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GENERATING REDUCED-ORDER
STOCHASTIC MODELS OF RANDOM
HETEROGENEOUS MEDIA
zabaras@cornell.edu
http://mpdc.mae.cornell.edu/
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Materials Process Design and Control Laboratory
MOTIVATION
PROVIDE LOW-DIMENSIONALITY
REPRESENTATION OF THE
MICROSTRUCTURE, PROPERTY Process
Applications:
(i) Identify microstructures that have
extremal properties.
Microstructure
(ii) Identify processing sequences representations
Process-structure Property-process
that lead to desired microstructures space
3.12
space
and properties. A 3.11
A80 -1.5
3.07
b
α -1.6
3.06
R
a
-1.7 d
0.5 3.05 3. Rolling followed by drawing
-1.8
0
1
0.5 3.04
0 -0.5 2. Rolling
-0.5
-1 -1 1. Drawing
3.03
3.05 3.06 3.07 3.08 3.09 3.1 3.11 3.12
Process paths
Taylor factor along RD
A100
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Materials Process Design and Control Laboratory
STRATEGY
Given limited experimental information
(microstructural features):
Represent several plausible microstructures
Encode this information into a low-dimensional
parameterization of all such possible
microstructures
WHY?
Can incorporate effects of limited information of
macro behavior
Low-dimensional embedding significantly aids
searching and contouring of high dimensional
microstructural space
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Materials Process Design and Control Laboratory
OUTLINE
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Materials Process Design and Control Laboratory
LINEAR REDUCED-ORDER
MODELING FRAMEWORK
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Materials Process Design and Control Laboratory
DEVELOPING LINEAR TOPOLOGICAL MODELS
Data driven techniques for encoding the variability in properties into a viable, finite dimensional
stochastic model.
Advances in using Bayesian modeling, Random domain decomposition
Aim is to create a seamless technique that utilizes the tools of the mature field of property/
microstructure reconstruction
First investigations into constructing data-driven reduced order representation of topological/
material/ property distributions utilized a Principal Component Analysis (PCA/POD/KLE) based
approach.
Generate 3D samples from the microstructure space and apply PCA to them
= a1 + a2 +..+ an
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Materials Process Design and Control Laboratory
OVERVIEW OF METHODOLOGY
1. Property extraction 2. Microstructure reconstruction
Extract properties P1, P2, .. Pn, that Reconstruct realizations of the
the structure satisfies. structure satisfying the properties.
These properties are usually Monte Carlo, Gaussian Random
statistical: Volume fraction, 2-point Fields, Stochastic optimization etc.
correlation, auto correlation
Construct a reduced-order
stochastic model from the data. This
Extract structure-property-process
model must be able to approximate
relations
the class of structures.
Link with microstructure
KL expansions, FFT and other
classification and statistical learning
transforms, Autoregressive models,
algorithms
ARMA models
4. Applications
3. Reduced model
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Materials Process Design and Control Laboratory
DATA TO CONSTRUCT INPUT MODELS
Only have characterization of property variation in
finite number of regions or finite realizations
Consider the property variation and/or microstructure
to be a stochastic process.
Identify this stochastic process using the experimental
information available
2D microstructure
characterization Process data for statistical invariance of the structure
volume fraction, 2-point correlation, 3-point
correlations ….
All realizations of the stochastic process satisfy the
experimental statistical relations
These microstructures belong to a very large
(possibly) infinite dimensional space.
Convert this representation into a computationally
useful form: Finite dimensional representation
tomographic characterization
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Materials Process Design and Control Laboratory
FINITE DIMENSIONAL REPRESENTATION
The data extraction/reconstruction procedure gives a set of 3D microstructures.
These are samples from the microstructural space.
Need a qualitative, functional representation of the topological variation.
Must be finite dimensional for this description to be useful
Necessity of model reduction arises
= a1 + a2 + ..+ an
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Materials Process Design and Control Laboratory
REDUCED MODEL OF TOPOLOGICAL VARIATION
Construct descriptor from sample images.
