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ECE-E434 Digital Electronics

Lectures 10-12: Pass-transistor Logic,


Dynamic Logic, Memory Circuits

Instructor: Pouya Dianat


Oct 31 & Nov 2-3 2017
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Digital IC Technologies

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ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Pass-Transistor Logic (PTL)

A B C Y A B C Y
H H H H H H H H
L H H L L H H L
H L H L H L H H
H H L L H H L H
H L L L H L L L
L H L L L H L L
L L H L L L H L
L L L L L L L L
Y = ABC Y = A (B + C)
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Pass-Transistor Logic (PTL)


Main benefit: Lower number of transistors per operation than CMOS alone.

CMOS-transmission Gate
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

PTL Design Consideration


A basic design requirement of PTL circuits:
• every node must have, at all times, a low-resistance path to either ground or
VDD.

Such a path does not exist It is provided through switch S2.


when B is low and S1 is open.
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

An example of NMOS TPL


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Reminder: The body effect

The body effect can be seen as a change/increase in threshold voltage


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic Response of NMOS PTL


• Reduced gate noise immunity
• “Poor 1” Operation  Can cause conduction in the next inverter
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Solution to NMOS PTL Problem


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

CMOS Transmission Gate Logic


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

CMOS Pass Logic: Dynamic Response


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Equivalent resistance:
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Time Response
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Equivalent Capacitance
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Logic Circuits with PTL


ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit


• Static Circuits  Every node has a defined low (ground) or high (VDD) voltage
• Dynamic Circuits  Relies on charging of capacitors
• Problems: Caps may be leaky; therefore nodes lose voltage
• Solution: Periodically refreshing node voltages with a clock signal
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Why Dynamic MOS Logic


Standard CMOS: Psuedo-NMOS: PTL: Dynamic MOS Logic:

• Easy to design • Simpe small area • Complex non-


• Max logic swing • Requires CMOS to robust design
• Noise-immune restore voltage
• Zero static power • Non-Zero static • Zero static power
• Equal LH and HL power
delays
• Two transistor per • Two transistor per • Low device count
input input
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit


• What happens when f is low?
 Qp is on, Qe is off  No pass to ground
 CL charges to VDD
 Inputs A, B, and C are allowed to change
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit


• What happens when f is high?
 Qp is off, Qe is on
 If PDN is high, nothing changes  tPLH=0
 If PDN is low, CL will discharge  tPHL>0; calculated similar to CMOS
• Question: Does Qe increase the delay?
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Transistor Sizing


• PDN: follows the same rules as that of CMOS Logic Gates
• Qp :
• W/L should be large enough to charge CL to VDD during the pre-charge interval
• It should be small enough to keep CL small.
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Non-idealities


• Noise margin:
• During Evaluation, Qe will conduct.
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Non-idealities


• Output voltage decay due to leakage:
• There is leakage current that discharges capacitor
• It is through reverse saturation current of drain-substrate pn junctions (10-15-
10-12A)
• It is temperature dependent
• More significant in slow clock
• Requires “refreshing”
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Non-idealities


• Charge sharing: • Static Power Loss
• Fixes charge sharing
• Decreases load cap.
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Non-idealities


• Clock feedthrough:
• When Qp turns off
• CL is capacitively coupled to the clock
• Assume PDN is also off  Output node is floating
• CL will get charged through the clock signal.
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Dynamic MOS Circuit: Non-idealities


• Impractical Cascading Problem:
ECE-E434
Digital Electronics
Advanced Topics in Digital IC Design – Ch. 15

Solution to Cascading: Domino Gate


• A standard CMOS is added to prevent premature discharging of CL2
• Disadvantage: Increased Delay is LH transistion.

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