Experience with Parallel Optical Link for the CDF Silicon Detector

S. Hou for the DOIM group Academia Sinica, Taiwan

VERTEX 2002

Introduction
DOIM: Dense Optical Interface Module Byte-wide parallel optical link
8-bits + clock 53 Mbyte/sec, BER10-12

Transmitter :
Laser-diode array ASIC driver chip

Receiver :
PIN-diode array ASIC receiver chip

Multi-mode fiber ribbon

Laser, Electrical characteristics Bit-error rate test Aging test Radiation Hardness Implementation in CDF
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Transmitter: Laser diode

InGaAs/InP Edge-emitting laser diode :
1550 nm wavelength 12-ch diode array (9 used) 250 m pitch 20 mA/channel
Cleaved mirrors Facet coating Bare laser power: 1 mW/ch @20mA Insertion to fiber: 200 ~ 800 W/ch

Fabrication by
Chunghwa Telecom Telecommunication Laboratories
VERTEX 2002

Transmitter: driver ASIC

Custom design, biCMOS 0.8 m,AMS
bipolar transistors only

Inputs :
Diff. ECL or LVDS signals compatible differential 100 mV Enable by TTL low

Nine channels :
Vcc-VLD across output transistor, 50 , laser control current consumption

At 3V, 20mA/ch nominal ~2mA/0.1V adjustable slope

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Transmitter assembly
Die-bond / Wire bond
laser-diode array on BeO submount driver chip on substrate fibers on V-groove

Alignment fibers to laser emitting facets

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Receiver : PIN & ASIC

InGaAs/InP PIN diode :
12-ch array, matching laser diode wavelength by TL, Chunghwa Telecom.

Operation condition :
50 ~ 800 W on, 10 W off 1.1 W/module

Outputs :
differential ECL, nine independent channels

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Receiver assembly
Die-bond / Wire bond
PIN-diode array on Al2O3 submount driver chip on substrate fibers on V-groove

Alignment, fibers to PIN-diodes

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Assembly procedure

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Transmitter characteristics
Transmitter tests :
L-I-V and temperature 50 MHz diff. Inputs, 2.5V common mode 100 mV, 50% +Dcyc Laser light MT-12ST fanout & Tek O/E probe

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Laser diode: L-I-V

Laser light at 20, 30, 40oC
water-bath chiller precision ~0.1oC measured at substrate I-V little temperature dependence approximately linear L-V Drop with temperature Duty cycle diff. Input 50% stable, little offset to 50%

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Laser diode: temperature

Light power vs. Temperature
Measured in stable cooling/heating process Temperature at substrate precision ~0.1oC Approximately linear drop to temperature

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Receiver response
Receiver connected to a Transmitter Light power chosen for wide distribution Light pulse width are consistent Receiver ECL outputs by a Tektronix diff. probe Consistent duty cycles in favored operation range (2.8~3.2V) Saturates for high light level

VERTEX 2002

Transmitter uniformity : light outputs

Production transmitters
light from pigtail at 30oC wide deviation channel-by-channel mainly due to insertion efficiency
Span within ~400 W ~72 W to the mean/module Effect operation dynamic range in threshold, saturation limit

VERTEX 2002

Transmitter uniformity : light pulse widths

Ch-Ch Light power deviation
Is approximately a const. scaling factor L-V linear fit, normalized slope to L(3V) indep. of light power

Light pulse width is uniform, ~1%, indep. of light power

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Receiver uniformity : ECL duty cycles

Two production batches
monitored at 550 W & 970 W light pulse width 45%

ECL duty cycle is uniform

48.1% at 550 W, (2nd batch) =0.7% 4% wider in 1st batch due to chip tuning

Wide light input range

Saturation monitored at 970 W

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Receiver uniformity : duty cycle deviation

Input lights
~950 W, width 45% for all channels

ECL outputs of a module

deviation to the mean ~1.5% for both batches

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Bit-Error Rate test

BERT by Fermilab
PC ISA boards TTL to Tbert, Rbert boards

At 63 MHz, minimum BER 10 12

Burn-in
3-days on ASICs, diodes 1-day BERT reject devices infant mortality bad components fail quickly

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Accelerated Aging test

4 transmitters at 60oC, 330 days

Wear-out degradation
0.15 0.08 W/day at 60oC no failure

Accelerating factor F=exp(Ea/ kb) (1/T1 1/T2)

F=29 for T= 5oC

Failure due to light degradation

Min transmitter spec 200 W down below receiver threshold 50 W ~100 days at 60oC, or 8 years at 5oC

90% C.L. for 0 failure, P=0.064 upper limit = 40 ch. In 3 years

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INER 30 MeV proton Irradiation

CDF requirement : 200 kRad tolerance

INER test beam : transmitter in DC mode.

fiber connection out of beam area, measuring L, T versus dose.

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Bulk damage, annealing

Bulk damage dominant, linear dep. to dose Ratio of light drop is consistent for a module, indep. of light power Degradation 10% for 200 kRad

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UC Davis 63.3 MeV proton

UC Davis test beam : 10 transmitters on two Port Cards Examined after 200, 400 kRad, for L I, V measurements Light degradation ~10% for 200 kRad Similar I-V, L-V characteristics after irradiation, slope for L vs. V degrades similarly.

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DOIM implementation : transmitters

Transmitters on Port Cards

Total 570 transmitters

128 Port Cards, 5 transmitter each board

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DOIM implementation : receivers

Receivers on FTM
10 receivers on each board, reading 2 Port Cards

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Status

570 pairs implemented ~10 % bit-error flagged

excess light at -5oC optical reflection, contact electrical pin contact 2% has fatal damage

is improving

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Summary
DOIM, a byte-wide optical link is implemented in CDF
Edge-emitting laser light linear to I-V and T Laser-diode array coupling to pigtail fibers large deviation a major disadvantage Radiation tolerance is high bulk-damage dominant linear degradation to dose

VERTEX 2002