Use POD
Microstructure images (nxnxn pixels) represented as vectors Ii i=1,..,M
The eigenvectors of the covariance matrix are computed
The first N eigenimages are chosen to represent the microstructures
= a1 + a2 + ..+ an
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Materials Process Design and Control Laboratory
PROPER ORTHOGONAL DECOMPOSITION
Suppose we had a collection of data Proper Orthogonal Decomposition
(from experiments or simulations) for (POD), Principal Component Analysis
the some variable/process/parameter (PCA), Karhunen Loeve
Decomposition (KLE), Sirovich,
S = { A( x)}iN=1 , { A( x, t )}iN=1 Lumley, Ravindran, Ito
Is it possible to identify a basis such PCA is mathematically defined as an
that this data can be represented in orthogonal linear transformation that
the smallest possible space. I.e find transforms the data to a new
coordinate system such that the
{φ ( x)}iM=1 , M = N greatest variance by any projection of
the data comes to lie on the first
Such that it is optimal for the data to
coordinate (called the first principal
be represented as
component),
M
A( x) = ∑ aiφi ( x), PCA is theoretically the most optimum
i =1 M
A( x, t ) = ∑ ai (t )φi ( x ), transform for a given data in least
i =1 square terms.
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Materials Process Design and Control Laboratory
PROPER ORTHOGONAL DECOMPOSITION
Data usually collated in terms of a Method of snapshots
matrix XT.
Solve the optimization problem
X is shifted to a mean zero value
T
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Materials Process Design and Control Laboratory
REDUCED MODEL : CONSTRAINTS
Let I be an arbitrary microstructure satisfying the experimental statistical
correlations
The PCA method provides a unique representation of the image
That is, the PCA provides a function
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Materials Process Design and Control Laboratory
CONSTRUCTING THE REDUCED SUBSPACE H
Image I belongs to the class of structures?
It must satisfy certain conditions
a) Its volume fraction must equal the specified volume fraction
b) Volume fraction at every pixel must be between 0 and 1
c) It should satisfy the given two point correlation
Thus the n tuple (a1,a2,..,an) must further satisfy some constraints.
Enforce these constraints sequentially
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Materials Process Design and Control Laboratory
CONSTRUCTING THE REDUCED SUBSPACE H
2. First order constraints
The Microstructure must satisfy the experimental volume fraction
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Materials Process Design and Control Laboratory
SEQUENTIAL CONSTRUCTION OF THE SUBSPACE
Computational complexity
Pixel based constraints + first order constraints result in a simple convex hull problem
Enforcing second order constraints becomes a problem in quadratic programming
10
-5
-10
10
15
10 15
20 0 5
-10 -5
-15
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Materials Process Design and Control Laboratory
THE REDUCED MODEL
The sequential contraction procedure a subspace H, such that all n-tuples
from this space result in acceptable microstructures
Since each of the microstructures in the ‘material’ plane satisfies all required
statistical properties, they are equally probable. This observation provides a way
to construct the stochastic model for the allowable microstructures:
This is our reduced stochastic model of the random topology of the microstructure
class
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Materials Process Design and Control Laboratory
PROPERTY EXTRACTION
Reconstruction of well characterized material
Tungsten-Silver composite1
Produced by infiltrating porous tungsten solid with molten
silver
1. S. Umekawa, R. Kotfila, O. D. Sherby, Elastic properties of a tungsten-silver composite above and below the melting
point of silver, J. Mech. Phys. Solids 13 (1965) 229-230
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Materials Process Design and Control Laboratory
PROPERTY EXTRACTION
First order statistics: Volume fraction: 0.2
1
0.9
0.8
0.7
Digitized two phase microstructure
0.6
image
g(r) 0.5
White phase- W 0.4
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Materials Process Design and Control Laboratory
MICROSTRUCTURE RECONSTRUCTION
Statistical information available- First and second order statistics
Reconstruct Three dimensional microstructures that satisfy these experimental
statistical relations
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Materials Process Design and Control Laboratory
MICROSTRUCTURE RECONSTRUCTION
Relate experimental properties to
1. Two phase microstructure, impose level cuts on y(r). Phase 1 if
2. Relate to statistics
first order statistics
where
Set , and
For the Gaussian Random Field to match experimental statistics
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Materials Process Design and Control Laboratory
FITTING THE GRF PARAMETERS
Assume a simplified form for the far field correlation function
0.4
0.2
0
0 5 10 15 20
r (um)
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Materials Process Design and Control Laboratory
3D MICROSTRUCTURE RECONSTRUCTION
20 μm x 20 μm x 20 μm
64x64x64 pixel
40 μm x 40 μm x 40 μm
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Materials Process Design and Control Laboratory
MODEL REDUCTION
Principal component analysis
Constructing the reduced subspace
0.25 and the stochastic model
- Enforcing the pixel based bounds and the linear
0.2 equality constraint (of volume fraction) was
developed as a convex hull problem. A primal-dual
Normalized eigenvalue
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Materials Process Design and Control Laboratory
PHYSICAL PROBLEM
Investigate effects of limited topological information on diffusion in
heterogeneous random media
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Materials Process Design and Control Laboratory
COMPUTATIONAL DETAILS
The construction of the stochastic solution: through sparse grid collocation
level 5 interpolation scheme used
Number of deterministic problems solved: 15713
Computational domain of each deterministic problem: 128x128x128 pixels
Each deterministic problem solution: solved on
a 8× 8× 8 coarse element grid (uniform hexahedral 10
0
Error
hours.
