Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

Anand K Bewoor & Vinay A Kulkarni

PROPRIETARY MATERIAL. 2009 The McGraw-Hill Companies, Inc. All rights reserved. No part of this PowerPoint slide may be displayed, reproduced or distributed in any form or by any means, without the prior written permission of the publisher, or used beyond the limited distribution to teachers and educators permitted by McGraw-Hill for their individual course preparation. If you are a student using this PowerPoint slide, you are using it without permission. 1

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Chapter 17

Force and Torque Measurement

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Force and torque instruments measure the real strength of the entity under test..
INTRODUCTION TO FORCE AND TORQUE MEASUREMENT Force and torque instruments are used to measure force, weight or torque. Some can measure force and torque by changing the sensor/transducer. Force or weight measurements include tension or compression loading; and the units are pounds, Newtons, etc. Torque measuring instruments display torque units (in-oz, ft-lbs, etc.).

Important parameters to consider when specifying force and torque instruments are the force measurement range and accuracy, and the torque measurement range and accuracy. Sensor or transducer interfaces for force and torque instruments include strain gauge and piezoelectric devices. For strain gauge devices, strain gauges (strain-sensitive variable resistors) are bonded to parts of the structure that deform when making the measurement. These strain gauges are typically used as elements in a Wheatstone bridge circuit, which is used to make the measurement. For piezoelectric devices, a piezoelectric material is compressed and generates a charge that is measured by a charge amplifier. The analog bandwidth is another important specification to consider. The bandwidth is the frequency range over which the device meets its accuracy specifications. Accuracy is degraded at lower and lower frequencies unless the device is capable of dc response, and at higher frequencies near resonance and beyond, where its output response rolls off. Frequencies in the database are usually the 3-dB rolloff frequencies.
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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Common configurations for force and torque instruments include handheld, portable, modular and battery-powered instruments. Measurement features of force and toque instruments include tare, limits or set points, peak hold, controller functionality, temperature compensation, biaxial measurement, and triaxial measurement. Units with tare can zero out reading to measure differences for weighing. Limits and set points include hilo. Peak hold shows or holds a peak measurement value. Controller functions in clude set limits, regulator, P/PI/PID, etc. Instruments with temperature compensation have software or adjustments for compensating for variations in temperature that may cause measurement errors. Force and torque instruments with biaxial measurement have an accelerometer capable of measurement along two, usually orthogonal, axes. Force and torque instruments with triaxial measurement have an accelerometer capable of measurement along three, usually orthogonal, axes. Force and torque instruments usually have displays for users to interface with the unit. Common types of displays include analog or dial displays, digital readouts, and video displays. Programmability is achieved through manual operation, front panels, or computer interfaces. Instruments with software support have software specifically for running on a host computer, which can be a PC or MAC. Advanced searching capabilities for force and torque instruments include outputs, digital resolution and sampling frequency. General features found on force and torque instruments include filters, event triggering, built-in self-calibration, self-test diagnostics, and extreme environment construction. Force and torque instruments often come with data storage in nonvolatile memory, hard drives or removable storage. Very often these instruments are also compatible on a network.
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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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Anand K Bewoor & Vinay A Kulkarni

METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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METROLOGY & MEASUREMENT

2009 Tata McGraw-Hill Education

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