Beruflich Dokumente
Kultur Dokumente
Structure
Bed thickness
Target depth
Lithology
Max dip to be resolved
Target depth
Max
Vertical resolution
dip to be resolved
Vertical
Horizontal resolution
resolution
Horizontal resolution
Resolution
where
VRMS= the rms velocity to
the reflecting surface,
T0 = the two-way
traveltime, and
f dom= the dominant
frequency of the seismic
signal
Resolution (cont.)
Vertical Resolution :
It is a function of the thickness of the
subject layer, the frequency of the source
wavelet as it propagates through the layer,
and the velocity of the layer
V
Rz
4 f max cos i
Shooting Direction :
Geophysical Attributes :
Bin Size
Inline Fold
Cross-line Fold
Nominal Fold
Minimum Offset
Largest Minimum Offset
Inline Maximum Offset
Cross-line Maximum Offset
Maximum Offset
Introduction
Terminology
SI
RI
Controlling Factors
Vrms T0
RF
2 f dom
Z: target depth
Survey Parameters (cont.)
Migration aperture (cont.):
2. Diffracted energy (cont.):
300 scattering
angle
Survey Parameters (cont.)
Migration aperture (cont.):
3. Migration lateral displacement:
- Migrating a point on a dipping reflector
moves the point in the updip direction a lateral
distance DX:
DX Z tan
Z: target depth
: reflector true dip
Rule: choose the migration aperture as the
largest of RF, XDE, and DX.
Survey Parameters (cont.)
Fold:
It is the number of traces in a CMP bin.
Stacking M traces enhances the S/N by an amount of M1/2.
Inline fold :
NumberOf Re ceivers*RI
2*SLI
InlinePatchDimension
2*SLI
X-line fold :
SourceLine Length CrosslineP atchDimension
2 * Re ceiverLineInterval 2 * RLI
RLI
SI
SLI RI
Survey Parameters (cont.)
Xmax:
- The maximum recorded offset in a
survey.
- It is the length of the diagonal of
the patch in an orthogonal survey:
Xmax
Survey Parameters (cont.)
Xmax (cont.): It is affected by:
1. Target depth:
Choose Xmax target depth.
2. Direct-wave interference:
Given sufficiently large offset, the direct wave
will interfere with the primary reflection from
the target reflector at an offset Xd given by:
VRMSV1[TmVRMS T V T (V
2 2 2 2
V ) ]
2
Xd m 1 0 RMS 1
VRMS V1
2 2
Survey Parameters (cont.)
Xmax (cont.):
2. Direct-wave interference (cont):
VRMS: RMS velocity to target
reflector
V1: velocity of near-surface layer
Tm: mute time (~ 0.2 s)
T0: zero-offset TWTT to target
reflector
VRMS V2
2 2
S Rh Rd
CMP
Survey Parameters (cont.)
Xmax (cont.):
Vi
Bf
4 f max sin
Vi: interval velocity at target depth
fmax: maximum frequency at target depth
: target dip
Choose: B Bf.
Survey Parameters (cont.)
Bin size (cont.):
3. Lateral resolution:
Choose: min / 4 Br min / 2
min: minimum wavelength at target depth