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Measurement Techniques
Reference: Chapter 3 Measurement Techniques of
High speed digital design , by Johnson and Graham
See http://www.ee.duke.edu/~cec/final/node1.html
Lower amplitude
Higher freq.
amplitude
time
High-speed logic: Measurement (v.9a)
Examples of filters
0dB
gain
Freq.
R
0dB
Freq.
R
High-speed logic: Measurement (v.9a)
High pass
Low pass
(1) Low pass filter (Frequency low than F-3dB can pass, or has
power gain more than 0.5)
(1) Low pass (e.g. op.amp)
E.g.
Ic(t)
R
C Vc
Vin
analog
system
Vout
Gain in dB = 20 log10(Vout/Vin)
-3dB
Frequency
B=Bandwidth
High-speed logic: Measurement (v.9a)
Flowpass(-3dB) =1/2RC
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(2) High pass filtering, (Frequency higher than F-3dB can pass, or
has power gain more than 0.5)
High pass
Vin
analog
system
Vout
Gain in dB = 20 log10(Vout/Vin)
0
-3dB
Frequency
F-highpass(-3dB) = 1/2(L/R)
High-speed logic: Measurement (v.9a)
R
Ideal amplifier
gain
0dB
3dB
Band width
High-speed logic: Measurement (v.9a)
Fc=center frequency,
F=bandwidth (narrow)
R
C
gain
0dB
3dB
Fc =1/[2(LC)
1/2 ]
Frequency
Band width F
High-speed logic: Measurement (v.9a)
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inadequate sensitivity
Usually no problem because except most sensitive digital network, we are
well above the minimum sensitivity (analogue system is more sensitive)
limited bandwidth?
some problems because all veridical amplifier and probe have a limited
bandwidth
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Oscilloscope probes
Components of oscilloscope systems
Input signal
Probe
Vertical amplifier
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Serial delay
The frequency response of a probe, being a combination of several random
filter poles near each other in frequency, is Gaussian.
1
2 2
When figuring a composite rise time, the squares of 10-90% rise times add
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Example:
Given: Bandwidth of probe and scope = 300 MHz
Tr signal = 2.0ns
Tr scope = 0.338/300 MHz = 1.1 ns
Tr probe = 0.338/300 MHz = 1.1 ns
Tdisplayed = (1.12 + 1.12 +2.02)1/2
= 2.5 ns
For the same system, if Tdisplayed = 2.2 ns, what is the actual rise time?
Tactual = (2.22 - 1.12 1.12)1/2
= 1.6 ns
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Estimation of circuit Q
Output resistance of source combine with the loop inductance & input
capacitance is a ringing circuit.
Where
( L / C )1/ 2
Q
Rs
Q is the ratio of energy stored in the loop to energy lost per radian during
resonant decay.
Fast digital signals will exhibit overshoots. We need the right Rs to damp
the circuit. On the other hand, it slows down the response.
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Impact: probe having ground wires, when using to view very fast signals
from low-impedance source, will display artificial ringing and overshoot.
A 3 ground wire used with a 10 pf probe induces a 2.8 ns 10-90% rise
time. In addition, the response will ring when driven from a lowimpedance source.
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Remedy
Try to minimize the earth loop wire
Back to page 29
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A1 A2
r3
where
Typically IC outputs
Vnoise LM
dI
(0.17nh)(7.0 107 V / s) 12mV
dt
12mV is not a lot until you have a 32-bit bus; must try to minimize loop area
High-speed logic: Measurement (v.9a)
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E.g. the probe impedance must be 10 times higher than the source
impedance of the circuit under test.
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But when the frequency is really high, this shunt capacitance may
create extra loading to the signal source.
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Not easy
Not safe
High-speed logic: Measurement (v.9a)
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Observing crosstalk
Crosstalk will
Connect probe and turn off machine; measure and make sure there is
minimal environment noise.
Select external trigger using the suspected noise source
Then turn on machine to observe the signal which is a combination of
primary signal, ringing due to primary signal, crosstalk and the noise
present in our measurement system
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Additive noise
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Power Supply
Power supply variation can change response characteristics
Vary the supply over a + 10% range
Temperature
Temperature will vary the delay characteristics
Can use cooling spray, blow dryer etc. Some companies use temperature
control ovens
Make sure the temperature probe is attached to the right place
Data Throughput
Compose a suite of operations that exercise each individual connections
Not easy to compose test pattern that represents the real situations. Often
system passes tests but fails at real operations.
Good data pattern will uncover unexpected avenues of noise coupling
which causes failures
Complex tests are expensive
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