Electromagnetic Properties of Materials:

Characterization at Microwave Frequencies and Beyond

Shelley Begley
Application Development Engineer
Agilent Technologies
Agenda

Definitions

Measurement Techniques
Parallel Plate
Coaxial Probe
Transmission Line and Free-Space
Resonant Cavity

Summary
Definitions
Permittivity is a physical quantity that
describes how an electric field affects and is
affected by a dielectric medium and is
determined by the ability of a material to
polarize in response to an applied electric

r
'
r
"
field, and thereby to cancel, partially, the
field inside the material. Permittivity relates
therefore to a material's ability to transmit
(or "permit") an electric fieldThe
permittivity of a material is usually given
relative to that of vacuum, as a relative
permittivity, (also called dielectric constant
in some cases).- Wikipedia

Df
Dk
Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

r r j r
' "

0
interaction of a material in the
presence of an external electric field.
Permittivity and Permeability Definitions

Permittivity
(Dielectric Constant)

r r j r
' "

0
interaction of a material in the
presence of an external electric field.

Dk
Permittivity and Permeability Definitions

Permittivity Permeability
(Dielectric Constant)

r r j r r jr
' " ' "
0 0
interaction of a material in the interaction of a material in the
presence of an external electric field. presence of an external magnetic field.

Dk
Permittivity and Permeability Definitions

Permittivity Permeability
(Dielectric Constant)

r r j r r jr
' " ' "
0 0
interaction of a material in the interaction of a material in the
presence of an external electric field. presence of an external magnetic field.

Dk
Electromagnetic Field Interaction

STORAGE
Electric Magnetic
Fields Fields

Permittivity MUT Permeability

r r
'
j r
"
r r
'
jr
"
STORAGE
Electromagnetic Field Interaction

STORAGE
Electric Magnetic
Fields Fields
LOSS

Permittivity MUT Permeability

r r
'
j r
"
r r
'
jr
"
STORAGE
LOSS
Loss Tangent
''

r "
r
r
tan '
r
'
r

1 Energy Lost per Cycle

tan D
Q Energy Stored per Cycle

D Dissipation Factor Q Quality Factor

Df
Relaxation Constant t
Water at 20o C

t = Time required for 1/e of

100

an aligned system to return r'

to equilibrium or random
state, in seconds.
10

11
t r
" most energy is lost at 1/t
c 2f c
f,
1
1 10 100 GHz

s
Debye equation : ( )
1 jt
Measurement Techniques

Parallel Coaxial
Plate Probe

Transmission
Line including Resonant
Free Space Cavity
Which Technique is Best?
It Depends
Which Technique is Best?
It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy
Which Technique is Best?
It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions
Which Technique is Best?
It Depends on
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions
Destructive or non-destructive
Contacting or non-contacting
Temperature
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Transmission line

Medium
Free Space
Parallel
Plate

Resonant Cavity
Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Medium

Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Medium

Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Transmission line

Medium
Free Space

Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Transmission line

Medium
Free Space

Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Transmission line

Medium
Free Space
Parallel
Plate

Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
 Measurement Techniques
vs. Frequency and Material Loss

Loss
High
Coaxial Probe

Transmission line

Medium
Free Space
Parallel
Plate

Resonant Cavity
Low
Frequency
50 MHz 5 GHz 20 GHz 40 GHz 60 GHz 500+ GHz
Low frequency RF Microwave Millimeter-wave
Parallel Plate Capacitor System
LCR or Impedance
C Analyzer
r
'

A
0
t
tan D
Dielectric Test
Fixture
A
t
(magnetic fixture
also available)
Impedance Analyzers and Fixtures
Measurement Techniques that use a
Vector Network Analyzer

Coaxial Probe
Transmission Line and Free-space
Resonant Cavity
Coaxial Probe System
Computer Network Analyzer
(not required for (or E4991A Impedance
Analyzer)
PNA)

GP-IB or
LAN

85070E
Dielectric
85070E Software Probe
(included in kit)
Coaxial Probe

Material assumptions:

effectively infinite thickness

non-magnetic

isotropic

homogeneous
Reflection
1
(S1 ) no air gaps or bubbles
Three Probe Designs

High Temperature Probe

0.200 20GHz (low end 0.01GHz with impedance

analyzer)
Withstands -40 to 200 degrees C
Survives corrosive chemicals
Flanged design allows measuring flat surfaced solids.
Three Probe Designs

Slim Form Probe

0.500 50GHz
Low cost consumable design
Fits in tight spaces, smaller sample sizes
For liquids and soft semi-solids only
Three Probe Designs

Performance Probe
Combines rugged high temperature performance
with high frequency performance, all in one slim
design.

