NCHUCS 1

Scan Chain Reorder

Sying-Jyan Wang
Department of Computer Science
National Chung-Hsing University
NCHUCS 2
utline

vervie!

Scan chain order" does it matter#

Cluster-$ased reordering for lo!-

po!er %&S'

()perimental results

*uture !or+
NCHUCS 3
utline
Overview

Scan chain order" does it matter#

Cluster-$ased reordering for lo!-

po!er %&S'

()perimental results

*uture !or+
NCHUCS 4
Digital 'esting

'o detect manufacturing defects

,pply test patterns and o$serve

output responses

'est patterns generated for targeted

fault models
NCHUCS 5
Scenario for -anufacture 'est
TEST VECTORS
MANUFACTURED
CIRCUIT
COMPARATOR
CIRCUIT RESPONSE
PASS/FAIL
CORRECT
RESPONSES

NCHUCS 6
Scan 'est .1/

, structural design-for-testa$ility
techni0ue

Storage elements are not directly

accessi$le

Scan test provides an easy !ay for

test access

,pply test patterns to circuit under test

.CU'/

Read output responses from CU'

NCHUCS 7
Scan 'est .1/

Se0uential circuit

**s are neither controlla$le nor o$serva$le

Com$inational 2ogic
3rimary
&nput
3rimary
utput
*
*
NCHUCS 8
Scan 'est .4/

Normal signal path" parallel load

Com$inational 2ogic
3rimary
&nput
3rimary
utput
*
*
NCHUCS 9
Scan 'est .5/

&n scan mode" a shift register

Com$inational 2ogic
3rimary
&nput
3rimary
utput
*
*
Scan in
.S&/
Scan out
.S/
NCHUCS 10
Scan 'est .6/

'o ena$le scan test

(ach scan cell has t!o inputs

Normal input

Scan input

,ll scan cells are connected into a shift register

.scan chain/

'urn a se0uential test into a com$inational

one

,pply test patterns directly

$serve test results directly

NCHUCS 11
Scan Chain

Normally constructed !hen

placement and routing are done

'he order does not matter

*ind out the shortest scan chain order

'raveling salesman pro$lem .'S3/

,symmetric 'S3 .,'S3/

S& and S of a scan cell are not at the

same location

N3-complete
NCHUCS 12
utline

vervie!
Scan chain order: does it matter?

Cluster-$ased reordering for lo!-

po!er %&S'

()perimental results

*uture !or+
NCHUCS 13
Scan 'est for Stuc+-at *aults

rder does not matter

,s long as !e can scan in test patterns

and scan out test responses
1 7 1 7
CU'
1 7 1 7 1 7 1 7
1010 1100
NCHUCS 14
-inimum Wirelength Routing

Use a 'S38,'S3 solver

Slo!

Wirelength can $e 17) !ith random

order
NCHUCS 15
2o!-3o!er 'esting

, great concern in recent years

Need to reduce signal transitions

'he source of dynamic po!er in C-S

Usually the dominant factor

Reorder scan chain to reduce

s!itching activity
1 7 1 7
1010
1 7 1 7
1100
3 transitions
1 transition only
NCHUCS 16
Delay 'esting .1/

Re0uire t!o-pattern tests

*irst pattern" initiali9ation

Second pattern" launch transition

Delay test !ith simple scan chain

%roadside

'he output response of the 1st pattern are

captured in the scan chain and $ecome the 1nd
pattern

S+e!ed load

'he 1nd pattern is the result of 1-$it shift of the

1st pattern
NCHUCS 17
Delay 'est .1/

%roadside test

(g: ,pply v1;.1717/< v1;.7177/

Com$inational 2ogic
3rimary
&nput
3rimary
utput
*
*
1
0
1
0
0
1
0
0
0
1
0
0
NCHUCS 18
Delay 'est .4/

S+e!ed load

Not all test pairs possi$le

1
n
1
n
possi$le 1-pattern com$inations

nly 11
n
possi$le !ith single scan chain

Reorder scan chain to achieve higher

fault coverage
1 7 1 7
1010
1 7 1 7
1100
0110
NOT POSSIBLE!!
7 1 1 7
NCHUCS 19
Hold 'ime =iolation

Not enough propagation delay

$et!een ad>acent flip-flops in a
se0uential circuit

Dou$le latching

3ossi$le solution

Reorder scan cells to introduce e)tra

delay
NCHUCS 20
utline

vervie!

