Dwi Marta Nurjaya

Grain size: the dimensions of the grains or crystals in a polycrystalline

metal exclusive of twinned regions and sub-grains when present. Grain size is usually estimated o r measured on the cross section of an aggregate of grains Common units are: 1. average diameter, 2. average area, 3. number of grains per linear unit, 4. number of grains per unit area, and 5. number of grains per unit volume.

ASTM grain size number : a grain size designation bearing a relationship to average intercept distance at 100 diameters magnification according to the equation: G = ASTM grain size number = 10.0 2 log2 L ,
Where, L Is the average intercept distance in millimeters at 100X magnification.

Average grain diameter : the mean diameter of an equiaxed grain section whose size is representative of all the grain sections in the aggregate being measured.

NAE = 2
where, G = ASTM grain size number

G-1

NAE = number of grains per square inch at 100X magnification.

1 = = = = ()
1 2

1 = = = = ()
1 2

 Comparison Method Planimetric Method

Intercept Method

 The comparison method does not require counting of either grains,

intercepts, or intersections but, as the name suggests, involves comparison of the grain structure to a series of graded images, either in the form of a wall chart, clear plastic overlays, or an eyepiece reticle.

An eyepiece reticles Note : Use only with a 10X objective

 When grain size estimations are made by the more convenient comparison method,

repeated checks by individuals as well as by interlaboratory tests have shown that unless the appearance of the standard reasonably well approaches that of the sample, errors may occur. To minimize such errors, the comparison charts are presented in four categories as follows:
1. Plate IUntwinned grains (flat etch). Includes grain size numbers 00, 0, 12, 1, 112, 2,

212, 3, 312, 4, 412, 5, 512, 6, 612, 7, 712, 8, 812, 9, 912, 10, at 100X. 2. Plate IITwinned grains (flat etch). Includes grain size numbers, 1, 2, 3, 4, 5, 6, 7, 8, at 100X. 3. Plate IIITwinned grains (contrast etch). Includes nominal grain diameters of 0.200, 0.150, 0.120, 0.090, 0.070, 0.060, 0.050, 0.045, 0.035, 0.025, 0.020, 0.015, 0.010, 0.005 mm at 75X. 4. Plate IVAustenite grains in steel (McQuaid-Ehn). Includes grain size numbers 1, 2, 3, 4, 5, 6, 7, 8, at 100X.

These suggestions are based upon the customary practices in industry

 Look at a properly etched microstructure, using the same magnification

as the chart, and pick out the chart picture closest in size to the test specimen. If the grain structure is very fine, raise the magnification, pick out the closest chart picture and correct for the difference in magnification according to:

G = Chart G + Q Q = 6.64 Log10(M/Mb)

Where: M is the magnification used and Mb is the chart magnification

 Also known as Grain Counting Method or Jeffries Method In the planimetric procedure inscribe a circle or rectangle of

known area (usually 5000 mm2 to simplify the calculations) on a micrograph, a monitor or on the groundglass screen of the metallograph. Select a magnification which will give at least 50 grains in the field to be counted.

1. Inscribe circle of known area, A, on a image with

magnification, M
2. Count the number of grains are completely within the area,

Ninside
3. Count the number of grains are partially within the area,

Nintercept,
4. Use the Jeffries formula and G formula to find the Grain

size number

 =
NA
f

+ 2

= number of grain per mm2

= Jeffries Multiplier

Ninside = number of grains inside the test circle Nintercept = number of grains that intercept the test circle

Ninside Nintercept

= 68 = 41

Jeffries Multiplier = (1002)/5000 = 2.0

= 2

41 68 + 2

= 177 grains/mm2
= 3.322 log 10 2.954 = 4.51

 Also known as Heys/Hilliard/Abrams Intercept Methods Intercept Methods are more convenient to use than the planimetric

methods.
These methods are amenable to use with various types of machine

aids.
Intercept procedures are recommended particularly for all structures

that depart from the uniform equiaxed form.

There is no direct mathematical relationship between the ASTM grain

size number, G, and the mean lineal intercept, unlike the exact relationship between G, NAE , NA and A, for the planimetric method

 Apply a test line over the microstructure and count the number of grains intercepted or the

number of grain boundary intersections (easier for a single-phase grain structure).

After you count N or P, divide that number by the true line length to get NL or PL. If intersection apparently coinciding with the junction of three grains should be scored as

1.5

=
N = number of grains intercepted P = number of grain boundary intersections LT is the true test line length

Mean Lineal Intercept = l

1 1 = =
= 6.644 log 10 3.288 = 6.644 log 10 3.288

= 6.644 log 10 3.288

ASTM Test Pattern for Intercept Counting

The test line intercepted 5 whole grains and the line ends fell in two grains. These are weighted as an interception. So the total is 6 intercepts (N=6).

The test line has intersected 6 grain boundaries. The ends within the grains are not important in intercept counting. So, P=6 for the intercept count.

 If the grain structure is not equiaxed, but shows some

distortion of the grain shape, use straight test lines at various angles, or simply horizontal and vertical with respect to the deformation axis of the specimen.

The ASTM three-circle grid (three concentric circles with a line length of 500 mm). This test pattern averages the anisotropy
D1 = 79.58 mm
D2 = 53.05 mm D3 = 26.53 mm

Intercept counting are 41, 25 and 20 grains If LT = 11.4 mm N = 41 + 25 + 20 = 86 86 = = 7.54 1 11.4

1 7.54

= 0.113 mm

= 6.644 log 10 0.113 3.288 = 2.5