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Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of analog and Mixed-Signal Integrated circuits. OBIST converts the CUT to a circuit which oscillates Does not require any test pattern generator.
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of analog and Mixed-Signal Integrated circuits. OBIST converts the CUT to a circuit which oscillates Does not require any test pattern generator.
Oscillation Built-In Self Test (OBIST) Scheme for Functional and Structural Testing of analog and Mixed-Signal Integrated circuits. OBIST converts the CUT to a circuit which oscillates Does not require any test pattern generator.
Analog and Mixed-Signal Integrated Circuits Bidutkesh Mishra 1259007,3 rd sem M.Tech (VLSI design & ES Guided By: Mr G.L.Kumar, Asso. Prof
Content 1. Introduction to OBIST 3 2. Structure & Circuitry 4 a. FNC 5 b.LCD 6 3. Test structure 7-8 4. Literature Survey 10-11 5. Proposed Improvement 12 6. Conclusion 13 7. References 14
Introduction to OBIST BIST- Capability of a circuit to test itself OBIST converts the CUT to a circuit which oscillates Does not require any test pattern generator Oscillation frequency can be considered as digital signal and can be realized using digital circuits Structure & Circuitry The CUT is divided into different building blocks which works as oscillators The BIST is composed of an analog MUX which selects the CUT test points The frequency to number converter converts the output of MUX to a M bit number The Control Logic directs all the operation and produces pass or fail results FNC Stands for Frequency to Number converter The f osc of the selected building block first passed through a level crossing detector The rectangular output of the detector is applied to the counter which is enabled by the reference frequency and the obtained number is related to its input frequency
LCD It is a current source inverter The VB is adjusted to obtain a trip voltage VTRP = 1v Trip Voltage is the input voltage required to make the IM1 = IB Test Structure Base on feedback approach Can be applied to any ADC Loop forces ADC to oscillate between two set of codes All operation directed by the control logic
Test Structure (cont.) Here C j < C k
T c = convresion time Taking I 1 = I 2 =I Literature Survey Basic BIST Area overhead was more Not suitable for CUT with higher inputs Pattern generator & response analyzer must be very accurate Pattern generator is expensive Single OPAMP Oscillator
No need of test stimulus generator so low cost and efficient implementation
High fault coverage
Robust oscillation test strategy Proposed Improvement
Conclusion A Novel BIST approach based on the oscillation-test strategy has been introduced . Test technique for complete and accurate functional testing of ADC has also been developed using proposed BIST . References Wagner, K.D., and T.W. Williams, "Design forTestability of Mixed Signal Integrated Circuits,"IEEE Int'l Test Conf., 1988, pp. 823-829. Arabi, K., B. Kaminska, and J. Rzeszut, "BIST for Digital-to-Analog and Analog-to-Digital Converters,"ZEEE Design & Test of Computers, Fall 1!396, Arabi, K. and B. Kaminska, "Oscillation-Based 'Test Strategy (OBTS) for Analog and Mixed-Signal Circuits," US Patent Application, Oct. 1995. Arabi, K. and B. Kaminska, "Design for Testability of Integrated Operational Amplifiers Using Oscillation-Test Strategy," IEEE ZCCD, 1996, Austin, pp. 40-45. Arabi, K. and B. Kaminska, "Parametric and Catastrophic Fault Coverage of Analog Circuits Using Oscillation-Test Methodology," IEEE VLSI Test Symp., 1997, Monterey, pp. 166-171.