Scan chain order" does it matter#

Cluster-based reordering for
lower-power BIST

()perimental results

*uture !or+
NCHUCS 21
vervie!

?oal" Reduce %&S' po!er

,pproach

&nclude a smoother to reduce s!itching

activity in test pattern generator .'3?/

Use scan chain reordering to recover lost

fault coverage

Simple reordering algorithm

Wirelength should not increase too much

NCHUCS 22
verall ,rchitecture
Internal scan chain
CUT
ORA PRPG Smoother
TPG
Internal scan chain 1
Internal scan chain 2
Internal scan chain k
.
.
.
.
O
R
A
P
R
P
G
Smoother
P
h
a
s
e
s
h
i
f
t
e
r
Smoother
Smoother
.
.
.
.
Single scan chain
multiple scan chain
NCHUCS 23
Smoother
0/1
1/0
0 / 0
0 / 0
1 / 0
0 / 0
1 / 0
.
.
.
S
n/21
S
0
0/1
1/1
1/1
1/1 0/1
S
n1
S
n/2
.
.
.
1/1
0 / 0
1/0
0 / 01 / 0
S
1
0/1
1/1
S
3
0/1
S
0
S
2
0/1
1/0
0 / 0
0 / 01 / 0
S
1
S
0
0 / 01 / 0
S
3
S
2
0 / 01 / 0
0/1
1/1
S

S
!
1/1
0/1
1/1
S
"
S
#
0/1
1/1
n-state smoother
5-state .1$it/
smoother
@-state .4$it/
smoother
NCHUCS 24
, Simple &mplementation of the
n-state smother
C
$i%i&e'()'n/2
U*'$o+n Co,nter
T
u
d

q
q

C0
in
NCHUCS 25
(stimation of 3o!er Reduction

3ro$a$ility of signal transition of an

n-state smoother

Compute from -ar+ov chain model

(stimation of dynamic po!er

1-$it .5-state / smoother" 184

4-$it .@-state/ smoother" 1817

n n
P
2
2
2
- 0 1 . - 1 0 .

+

NCHUCS 26
*ault Coverage
0 0 0 0 0 0 0 1 1 1 1 0 0 0 0 2'(it smoother
3'(it smoother
0 0 0 0 0 0 0 0 0 0 0 0 0 0 0
1 0 1 0 1 0 1 0 0 1 0 1 1 0 0
PRPG

Smoothed patterns are less random

-ay create repeated patterns and reduce

fault coverage
Re0uired test cu$e"
)))))71))))))))
NO MATCH!
Reorder scan chain"
)))))7)1)))))))
MATCH 2-bit smoot!r
NCHUCS 27
Cluster-%ased Scan Chain Reorder

2ayout surface divided into clusters

Reorder limited in single cluster

Sna+e-li+e glo$al routing

Single scan chain
ultiple scan chains
NCHUCS 28
()ample

Routing s16@67

A11 scan cells

1 cluster
16A clusters Silicon (nsem$le
NCHUCS 29
ptimal Cluster Si9e

&s there an optimal cluster si9e#

$servation

2arge clusters--long vertical connection

Small clusters--more hori9ontal crossings

Ho! to find optimal cluster si9e

*ind an e)pression of total !irelength

'a+e its derivative !ith respect to cluster

si9e c
NCHUCS 30
(stimate Wirelength in a Cluster
.1/

'!o types of order

Random order

Sorted according to )-cooridnate

sc
1
sc
2
sc
!
sc
3
sc

CL
1
CL
2
sc
1
sc
2
sc
3
CL
1
NCHUCS 31
(stimate Wirelength in a Cluster
.1/

Ho! to estimate the distance

$et!een t!o cells

-anhattan distance

Hori9ontal and vertical distances are

independent

,ssuming cells are randomly distri$uted

w
.0/ 0-
h
sc
1
.X
1
/ Y
1
-
sc
2
.X
2
/ Y
2
-
NCHUCS 32
(stimate Wirelength in a Cluster
.4/

