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Castro-Neto, et al.
Rev. Mod. Phys. 81
(2009) 109
Castro-Neto, et al.
Rev. Mod. Phys. 81
(2009) 109
Castro
Neto
EF
The velocity of an
electron at the Fermi
level (vF)
Is inversely related to
meff
!@#$%%
*
feature
10
11
12
13
14
15
16
17
SiC(0001)
Our Focus:
Direct CVD,
PVD or MBE
On
Dielectrics
SiO
2
Si
Si evaporation
> 1500 K
SiC(0001)
Charge-based devices
Result: graphene
monolayer, interfacial inhomogene
Result: graphene
monolayer or multilayer
onSiC
(0001)
Spintronics
Coherent-Spin
FET:
Top
Gate
graphene
MgO(111)
Si(100)
graphen
e
) or
Co(111
Si(100)
gate
Co3O4(1
11)
Multi-functional,
non-volatile
devices
18
19
Gate
valves BCl
NH3
MB
E
Butterfly
valve
Turbo
Intro/
transfer deposition
Auger
Graphene/Co3O4
Sample heating
to 1000 K @ 1
Torr
STM
Graphene/MgO(111
LEED I(V)
Free
radical
source
ALD or
PVD
Hemispheri
cal analyzer
(XPS)
LEED
Graphene growth
&
characterization
Sampl
e Intro
chamb
er P = Sample processing P = 10-9
-10-3 Torr
103
UHV Analysis
Torr
Chamber
20
10-6
P ~ 5 x 10-10 Torr
Graphene/BN/Ru(0001): Bjelkevig, et al
LEED shows BN and Graphene NOT azimuthally rotated!
Orbital
hybridizat
ion with
Ru 3d!
21
22
P~ 10-8 Torr
750 K
Sapphire(0001
)
~3 ML
Co3O4(111)
Co(111)+ dissolved
O
Sapphire(0001
)
1000 K/UHV
Co(111)
O segregation
Sapphire(0001
)
23
Graphene growth on
Co3O4(111)/Co(0001)
MBE (graphite source)@1000 K:
Layer-by-layer growth
1st
ML
3 ML
2nd ML
0.4
ML
Graphene
Domain Sized
(from FWHM)
~1800
Oxide spots
(comp. to
attenuated
HOPG)
with
increasing
Carbon
coverage
G1
40000
graphene
G2
35000
0.4
ML
Intensity
30000
O1 Co3O4(111)
25000
O2
20000
15000
10000
5000
40000
3 ML
400
300
200
100
Pixel Position
65 eV beam energy
G1
35000
Intensity
LEED:
Oxide/Carbon
Interface is
incommensur
ate:
Different than
graphene on
SiC or BN!
G2
30000
2.5
2.8
25000
O1
20000
O2
15000
10000
5000
400
300
200
100
Pixel Position
M. Zhou, et al., J. Phys.: Cond. Matt. 24
(2012) 072201
25
Al K
source
284.9(0.1) eV
binding
energy:
Interfacial
polarization/ch
arge transfer
to oxide
No C-O bond
formation
26
M. Zhou, et al., J. Phys.:
Cond. Matt. 24 (2012)
Directly grown
graphene/metals and
dielectrics:
Inverse photoemission and
charge transfer
Ef
n-type
charge
transfer p-type
Forbea
ux, et
al.
Multilayers
27
Transition
metals
(Ru, Ni, Cu, Ir)
graphene
eOxides, SiC
EF
n-type; metal to
graphene charge
transfer
p-type;
graphene to
substrate
charge transfer
EF
28
Suspended
graphene
29
Conclusion:
Graphene:
Large area growth on
practical substrates
critical for device
development.
Interactions with
substrates and (maybe)
other graphene layers are
critical to device
properties
30