ON MEMS DEVICE FOR AUTOMATIC SELF-CLEANING WATER FILTERS PROBLEM STATEMENT / ABSTRACT
In water filtration systems, a considerable amount of
water is wasted in evacuation of contaminant particles present in the water. In addition, over the time the filters collect sand, dirt, mineral deposits, etc and have to be replaced. An efficient solution to this is the use of Automatic Self Cleaning Water Filters. These systems employ a back- flush cycle when a certain pressure is reached that lasts around 15-20 seconds. The contaminants are dislodged from the filters and carried away through the waste pipe using less than 5% of the water. FILTRATION AND BACKFLUSHING CYCLES SOLUTION A micro pressure sensor can used to detect when the upper limit of operating pressure range is reached. This works on the principle of converting the deflections caused in the silicon diaphragm due to the applied pressure into required form of output. In this project, a capacitive pressure sensor is to be designed and simulated. A capacitive pressure sensor is used because it is not highly sensitive to operating temperature as piezoresistive sensors. In case of piezoelectric pressure sensors, they are highly sensitive to vibrations which are common in a water filter due to turbulent flow at high rates. Therefore, capacitive pressure sensors serve the purpose best as they do not fluctuate much. DESIGN PARAMETERS In this project, a water filter having a 36 inch inlet pipe allowing up to 35000 gallons per minute of water flow and the strainer maximum pressure allowed 275 psi (pmax) has been considered. The diameter of the circular diaphragm a = 2mm. The load acting on the diaphragm at maximum pressure W = (πa2 /4)* pmax = 5.957 N The maximum radial stress is given by σrr = 3*W/(4*π*h2) ...(1) The maximum tangential stress (hoop stress) is given by σθθ = (3*W*ν)/ (4*π*h2) ...(2) where h is the thickness of the diaphragm and ν is the Poisson’s ratio (ν = 0.17). DESIGN PARAMETERS By using Von Mises criteria, [ (σ1 - σ2)2 + (σ2 - σ3 )2 + (σ3 - σ1)2]1/2 < 21/2 σy σ1 = σrr , σ2 = σθθ and σ3 = pmax (negligible as compared to σ1 and σ2 ) Therefore, [ (σrr- σθθ)2 + (σrr - 0)2 + (σθθ - 0)2]1/2 < 21/2 σy substituting σrr and σθθ from (1) and (2), [3*W/(4*π*h2)]*(1 + ν2 – ν)1/2 < σy ... (3)
For anisotropically etched silicon diaphragm σy has been
experimentally found to be approximately 300MPa. This is due to sharp corners in anisotropically etched silicon which result in stress concentration factors as high as 33 bringing down the fracture strength from 7000 MPa. DESIGN PARAMETERS Solving equation (3) gives h > 66.28μm Therefore considering h = 75μm the maximum deflection is given by δmax = [3*W*(1 - ν2)*a2]/(16*E*π*h3) = 21.824 μm where E is the Young’s Modulus equal to 150 Gpa.
To obtain satisfactory sensitivity let the distance
between capacitor plates be approximately thrice the maximum deflection produced. Therefore distance d = 75 μm Therefore sensitivity = ΔC/C = δmax /(d – δmax ) = 0.4104 CONCLUSION
Simulations on a solid model, based on the parameters
set in the design, in COMSOL Multiphysics BIBLIOGRAPHY [1] International Journal of Current Engineering and Technology, Modelling of Different MEMS Pressure Sensors using COMSOL Multiphysics