge
Pareto Analysis
References
ASG aTQ training module 7.4 : Measure /Analyse - Pareto & CauseEffect Revisited
Pareto Analysis