Presented by (GROUP-5)

Ayesha Mahmud MPHIL-PH04F18

Faryal Riaz MPHIL-PH05F18
Fatima Akhtar MPHIL-PH20F18

Presented to
DR. Athar Javed
Department of Physics
University of the Punjab, Lahore

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 Outlines
 Magnetic Lens
 Working Principle
 Construction of Magnetic Lens
 Trajectory of electrons in a magnetic lens
 Magnetic lens system
 Types of magnetic lens
 Relation between current and focal length
 Parameters for short focal length and high resolution
 Conclusion

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Magnetic lens

 A magnetic lens is a device for the focusing or deflection of

moving charged particles, such as electrons or ions, by use of the
magnetic Lorentz force. Its strength can often be varied by usage
of electromagnets.
 Electron microscopes use a beam of electrons rather than visible
light to illuminate the sample. They focus the electron beam using
electromagnetic coils (lenses) instead of glass lenses (as a light
microscope does) because electrons can't pass through glass.

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 Working Principle
The beam of electrons experiences a magnetic force due to the magnetic field produced by the current

carrying coil.

i.e.,

𝑭 = 𝒒(v × 𝑩)

The focusing effect of a magnetic lens therefore increases with the magnetic field B, which can be

controlled via the current flowing through the coils.

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 Construction of Magnetic Lens

 The lens is formed by a solenoid of N coils where a I current is

flowing. This current produces a magnetic field with cylindrical
symmetry which is concentrated in a small volume by the use of
a ferromagnetic material (soft iron). Moreover ferromagnetic
polepieces further concentrate the magnetic field in a small
region.
 The polepieces are drilled in the center to allow the passage of
the electrons which travel along the axis of the lens.
 These polepieces are machined to high precision to ensure that
the magnetic field has the high degree of axial symmetry
required for good focusing

Fig 1. Half portion of magnetic lens

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 Trajectory of electron in magnetic lens

 Current carrying coil produces its own magnetic field

perpendicular to current direction.
 Electrons parallel to magnetic field move along the axis
undeflected.
 Electrons deflect only at some certain angle to magnetic field.
 After interaction with magnetic field electrons moves in a
helical path spirally down the column.
 After interaction of magnetic field electron beam is rotated by
adjusting the focus.

Fig 2. Spiral motion of electron in B

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 Magnetic Lens System

 Condenser lens is to control the size of

electron beam.
 Aperture controls the no. of electrons(going
off axis) and the final convergence angle.
 Deflection coils are to “raster” the electron
beam into the rectangular area of the sample
surface.
 Objective lens is for electron probe focusing
onto the sample.

Fig 3. Schematic Diagram of Electromagnetic Lens system

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 8

■ Objective Lens
Used for image formation in TEM and for
controlling probe diameter in SEM
■ Condenser Lens
TYPES OF Used for reducing electron beam cross-over
MAGNETIC ■ Projector Lens

LENSES Several lenses under objective lens which allow

either image mode or diffraction mode.
■ Intermediate Lens
Special intermediate lens that projects the final
image or diffraction pattern into image recording
system.
 FOCAL LENGTH OF MAGNETIC LENSES

■ The distance from the center of the lens to the focus point (or called focal point) of
electrons is called the focal length (f) of the electromagnetic lens.
■ In general, stronger lens excitation generates a shorter focal length. Magnetic lenses
with short focal lengths are obtained by concentrating the magnetic field by means of
magnetic polepieces. Because the focal length of magnetic lenses in electron
microscopes is of the order of millimeters, the specimen is immersed in the magnetic
field.

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 Dependence of focal length on electric current

 Magnetic force on a charge particle is

𝒅𝒗
m = - q (𝒗 x 𝑩)
𝒅𝒕
 Electrons make the spiral motion along the optical axis
from point A (z = -a) in the object space and a point B (z =
b) in the image space.
𝟏 𝒛𝟐
= constant‫𝒛׬‬ 𝑩(𝒛 )𝟐 𝒅𝒛
𝒇 𝟏

𝟏
f∝ ………. (1)
𝑩𝟐

Fig 4. Electron motion in cylindrical co-ordinates

[Principle of Optics by Born M and Wolf]
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 From ampere’s law
𝐵 = 𝜇0 I
so 𝐵∝𝐼
1
From (1) f∝
I2
1
4i 2 1
Also, α=
βπ2 d
1
α= I 2

1
1 4
𝛼=
𝑓

Where α is the convergence angle.

■ The focal length is also given by,
f = K (𝐸0 /𝑖 2 )
where,
K -- A constant based on the number of turns of lens coil wire and the geometry of the lens
𝐸0 -- The accelerating voltage,
i -- The current, put through the coil 11

The typical focal length 𝑓0 of objective lenses is ~ 1.5 mm for both the pre-field and post-field parts
  Use of magnetic lens gives option for
obtaining better results.
 By variation of condenser and objective
lens resolution is increased.
 By choosing appropriate changes in
CONCLUSION parameters a good quality image with a
lot of information is obtained.
 The focusing effect of a magnetic lens
increases with the magnetic field B,
which can be controlled via current
flowing through coils.

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 B. D Cullity, S.R Stock, Elements of X-Ray diffraction,

(2011) 3rd edition, Prentices Hall, Upper Saddle river N.
 Yang Leng, Materials Characterization An introduction to
Macroscopic and Spectroscopic Methods (2013), 2nd
Edition, Wiley-VCH Verlag Gmbh and Co.
REFERENCES  Goseph I- Goldstein and Harley Yakowitz, Practical
Scanning Electron Microscopy (1997) 2nd Edition,
Plenum Publishing, New York.
 S.I Molokovasky and A.D. Sushkov, Intense Electron and
Ion Beam (2005), Springer-Verlag Berlin Heidelberg.
 Born M and Wolf, E. Principles of optics (1970), Oxford
Pergamon Press.
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