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Numerical Gloss Control
Numerical UV Control
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„
ects that composed of the same materials, may have

variances in colors due to differences in the gloss of the
surfaces.
For example, when the surface condition of a shiny or
high gloss sample is eing changed using a sandpaper,
it will cause the sample to look duller in color.

Before After
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_ he total amount of reflected light including the total
amount of specular component is taken into account
for the measurement. he total amount of light is the
same and therefore the reflectance data of matte and
glossy surface is the same.
_
t measures the total colour appearance independent
of the surface conditions.
u

Œ



_ ecommended for most CCM measurements
_ Can e selected for certain QC measurements
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i
_ he specular component is excluded. „nly the diffused
reflected light is taken into account for the measurement
and the reflectance data of the matte and glossy surface is
different. A matte surface is righter ut less saturated
and a glossy surface will show a darker ut higher
saturation.
_ hese results are close to visual perception
u

Œ



_ ecommended for most QC measurements
_ Can e selected for certain CCM measurements too,
provided the surface is smooth and flat
_
f the surface is not smooth and flat, some light rays may
reflect in the directional reflection path which is not
wanted.
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 raditional Method
Specular Component
ncluded and Excluded (SC
SCE)

D Physical gloss trap is opened and closed

mechanically
D Switching time is necessary (much longer than
measuring time)
D Moving parts are a potential danger of reak-down
D Simultaneous measurements (completely same
conditions of sample) are impossi le.
  
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Gloss rap Closed

Sample

SCE SC

  
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Gloss rap „pened

Sample

SCE SC

  
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Gloss rap Closed

Sample

SCE SC

  
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Gloss rap „pened

Sample

SCE SC

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D
llumination
wo flashes are activated
_ iffuse
_ irectional
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Sample

First illumination - diffused

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Sample

Second illumination - directional

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D
llumination
wo flashes are activated
_ iffuse
_ irectional
D Calculation
With the data o tained y diffused illumination reflection and
directional illumination reflection, the CPU calculate the SC

and SCE data simultaneously
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m   

   

Sample
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m   
 
   

Sample
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eflection due to diffuse

illumination




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eflection y directional i
illumination
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D Exclusive and patented

D Practical and time saving
fast sampling - SC
& SCE in 4 seconds
D Fully relia le
no mechanism

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Switching etween SC
and SCE Quick measurement (SC
and SCE
takes longer time takes 4 seconds)

Completely same conditions of Completely same conditions of

sample for SC
SCE measurement sample for SC
SCE measurement
is impossi le
Moving parts are su
ected to No moving part
reakdown

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BLACKL
GH
_ A lacklight is an illumination using wavelengths mostly
outside the visi le regions of the spectrum. Example of
such light is the UV lamp.
_
t emits energy in the ultraviolet region
_ his light is use to illuminate fluorescent samples like
fluorescent
igsaw puzzle, while shirts or socks, to
cause them to appear striking or glow even when they
are in a dark room.
  
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FLU„ESCEN MA E
AL
_ Fluorescent material are chemicals that a sor s the
energy emitted y the acklight and re-emits it as light
in the visi le region.
_ he sample appears white when it reflects all
wavelengths in the visi le regions at nearly 100%.
_ When the reflectance is less in the lue wavelength,
the sample will appear to e yellowish.
_ Fluorescent materials, sometimes referred to as
„ptical Brighteners, are added to the samples
  
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_ As fluorescent materials are used in many products like

paper and white shirts, whiteness measurement
ecomes a must in these industries to monitor the
quality of the product as well as to ensure unnecessary
lost.
_ Correct measurement of whiteness demands an
instrument equipped with an ad
ustment device
capa le of regulating the UV intensity.
_ he instrument is regarded as cali rated, if the amount
of UV falling onto the sample is similar to that
encountered in daylight.
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D UV filter moves up and down to change UV content

of illumination to meet the value of fluorescent
cali ration standard
D otal energy is ad
usted for one colorimetric index,
e.g., C
E W
with .
D he procedure is ased on trial and error to find the
exact filter position
D edious
   
!"i & 

Cali ration value

UV Cut Filter

llumination

100% UV eflection

Fluorescent standard
   
!"i & 

Cali ration value

!"i
UV Cut Filter
  

llumination

Partial UV eflection

Fluorescent Standard
   
!"i & 

Cali ration value

UV Cut Filter

llumination

0% UV eflection

Fluorescent Standard
   
!"i & 

Cali ration value

UV Cut Filter

llumination

Ad
usted UV eflection

c&  &  Fluorescent Standard

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D wo flashes
D FirstΠWith 100% UV radiation
D SecondΠ0% UV radiation
   !"i & 

Fluorescent standard

First illumination with UV

400 nm UV Cut Filter
   !"i & 

Fluorescent standard

First illumination without UV

400 nm UV Cut Filter
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D wo illumination
FirstΠWith 100% UV radiation
SecondΠ0% UV radiation)
D Calculation
With the data o tained y 100% UV and 0% UV, the CPU
calculates the ratio to meet the cali ration data in each
wavelength.
   !"i & 

First illumination @ 100% UV

llumination eflection
   !"i & 

Second illumination @ 0% UV

llumination

llumination eflection
  !"i & 

eflection

100% UV

a Cali ration Value

0% UV
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D For measurement, there are 2 illumination

D he ratios o tained y 100% UV and 0% UV in
cali ration, are adapted to the data o tained y
measurement to calculate the UV ad
usted
measurement value.
D UV ad
ustment can e done in various waysŒ-
Whiteness
ndex
Whiteness
ndex & int
Profile
Granz & Griesser
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eflection
100% UV
Ad
usted Measurement
a value

0% UV
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D Exclusive and patented

D Practical and time saving
otal UV measurement process drastically simplified
D Multiple information for UV analysis y as single
measurement
D Parameter setting without hardware manipulation
No human error
D elia le
No mechanical parts

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riplet Effect
D Certain fluorescent materials has triplet effect, this
will cause a dip of the spectral graph
ust after the
fluorescent region as shown in the graph.
D ue to a high intensity illumination y the xenon flash
on the sample for a very short time.
D Will not happen in normal illumination condition
 
 %   

ntensive Flash
 
 %   
Soft Flash

 %   

Soft Flash

riplet Effect

ntensive Flash

' 

Manish Kapadia
Chief manager

J
SL

'