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Materials Process Design and Control Laboratory
FIRST ORDER STATISTICS: MEAN TEMPERATURE
b c d
a g
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Materials Process Design and Control Laboratory
FIRST ORDER STATISTICS: HIGHER MOMENTS
4
7
3.5
3
5
2.5
4
2
1.5
3
d
2
1
1
0.5
0 0
0 0.2 0.4
-0.4
b
-0.2 0
Temperature
0.2 0.4
c Temperature
a
f
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Materials Process Design and Control Laboratory
SECOND ORDER STATISTICS: MEAN TEMPERATURE
b c d
a g
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Materials Process Design and Control Laboratory
SECOND ORDER STATISTICS: HIGHER MOMENTS
7 10
9
6
Probability distribution function
4 6
5
3
4 d
2 3
2
1
1
0 0
-0.4 -0.2 0 0.2 0.4 -0.2 0 0.2 0.4
b Temperature c Temperature
a
f
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Materials Process Design and Control Laboratory
INCORPORATING MORE INFORMATION
7
As more information is incorporated into the
analysis, the subspace of allowable
6
microstructures shrinks
Probability distribution function
5
This corresponds to tighter probability
4 distributions
3
2
A general methodology was presented for
constructing a reduced-order microstructure
1
model
0
-0.4 -0.2 0
Temperature
0.2 0.4
Using more sophisticated model reduction
techniques to build the reduced-order
Comparison of temperature PDF’s at a microstructure model,
point due to the application of first and
second order constraints Extending the methodology to arbitrary
types of microstructures
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
NON-LINEAR REDUCED ORDER
MODELING FRAMEWORK
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
INPUT STOCHASTIC MODELS: LINEAR APPROACH
- PCA based approaches find the smallest coordinate representation of the data ….
… but assumes that the data lies in a linear vector space
Only guaranteed to discover the true structure of data lying on a linear subspace of the high
dimensional input space
What is the result when the data lies in a nonlinear space?
As the number of input samples increases, PCA based approaches tend to overestimate the
dimensionality of the reduced representation.
Becomes computationally challenging
Further related issues:
- How to generalize it to other properties/structures? Can
# of eigen vectors
# of samples
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
NONLINEAR REDUCTION: THE KEY IDEA
Set of images. Each image = 64x64 = 4096 pixels
Each image is a point in 4096 dimensional space.
But each and every image is related (they are
pictures of the same object). Same object but
different poses.
That is, all these images lie on a unique curve
(manifold) in 4096 .
Can we get a parametric representation of this
curve?
Problem: Can the parameters that define this
manifold be extracted, ONLY given these images
(points in 4096 )
Solution: Each image can be uniquely
represented as a point in 2D space (UD, LR).
Different images of the same
object: changes in up-down (UD) Strategy: based on the ‘manifold learning’
and left-right (LR) poses problem
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
NONLINEAR REDUCTION: EXTENSION TO INPUT MODELS
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Materials Process Design and Control Laboratory
A FORMAL DEFINITION OF THE PROBLEM
State the problem as a parameterization problem (also called the manifold learning
problem)
Classical methods in manifold learning have been methods like the Principle
Component Analysis (PCA) and multidimensional scaling (MDS).
These methods have been shown to extract optimal mappings when the manifold is
embedded linearly or almost linearly in the input space.
In most cases of interest, the manifold is nonlinearly embedded in the input space,
making the classical methods of dimension reduction highly approximate.
Two approaches developed that can extract non-linear structures while maintaining
the computational advantage offered by PCA1,2 .