()pected vertical distance $et!een

t!o cells

()pected hori9ontal distance $et!een

t!o cells

Random order" w84

Sorted order

Summation of all hori9ontal distances" w

[ ]
3
1
1 2
2
0 0
2 1 2 1
h
dy dy
h
y y Y Y E
h h


NCHUCS 33
(stimate Wirelength in a Cluster
.5/

Random order

N" B cells< c
1
" Bclusters

Sorted order

,
_

,
_

+
1
]
1

,
_

+
3
1
3 2
1
2
2
h w
c
N h
w l

,
_

,
_

,
_

+
c
H W
c
N H
W
c 3
1
3
1
2
c
W
c
H
c
N
w
h
c
N h
l +

,
_

,
_

,
_

,
_

+
1
]
1

,
_

3 3
1
3 2
1
2
2 2
NCHUCS 34
ptimal Num$er of Clusters .1/

Random order

,ssuming H W< N8c

1
1

Sorted order

,ssuming H W< N8c

1
4
H W
W
c
N
+

2
2
H
W
c
N 3
2

NCHUCS 35
ptimal Num$er of Clusters .1/

Reordering algorithm

2arger clusters give $etter results

,lmost no reordering !hen N8c

1
1

Choose sorted order if no special order is

preferred

ptimal cluster si9e

1 N8c
1
4
NCHUCS 36
utline

vervie!

Scan chain order" does it matter#

Cluster-$ased reordering for lo!-

po!er %&S'
!"perimental results

*uture !or+
NCHUCS 37
()perimental ResultsCWire 2ength
.1/

1-$it smoother
10
100
1000
0.1 1 10 100 1000 10000
A%era0e cells *er cl,ster
1
i
r
e

l
e
n
0
t
h

.
m
m
-
S3"2 S323! S1320" S120 S32!1" S322!
NCHUCS 38
()perimental ResultsCWire 2ength
.1/

4-$it smoother
10
100
1000
0.1 1 10 100 1000 10000
A%era0e cells *er cl,ster
1
i
r
e

l
e
n
0
t
h

.
m
m
-
S3"2 S323! S1320" S120 S32!1" S322!
NCHUCS 39
()perimental ResultsC*ault
Coverage .1/

1-$it smoother
33
3!
3
3#
3"
32
33
100
0.1 1 10 100 1000 10000
A%era0e cells *er cl,ster
T
e
s
t

e
f
f
i
c
i
e
n
c
)

.
4
-
S3"2 S323! S1320" S120 S32!1" S322!
NCHUCS 40
()perimental ResultsC*ault
Coverage .1/

4-$it smoother
2"
22
23
30
31
32
33
3!
3
3#
3"
32
33
100
0.1 1 10 100 1000 10000
A%era0e cells *er cl,ster
T
e
s
t

e
f
f
i
c
i
e
n
c
)

