Beruflich Dokumente
Kultur Dokumente
Warren’s
PIT Simpl. methodology
S20 4.1 3.5 3.5 1041s 0.06 -2.2
T20 −3.2 −4.4 −7.9 104s 0.08 -2.1
T80 −3.2 −3.0 −3.7 AMA 0.07 -1.5
AOT 0.11 1.5
T80 0.17 -3.7
T21 0.11 -3.2
T20 0.12 -3.1
Zarate‐Muñoz, S. , Texeira de Vasconcelos, F. , Myint‐Myat, K. , Minchom, J. and Acosta, E. (2016), A
TX100 0.15 -2.9
Simplified Methodology to Measure the Characteristic Curvature (Cc) of Alkyl Ethoxylate Nonionic
Surfactants. J Surfact Deterg, 19: 249-263. doi:10.1007/s11743-016-1787-x
AOT 0.4g/100ml
k Cc S (g/100ml)X Solver
Measured using Surfactant SP* AMA 0.072 -1.5 6.903303 0.9 2.64E-07 USE -4.4E-16
AOT 0.11 1.5 0.431711 0.1 2.64E-07
Solution Guess
0.0758 -1.2 5.232035 1.65