1. J. B. Tenenbaum, V. De Silva, J. C. Langford, A global geometric framework for nonlinear dimension reduction Science 290
(2000), 2319-2323.
2. S Roweis, L. Saul., Nonlinear Dimensionality Reduction by Locally Linear Embedding, Science 290 (2000) 2323--2326.
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Materials Process Design and Control Laboratory
AN INTUITIVE PICTURE OF THE STRATEGY
- Attempt to reduce dimensionality while preserving the geometry at all scales.
- Ensure that nearby points on the manifold map to nearby points in the low-
dimensional space and faraway points map to faraway points in the low dimensional
space.
PCA 3D data
4
0
2
0
1
5
1
0
5
6
0
1
5 5
0
1
0
-5
5
0 4
0
-1
0 -5
-1
0
3
0
2
0
1
0
-1
0
0 2
0 4
0 6
0 8
0 1
00
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
KEY CONCEPT
1) Geometry can be preserved if the distances between the points are
preserved – Isometric mapping.
2) The geometry of the manifold is reflected in the geodesic distance between
points
3) First step towards reduced representation is to construct the geodesic
distances between all the sample points
Euclidian dist
Geodesic dist
Pt A Pt B
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
THE NONLINEAR MODEL REDUCTION ALGORITHM
1) Given the N unordered sample points ( microstructures, property maps …)
3) Given the pairwise distance matrix between N objects, compute the location
of N points, {ξi} in d such that the distance between these points is
arbitrarily close to the given distance matrix . Basic premise of group of
statistical methods called Multi Dimensional Scaling1 (MDS)
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MATHEMATICAL DETAILS
How to compute geodesic distance?
Sum over short hops.
Need the notion of distance between
samples
Flexibility in defining the distance
measure…..
The distance measure defines the properties of the manifold that the samples lie on
1. Properties of the manifold n.
The distance measure, , based on how much the microstructures vary. Defined as
the difference in statistical correlation between two microstructures. D (i, j ) =| S (i ) − S ( j ) |
The key to a reasonable dimension reduction is a good choice of the distance measure
Any choice of functions are allowable as long as they satisfy the metric
properties
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MATHEMATICAL DETAILS
1. Properties of the manifold n.
b) (, ) is a bounded.
c) (, ) is dense.
d) (, ) is complete.
e) (, ) is a compact metric space1,2 .
1. B. Ganapathysubramanian and N. Zabaras, "A non-linear dimension reduction methodology
for generating data-driven stochastic input models", submitted to Journal of Computational
Physics
2. J. R. Munkres, Topology, Second edition, Prentice-Hall, 2000.
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Materials Process Design and Control Laboratory
MATHEMATICAL DETAILS
2. Mapping a compact manifold to a low-dimensional set
Have no notion of the geometry of the manifold to start with. Hence cannot construct
true geodesic distances!
Dm (i, j ) = inf{length(γ )}
M γ
Approximate the geodesic distance using the concept of graph distance G(i,j) : the
distance of points far away is computed as a sequence of small hops.
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Materials Process Design and Control Laboratory
MATHEMATICAL DETAILS
3. MDS and choosing the dimensionality of the reduced space
Perform MDS on the geodesic matrix. i.e perform an eigenvalue decomposition of the
squared geodesic matrix.
The largest d eigenvalues are the coordinates of the N points.
The manifold has an intrinsic dimensionality. How to choose the correct value of d?
(related with issues of accuracy and computational effort)
Estimate the dimensionality of the manifold based on a novel geometrical probability
approach (developed by A. Hero et. al.)
Based on ideas from graph theory. The rate of convergence of the length functional, L
of the minimal spanning tree of the geodesic distance matrix is related to the
dimensionality1,2 , d.
d −1
log( L) = a log( N ) + ε with a=
d
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Materials Process Design and Control Laboratory
THE REDUCED ORDER TOPOLOGICAL MODEL
n.
Given N unordered d
samples
N points in a low
dimensional space
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Materials Process Design and Control Laboratory
THE REDUCED ORDER TOPOLOGICAL MODEL
Only have N pairs to construct → map. Various possibilities based on specific
problem at hand. But have to be conscious about computational effort and efficiency.
Illustrate 3 such possibilities below. Error bounds can be computed1.
d n
d
n
d
n
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Materials Process Design and Control Laboratory
THE REDUCED ORDER TOPOLOGICAL MODEL
Algorithm consists of two parts.