0.500 50GHz
Withstands -40 to 200 degrees C
Hermetically sealed on both ends, OK for autoclave
Food grade stainless steel
Transmission Line System
Computer
(not required for
PNA) Network Analyzer

GPIB or
LAN

85071E Materials
Measurement
Software

Sample holder
connected between coax cables
Transmission Line
Material assumptions:

sample fills fixture cross section

no air gaps at fixture walls

l flat faces, perpendicular to long axis

Known thickness > 20/360

Reflection Transmission
(S11) (S21 )
Transmission Line Sample Holders

Coaxial

Waveguide
 Transmission Algorithms

Optimum
Length Output
Algorithm Measured S-parameters

r and r
Nicolson-Ross S11,S21,S12,S22 l/4

Precision (NIST) S11,S21,S12,S22 n l/2 r

Fast S21,S12 n l/2 r

(85071E also has three reflection algorithms)

Transmission Free-Space System
Computer
(not required for
Network Analyzer
PNA)

GP-IB or LAN

85071E Materials
Measurement
Software

Sample holder
fixtured between two antennae
Transmission Free-Space
Material assumptions:

Flat parallel faced samples

Sample in non-reactive region

l
Beam spot is contained in sample

Known thickness > 20/360

Reflection Transmission
(S11 ) (S21 )
Non-Contacting method for High or Low
Temperature Tests.

Free Space with Furnace

75-110GHz Free Space System
Free Space 75-110GHz Quasi-Optical System

Agilent
Free Space 75-110GHz Quasi-Optical System
Free Space 75-110GHz Quasi-Optical System
Free Space 75-110GHz Quasi-Optical System
Free Space 75-110GHz Quasi-Optical System
Reflectivity Measurement System
Computer Network Analyzer
with Time Domain
(not required for
option
PNA)

GP-IB or
LAN

85071E Materials
Measurement
Software
with Reflectivity
Option 200

NRL Arch Fixture with MUT

NRL Arch

Results in dB

port 1 port 2

S21

Incident Reflected
Wave Wave

MUT
Resonant Cavity System
Computer
(not required for
Network Analyzer
PNA)

GP-IB or LAN

Resonant Cavity
Software

Resonant Cavity with sample

connected between ports.
Resonant Cavity Technique
empty cavity
fc = Resonant Frequency of Empty Cavity
sample inserted
fs = Resonant Frequency of Filled Cavity Qc
Qs
Qc = Q of Empty Cavity
fs fc f
Qs = Q of Filled Cavity
Vc f c f s
Vs = Volume of Empty Cavity
r 1 2.303
Vc = Volume of Sample
2Vs f s
Vc 1 1
r 0.003
4Vs Qs Qc
ASTM 2520
Resonant Cavity Fixtures

ASTM 2520 Waveguide

Resonators
Agilent Split Cylinder
Resonator IPC TM-650-
2.5.5.5.13
Split Post Dielectric
Resonators from QWED
Resonant vs. Broadband Transmission
Techniques
Resonant Broadband
Yes No
Low Loss materials
er resolution 10-4 er resolution 10-2-10-3
Yes No
Thin Films and Sheets 10GHz sample thickness 10GHz optimum thickness ~
<1mm 5-10mm
Calibration Required No Yes
Measurement Frequency
Single Frequency Broadband or Banded
Coverage
Summary Technique and Strengths

Parallel Plate Low Frequency

Best for thin flat sheets

Coaxial Probe Broadband

Best for liquids, semi-solids

Transmission Line Broadband

Best for machine-able solids

Transmission Free Broadband, mm-wave

Space Non-contacting

Resonant Cavity Single frequency

High accuracy, Best for low
loss, or very thin samples
 Microwave Dielectric Measurement
Solutions
Model Number Description

85070E Dielectric Probe Kit

020 High Temperature Probe
030 Slim Form Probe
050 Performance Probe

85071E Materials Measurement Software

100 Free Space Calibration
200 Reflectivity Software
300 Resonant Cavity Software
E01 75-110GHz Free Space Fixture
E03 2.5GHz Split Post Dielectric Resonator
E04 5GHz Split Post Dielectric Resonator

85072A 10GHz Split Cylinder Resonant Cavity

For More Information

Visit our website at:

www.agilent.com/find/materials
For Product Overviews, Application Notes,
Manuals, Quick Quotes, international contact
information
For More Information

Visit our website at:

www.agilent.com/find/materials
For Product Overviews, Application Notes,
Manuals, Quick Quotes, international contact
information
Call our on-line technical support:
+1 800 829-4444
For personal help for your application, formal
quotes, to get in touch with Agilent field
engineers in your area.
 References
R N Clarke (Ed.), A Guide to the Characterisation of DielectricMaterials at RF and Microwave Frequencies, Published by The
Institute of Measurement & Control (UK) & NPL, 2003

J. Baker-Jarvis, M.D. Janezic, R.F. Riddle, R.T. Johnk, P. Kabos, C. Holloway, R.G. Geyer, C.A. Grosvenor, Measuring the
Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-Index Materials, NIST
Technical Note 15362005

Test methods for complex permittivity (Dielectric Constant) of solid electrical insulating materials at microwave frequencies and
temperatures to 1650, ASTM Standard D2520, American Society for Testing and Materials

Janezic M. and Baker-Jarvis J., Full-wave Analysis of a Split-Cylinder Resonator for Nondestructive Permittivity Measurements, IEEE
Transactions on Microwave Theory and Techniques vol. 47, no. 10, Oct 1999, pg. 2014-2020

J. Krupka , A.P. Gregory, O.C. Rochard, R.N. Clarke, B. Riddle, J. Baker-Jarvis, Uncertainty of Complex Permittivity Measurement by
Split-Post Dielectric Resonator Techniques, Journal of the European Ceramic Society
No. 10, 2001, pg. 2673-2676

Basics of Measureing the Dielectric Properties of Materials. Agilent application note. 5989-2589EN, April 28, 2005