.
4
-
S3"2 S323! S1320" S120 S32!1" S322!
NCHUCS 41
ptimal Num$er of Cells per
Cluster
Circ,it WL .mm-
'' S5
6cl,ster 6cells/cl,ster 2'(it smoother 3'(it smoother
GS WL .mm- Red .4- GS WL .mm- Red .4-
S#!1 2."1 3# 1.0 2 2.23 '!.2! 3 2.2! '!.2
S"13 2.#" 3# 1.0 ! 2.30 '".33 10 2.30 '".33
S33 3.30 1# 2.21 3 3.#2 '10.33 3 3.#3 '10."
S113# !."! 1# 2.00 2 .02 '#.#3 " .03 '#.22
S1!23 ."0 3# 2.3 1 #.0! '.3 3 #.0! '.#3
S3"2 1!." 100 2.1! ! 1."2 '".#" ! 1."" '".#1
S323! 22.#2 100 2.!" 1 23.21 '2.22 2 23." '!.1
S1320" !.22 2# 2."3 3 !!."! 1.0# # !.!3 '0.3
S120 3.!0 2# 2.33 10 1.3" 2.#2 2 0.32 !.3
S32!1" 13#.3! "# 2.23 1 123.3 3.3# # 12."2 2.13
S322! 12".23 "# 2.! 10 1"".22 .3# " 1"2.1! .13
S(" Silicon (nsem$le
NCHUCS 42
'est (fficienct
Circ,it TL Test 5fficienc) .4-
7ar8o%
So,rce
9IST
:;SR 2'(it smoother 3'(it smoother
S5 O*timal Cl,ster S5 O*timal Cl,ster
S323! "22!2 32.2 3.02 33.!# 3.!" 23.33 32.00
S1320" !0#"" 3".22 32.30 32."3 3".2! 23.#! 2"."2
S120 3""#" 32.31 3#.!1 33.!" 3".#3 30.#2 32."3
S32!1" 2132! 3.!2 3".20 3!."3 3.3# 33. 3!.!"
S322! 220 32.3# 33."# 3.23 33.23 30.3 3.22
A%era0e ' 3"."0 3".!# 33.3 3".2! 22.3 32.#
NCHUCS 43
Comparison of ,verage 3o!er
Circ,it 6scan
cells
TL FC
.
4
-
:;SR
2'(it smoother< 3'(it smoother< :T'RTPG

.k=3-
FC
.
4
-
S5
FC
.
4
-
O*t.
cl,ster
AP
Red
.4-
FC
.
4
-
S5
FC
.
4
-
O*t.
cl,ster
AP
Red
.4-
FC
.
4
-
AP
Red
.4-
S#!1 ! !03# 3".!2 3!.13 3.31 ".!1 2".31 30." 2.# 23.#! 3#.3
S"13 ! !03# 31.3! 2".33 23.22 2.1 23."0 23."0 2#.3# 33.3! 3".2
S33 ! 2132 32.33 2#.!1 3".3" .!" !.2# 20.1" 2!.3 2.#1 2."
S113# 32 !03# 3.!3 22.#3 32."1 #.2 3.!0 "2."2 2.!0 3.2" 30.2
S1!23 31 !03# 3".23 3.!0 32.3 ".2 22." 3#.23 2.03 3".02 !3."
S3"2 21! #3# 32.3# 3".31 32.# 2.1 30.2# 3.0 2!." 3".02 !!.0
S323! 2!" 1310"2 23.#" 2".31 31.!0 3.3" "".!3 2#."2 2.3 31.#3 ."
S1320" "00 !0#"" 3".!2 31.2 3#.3" #2.#" 22.1" 2#.2! 2".33 ' '
S120 #11 3""#" 33.0# 30.12 3!.!3 2.21 2".2" 23.!! 2!.3# ' '
S32!1" 1##! 2132! 3#.#" 3!.2# 3.!2 #0."3 32.3" 33.33 2!.33 ' '
S322! 1!#! 220 3."0 31.0 3.00 #0.2" 2#.1! 31.2 2!.21 ' '
A%era0e ' 3." 30.23 3.11 2.## 20.22 22.!# 2.!! 32.23 !!."1
D*ull scanE " only state vectors are scanned
NCHUCS 44
3ea+ 3o!er

Capture-cycle po!er is not reduced

Still provide some improvement

Circ,it
PP Red .4-
2'(it smoother 3'(it smoother
S3"2 13.31 11.#!
S323! 13." 1#.#2
S1320" 12.# 13.3#
S120 13.#0 20.23
S32!1" 13."2 13.2!
S322! 13.12 12.01
A%era0e 13.3" 1".#3
NCHUCS 45
utline

vervie!

Scan chain order" does it matter#

Cluster-$ased reordering for lo!-

po!er %&S'

()perimental results
#uture wor$
NCHUCS 46
Conclusion

Scan chain reorder is very effect to

deal !ith

'est po!er

Scan-$ased delay test

*ault coverage in %&S'

Need to consider

3hysical design infromation

NCHUCS 47
*uture Wor+

*ast reordering algorithm for delay

test

&ntegrate reordering algorithm<

considering

'est po!er

Delay test coverage

Wire length

ther issues
NCHUCS 5@
THE EN"
Tan# $o%!