1) Compute the low dimensional representation of a set of N unordered sample points
belonging to a high dimensional space
N points in a
Given N Compute pairwise Perform MDS on low dimensional
unordered geodesic distance this distance matrix space
samples
For using this model in a stochastic collocation framework, must sample points in
→
2) For an arbitrary point ξ € must fins the corresponding point x €. Compute the
mapping from → d n.
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
NON LINEAR DIMENSION REDUCTION
40000
30000
The developments detailed before are applied
20000
to find a low dimensional representation of
these 1000 microstructure samples.
Log(length of MST)
10000
The optimal representation of these points was
a 9 dimensional region
-5
-10
10
15
10 15
20 0 5
-10 -5
-15
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
COMPUTATIONAL DETAILS
The construction of the stochastic
solution: through sparse grid 101
collocation level 5 interpolation
scheme used 100
Number of deterministic problems
-1
solved: 26017 10
Error
pixels
10-3
Total number of dof’s: 653x26017 ~ -4
7x109 10
-5
Computational platform: 50 nodes 10
on local Linux cluster (x2 3.2 GHz)
10-6 0 1 2 3 4
10 10 10 10 10
Total time: 210 minutes
# of collocation points
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Materials Process Design and Control Laboratory
MEAN TEMPERATURE PROFILE
b c d e
a g
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Materials Process Design and Control Laboratory
HIGHER ORDER STATISTICS
6
1
c
b 0
-0.2 0 0.2
d
Temperature
a
f
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MODELS OF POLYCRYSTALLINE MATERIALS
Microstructural variations affect macro-scale
properties
It is lot more difficult to analyze than two-phase
or multi-phase materials
Multiple layers of representation (a) grain
distribution (b) orientation distribution
Continuum distribution of orientation. Solvable
problem
Limit analysis to grain distribution
This is a tricky problem: Have to faithfully
encode grain distribution features and
should quickly reconstruct approximate
grains
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MICROSTRUCTURAL FEATURE: GRAIN SIZE
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Materials Process Design and Control Laboratory
EXPERIMENTAL DATA
Polarized light micrograph
of aluminium alloy AA3302
(source Wittridge NJ et al.
Mat.Sci.Eng. A, 1999)
0.2
0.18
0.16
0.14
<Gsz>=10.97
0.12 <Gsz 2>=124.90
probability
0.1
0.08
Extract grain size
0.06
distribution from image
0.04
0.02
0
0 2 4 6 8 10 12 14 16 18 20
GrainSize( µm)
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Materials Process Design and Control Laboratory
RECONSTRUCTING PLAUSIBLE DATA SET
Reconstruct N=200 microstructures that satisfy the experimental grain size
distribution
Utilize stochastic optimization to construct microstructures
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MODEL REDUCTION OF POLYCRYSTALS
The key feature to encode is the grain boundary
But grain boundaries are sparsely distributed in the domain
Need a strategy to compress all the grain boundary information and
remove all the interior information
Look at different types of transforms
1) Transform and its inverse should be computationally efficient
2) Data size should be limited.
3) Should be able to process grain boundaries : monochromatic lines on a
monochromatic background
4) Translation and rotation invariant
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
IMAGE TRANSFORMATION
Radon transform:
The Radon transform of an image represented by the function f(x,y) can
be defined as a series of line integrals through f(x,y) at different offsets
from the origin. ∞ ∞
R( ρ ,θ ) = ∫∫
−∞ −∞
f ( x, y )δ ( x cosθ − y sinθ + r )dxdy
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
IMAGE TRANSFORMATION
Forward radon transform
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
IMAGE TRANSFORMATION
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
REDUCED ORDER MODEL
The distance measure, , based on how much the microstructures vary.
Since the Radon transform encodes (in a sense) the grain volume,
define the distance as the difference in Radon transformed images
D (i, j ) =|| Ri ( ρ , θ ) − R j ( ρ , θ ) ||
Use filtered or un-filtered Radon transform?
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
DIMENSIONALITY OF THE REDUCED MODEL
3E+11 Dimensionality of
2.5E+11 the parametric
space computed
2E+11
from application of
Log(Length functional)
1.5E+11
the BHH theorem.
