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Complexity
Evolution in Transistor
Count
Evolution in Speed/Performance
Intel 4004 Micro-
Processor
Intel Pentium (II)
microprocessor
Design Abstraction Levels
n+ n+
S
G
D
+
DEVICE
CIRCUIT
GATE
MODULE
SYSTEM
Silicon in 2010
Die Area: 2.5x2.5 cm
Voltage: 0.6 V
Technology: 0.07 m
Density Access Time
(Gbits/cm2) (ns)
DRAM 8.5 10
DRAM (Logic) 2.5 10
SRAM (Cache) 0.3 1.5
Density Max. Ave. Power Clock Rate
(Mgates/cm2) (W/cm2) (GHz)
Custom 25 54 3
Std. Cell 10 27 1.5
Gate Array 5 18 1
Single-Mask GA 2.5 12.5 0.7
FPGA 0.4 4.5 0.25
Jan M. Rabaey
The Devices
The MOS Transistor
n+ n+
p-substrate
Field-Oxyde
(SiO
2
)
p+ stopper
Polysilicon
Gate Oxyde
Drain
Source
Gate
Bulk Contact
CROSS-SECTION of NMOS Transistor
Current-Voltage Relations
Dynamic Behavior of MOS Transistor
D
S
G
B
C
GD
C
GS
C
SB
C
DB
C
GB
THE INVERTERS
DIGITAL GATES
Fundamental Parameters
Functionality
Reliability, Robustness
Area
Performance
Speed (delay)
Power Consumption
Energy
The CMOS Inverter:
A First Glance
V
DD
V
in
V
out
C
L
VTC of Real Inverter
0.0 1.0 2.0 3.0 4.0 5.0
V
in
(V)
1.0
2.0
3.0
4.0
5.0
V
o
u
t
(
V
)
V
M
NM
H
NM
L
Delay Definitions
t
pHL
t
pLH
t
t
V
in
V
out
50%
50%
t
r
10%
90%
t
f
V
DD
V
DD
V
in
V
out
M1
M2
M3
M4
C
db2
C
db1
C
gd12
C
w
C
g4
C
g3
V
out2
Fanout
Interconnect
V
out
V
in
C
L
Simplified
Model
CMOS Inverters
Polysilicon
In
Out
Metal1
V
DD
GND
PMOS
NMOS
1.2 m
=2
Scaling Relationships for Long Channel Devices
COMBINATIONAL
LOGIC
Overview
Static CMOS
Conventional Static CMOS Logic
Ratioed Logic
Pass Transistor/Transmission Gate Logic
Dynamic CMOS Logic
Domino
np-CMOS
Static CMOS
V
DD
V
SS
PUN
PDN
In1
In2
In3
F = G
In
1
In
2
In
3
PUN and PDN are Dual Networks
PMOS Only
NMOS Only
Example Gate: NAND
Transistor Sizing
V
DD
A
B
C
D
D
A
B C
1
2
2
2
6
6
12
12
F
for symmetrical response (dc, ac)
for performance
Focus on worst-case
Input Dependent
4-input NAND Gate
Out
In
1
In
2
In
3
In
4
In
3
In
1
In
2
In
4
In
1
In
2
In
3
In
4
V
DD
Out
GND
V
DD
In1 In2 In3 In4
Vdd
GND
Out
Ratioed Logic
V
DD
V
SS
PDN
In
1
In
2
In
3
F
R
L
Load
V
DD
V
SS
In
1
In
2
In
3
F
V
DD
V
SS
PDN
In
1
In
2
In
3
F
V
SS
PDN
Resistive
Depletion
Load
PMOS
Load
(a) resistive load (b) depletion load NMOS (c) pseudo-NMOS
V
T
< 0
Goal: to reduce the number of devices over complementary CMOS
Pseudo-NMOS
V
DD
A B C D
F
C
L
V
OH
= V
DD
(similar to complementary CMOS)
k
n
V
DD
V
Tn
( )
V
OL
V
OL
2
2
-------------
\ .
|
| |
k
p
2
------ V
DD
V
Tp
( )
2
=
V
OL
V
DD
V
T
( )
1 1
k
p
k
n
------ (assuming that V
T
V
Tn
V
Tp
) = = =
SMALLER AREA & LOAD BUT STATIC POWER DISSIPATION!!!
Dynamic Logic
M
p
M
e
V
DD
PDN
|
In
1
In
2
In
3
Out
M
e
M
p
V
DD
PUN
|
In
1
In
2
In
3
|
|
Out
C
L
C
L
|
p network
|
n network
2 phase operation:
Evaluation
Precharge
Example
M
p
M
e
V
DD
|
Out
|
A
B
C
N + 1 Transistors
Ratioless
No Static Power Consumption
Noise Margins small (NM
L
)
Requires Clock
Cascading Dynamic Gates
M
p
M
e
V
DD
|
|
M
p
M
e
V
DD
|
|
In
Out1 Out2
|
Out2
Out1
In
V
t
A
V
V
Tn
(a)
(b)
Only 0