Which connects
the dimensionality
1E+11 of the surface to
the length
functional of a
graph
5E+10
d = 31
25 50 75 100 125
Log(Number of samples)
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
SAMPLING AND RECONSTRUCTION
Consider random points in the hyper cube
Reconstruct polycrystals corresponding to this point based on data. Direct
interpolation of the radon transform followed by inversion
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
SOME CHALLENGES
Reconstruction improves as the number of
Experimental information,
gappy data data point improves .. i.e. A is densely
populated
15
As the number of neighbors used in
10
reconstruction increases the reconstruction
degrades. Reason is averaging
5
-5
No filtering or heuristics used so far. But
seems like a good idea. Could result in
-10
10
15
better microstructures (line merging, pre-
20 0 5 10 15 filtering)
-10 -5
-15
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
Applications of classification and
reduced models of structure-
property-process maps for tailored
materials
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
PROCESSING PATH DESIGN
Tailored microstructures so that desired
properties can be achieved: controlled
deformation or thermal treatment.
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
MODEL REDUCTION AND STATISTICAL LEARNING
1
3.09
3.075
0
3.065
property spaces
3.055
-1
-1 -0.5 0 0.5 1
automated design: X-means classifier 3.055 3.06 3.065 3.07 3.075 3.08 3.085 3.09 3.095
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UU NN II VV EE RR SS II TT YY
Materials
Materials ProcessProcess
Design Design and Control
and Control Labora
Laboratory
CLASSIFICATION HIERARCHY: MICROSTRUCTURES
Classify/tessellate reduced space based on features
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
CLASSIFICATION HIERARCHY: TEXTURE
Classify/tessellate reduced space based on fiber orientations
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
K-MEANS CLUSTERING
Find the cluster centers {C1,C2,…,Ck} such that the sum of the 2-norm distance
squared between each feature xi , i = 1,..,n and its nearest cluster center Ch is
minimized.
Each class is affiliated with
Cost function
multiple processes
n
1
J (c , c ,.., c ) = ∑ min (
2
1 2 k
xi − C h )
i =1 h =1,.., k 2 2
Feature
Space
DATABASE OF ODFs
Clusters
Identify clusters
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
ADAPTIVE REDUCED MODELS: ACCELERATED DESIGN
= a1 + a2 +..+ an
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
THE DESIGN FRAMEWORK
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
DESIGN FOR DESIRED ODF: A MULTI STAGE PROBLEM
Desired ODF Optimal- 1
Reduced order
0.6
0.4
0.2
0
0 5 10 15 20 25
IterationIndex
Gradients are
obtained from Stage: 2
Initial guess, α 1 = reduced order Compression
0.65, α 2 = -0.1 sensitivity analysis. (α 2 = -0.2847)
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
ncti
DESIGN FOR DESIRED ODF: A MULTI STAGE PROBLEM
tivefu
Crystal <100> 1
c
direction.
je
Easy direction 0
.
8
b
of
do
magnetization 0
.
6
– zero power
lize
loss 0
.
4
rma
0
.
2
h
External magnetization
No
direction 0
5
I
t
era
t
io
nI
nde
x 1
0 1
5
Desiredpropertydistribution
1.22
Stage: 2 1.215
Tension
(α 2 = 0.4821) 1.21
0 20 40 60 80
Anglefromtherollingdirection
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory
CONCLUSIONS
Data-driven non-linear reduced order models of microstructures
developed
Very significant when performing computationally demanding operations
– searching, contouring - in intrinsically high-dimensional property-
process-structure spaces
Naturally coupled with statistical learning and unsupervised classification
strategies to effectively estimate optimal processing routes for tailored
materials
1) B. Ganapathysubramanian and N. Zabaras, "Modelling diffusion in random heterogeneous
media: Data-driven models, stochastic collocation and the variational multi-scale method",
Journal of Computational Physics, Vol. 226, pp. 326-353, 2007
2) B. Ganapathysubramanian and N. Zabaras, "A non-linear dimension reduction methodology for
generating data-driven stochastic input models", Journal of Computational Physics, submitted.
3) V. Sundararaghavan and N. Zabaras, "A statistical learning approach for the design of
polycrystalline materials", Statistical Analysis and Data Mining, submitted
4) V. Sundararaghavan and N. Zabaras, "Linear analysis of texture-property relationships using
process-based representations of Rodrigues space", Acta Materialia, Vol. 55, Issue 5, pp.
1573-1587, 2007
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UU NN II VV EE RR SS II TT YY
Materials Process Design and Control Laboratory